Abstract:
An effective EWS flow is implemented by expanding the functions of the microcontroller normally embedded in a FLASH EPROM memory device and of the integrated test structures. The architecture gives the possibility of executing test routines internally without involving any external complex or expensive test equipment to control the test program. The algorithms are executed by the onboard micro-controllers (that may be reading either from an embedded ROM or from a GLOBAL CACHE purposely provided). Such a GLOBAL CACHE may be downloaded with the desired routine to a TUI block and provides a full test flexibility also at the device debug level. Managing test routines by an internal algorithm permits to make the device architecture transparent from a tester point of view, by purposely creating a standard interface with a set of defined commands and instructions to be interpreted by the on board micro and internally executed.
Abstract:
A circuit (165) is proposed for controlling a reference node (Nr) in a sense amplifier (145) switchable between an operative condition and a stand-by condition, the reference node providing a reference voltage in the operative condition. The circuit includes means (Cp) for bringing the reference node to a starting voltage upon entry into the stand-by condition, first means (Rda1,Rda2) for keeping the reference node at a pre-charging voltage in the stand-by condition, second means (Rdb1,Rdb2) for providing a comparison voltage closer to the pre-charging voltage than the starting voltage, pulling means (Mu1) for pulling the reference node towards a power supply voltage, and control means (210) for activating the pulling means upon entry into the stand-by condition and for disabling the pulling means when the voltage at the reference node reaches the comparison voltage.
Abstract:
A memory device (102) including at least one storage area (108) for storing data and a protection control structure (234) adapted to selectively allow an external device (104) access to the at least one storage area of the memory, the storage area being not freely accessible by the external device if protected. The memory device further includes a control logic (205,228) adapted to identify an access request by the external device to the at least one storage area and cooperating with the protection control structure for managing an unlock procedure for selectively granting the external device at least temporary access rights to the storage area if protected. The memory device further includes means for providing a first code (RND) to the external device in said unlock procedure, means for receiving a second code from the external device in response to said first code, and means for verifying (240,229) validity of the received second code, wherein said means for verifying validity are adapted to ascertain a correspondence of the second code with the first code based on a predetermined relationship. Said control logic instructs the protection control structure to grant access to the storage area if the validity of the received second code has been verified.