Abstract:
A magnetic random access memory element is made from a first magnetic tunnel junction and a second magnetic tunnel junction. These magnetic tunnel junctions are connected to each other in a series resistive circuit. The connected first and second magnetic tunnel junctions are connected to a bit line through an access transistor. A write bit line and a write data line are associated with each of the first and second magnetic tunnel junctions. By application of appropriate currents to these lines, the magnetic vector orientation with each of the first and second magnetic tunnel junctions can be controlled so as to store information within the element in any one of at least three logic states.
Abstract:
A random access memory array includes random access memory elements arranged in a rows and columns. The elements of each row have a word line and a write digit line and the elements of each column have a bit line and a write bit line. A first selection circuit/transistor for each row has a first source-drain path coupled in the write digit line and a gate terminal coupled to the word line. A second selection circuit/transistor for each column has a second source-drain path coupling in the write bit line and a gate terminal coupled to the bit line. A first write signal is applied to one word line to actuate the first selection circuit/transistor for the row corresponding to that one word line and cause a write current to flow through the first source-drain path of the actuated first selection circuit/transistor and the corresponding write digit line to write data into certain memory elements in that row. A second write signal is applied to one bit line to actuate the second selection circuit/transistor for the column corresponding to that one bit line and cause a write current to flow through the second source-drain path of the actuated second selection circuit/transistor and the corresponding write bit line to write data into at least one memory element in that column.
Abstract:
A magnetic random access memory element is made from a first magnetic tunnel junction and a second magnetic tunnel junction. A latching circuit includes a false node that is connected to the first magnetic tunnel junction and a true node that is connected to the second magnetic tunnel junction. A pair of complementary bit lines are provided in association with the element. A first access transistor inter-connects a false one of the bit lines to the false node of the latching circuit, while a second access transistor inter-connects a true one of the bit lines to the true node of the latching circuit. The memory element accordingly has an SRAM four transistor (4T) two load (2R) architecture wherein the resistances associated with the two magnetic tunnel junctions provide the two load resistances.
Abstract:
A magnetic random access memory element is made from a first magnetic tunnel junction and a second magnetic tunnel junction. These magnetic tunnel junctions are connected to each other in a series resistive circuit. The connected first and second magnetic tunnel junctions are connected to a bit line through an access transistor. A write bit line and a write data line are associated with each of the first and second magnetic tunnel junctions. By application of appropriate currents to these lines, the magnetic vector orientation with each of the first and second magnetic tunnel junctions can be controlled so as to store information within the element in any one of at least three logic states.
Abstract:
A random access memory array includes first random access memory elements arranged in a plurality of rows and columns for storing data words at a multiple memory locations. The memory array further includes second random access memory elements arranged in at least one additional column. Each second random access memory element is associated with a memory location to store a flag value indicative of whether the data word stored at that memory location is a true or complement version. The individual memory elements may comprise magnetic random access memory elements. Alternatively, the individual memory elements may comprise flash memory cells.
Abstract:
A random access memory array includes random access memory elements arranged in a rows and columns. Each row is divided into a plurality of row groups of elements and each column is divided into a plurality of column groups of elements. The elements in each row group share a common local write digit line and the elements in each column group share a common local write bit line. The array further includes at least one global write digit line coupled to the common local write digit lines of plural row groups, and at least one global write bit line coupled to the common local write bit lines of plural column groups.
Abstract:
A random access memory array includes first random access memory elements arranged in a plurality of rows and columns for storing data words at a multiple memory locations. The memory array further includes second random access memory elements arranged in at least one additional column. Each second random access memory element is associated with a memory location to store a flag value indicative of whether the data word stored at that memory location is a true or complement version. The individual memory elements may comprise magnetic random access memory elements. Alternatively, the individual memory elements may comprise flash memory cells.
Abstract:
A Content Addressable Memory (CAM) cell is disclosed having an physical implementation of transistors for improving the semiconductor substrate area utilization of the CAM cell and the CAM array. The CAM cell comprises a first and second memory circuit and a compare circuit. The compare circuit of six transistors formed over two active regions. The local interconnect between the compare circuit and the first memory circuit formed of a polysilicon region. The local interconnect between the compare circuit and the second memory circuit formed of polysilicon and conductive regions.
Abstract:
A random access memory array includes random access memory elements arranged in a rows and columns. Each row is divided into a plurality of row groups of elements and each column is divided into a plurality of column groups of elements. The elements in each row group share a common local write digit line and the elements in each column group share a common local write bit line. The array further includes at least one global write digit line coupled to the common local write digit lines of plural row groups, and at least one global write bit line coupled to the common local write bit lines of plural column groups.