Abstract:
The present invention describes a non-volatile memory device comprising a matrix of non-volatile memory cells (1), a writing circuitry (2) and a reading circuitry (3) for said memory cells of the matrix. The device comprises a counter comprising a sector (11) of non-volatile memory cells and logic means (5) capable of scanning the memory cells of said sector (11) by means of said reading circuitry and of updating said sector (11) by commanding the writing of a given value in a memory cell different from the memory cell containing said given value by means of said writing circuitry (2).
Abstract:
An automatic redundancy system exploits and existent microprocessor management system on chip for carrying out autonomously, without communicating with the external test machine, the operations of writing data in the memory array according to one or more pre-established test patterns, of verifying data successively read from the memory array, eventually of substituting failed elements of the array with equivalent redundancy structures. A logic structure detects and stores eventual array fails upstream of the output data path, thus speeding up data collection relating to eventual fails without any interaction with the EWS test machine apart from communicating the end of the execution of the redundancy process.
Abstract:
The invention relates to a method and a relative automatic regulation device of the reference sources in a non volatile memory device, for example a flash memory. The method is characterised by the following steps:: - providing, in the memory device (2), a regulation device (1) of the reference sources (5, 6, 7) and at least one start command (START) for the entry in regulation mode; - providing, on the device (2), at least one command for the selection of a corresponding reference source to be regulated; - applying an external reference signal (V REF , I REF ); - starting the automatic regulation step by means of said command (START); - detecting the result of the regulation step by means of a logic output (FAIL) of the memory device (2); - if the result of the regulation of a given source is positive, proceeding, by means of the same process steps, with the regulation of another source.
Abstract:
A method of protecting/unprotecting addressable sectors of a non volatile memory device including also an ancillary volatile memory array, for preventing illicit modification of non volatily stored data in the addressable sectors, comprising the steps of storing protection information on the addressable sectors of the non volatile memory device in a dedicated non volatile memory space inaccessible to users of the device and of obliging a check of the permanently stored protection information whenever data stored in a certain memory sector must be modified, further comprises the steps of: reading the permanently stored protection information from the inaccessible non volatile memory space at every power-on of the device and copying it in the ancillary volatile memory array including at least two additional check columns containing preset logic information; prior to modifying data stored in an addressable memory sector, reading the protection information of the sector from the volatile memory array and the content of the check columns; if the read content of the check columns matches the preset logic information, the read sector protection information is assumed true and the modification of data in the selected sector is allowed; if the read content of the check columns does not match the preset logic information, the event is signalled, data modification circuitry of the device is disabled and the permanently stored protection information is downloaded again from the inaccessible non volatile memory space in the volatile memory array for reestablishing therein the correct original protection information.