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公开(公告)号：EP0803975B1
公开(公告)日：2003-07-02
申请号：EP96830235.6
申请日：1996-04-26
Applicant: STMicroelectronics S.r.l.
Inventor： Chiozzi, Giorgio , Storti, Sandro , Tavazzani, Claudio
IPC: H03F3/21
CPC classification number: H03F3/3096
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2.发明授权Manufacturing method for integrated circuits and semiconductor wafer so obtained 失效一种用于产生制造集成电路和半导体晶片的方法
公开(公告)号：EP0702402B1
公开(公告)日：2003-01-15
申请号：EP94830425.8
申请日：1994-09-13
Applicant: STMicroelectronics S.r.l.
Inventor： Murari, Bruno , Toscani, Roberto , Marchio', Fabio , Storti, Sandro
IPC: H01L21/66
CPC classification number: H01L22/32 , G01R31/2831 , G01R31/2884 , H01L27/0207 , H01L2224/05554 , H05K1/0266 , H05K1/0306 , H05K3/0097
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3.发明公开Circuit and method for detecting load impedance 审中-公开Schaltung und Verfahren zur Detektierung einer Lastimpedanz
公开(公告)号：EP1118865A1
公开(公告)日：2001-07-25
申请号：EP00830027.9
申请日：2000-01-20
Applicant: STMicroelectronics S.r.l.
Inventor： Chiozzi, Giorgio , Storti, Sandro
IPC: G01R27/26
Abstract: A device for detecting load impedance, comprising an analog circuit portion, for detecting the impedance value of a load, and a digital circuit portion (2), which is adapted to provide load impedance type information.
Abstract translation: 一种用于检测负载阻抗的装置，包括用于检测负载的阻抗值的模拟电路部分和适于提供负载阻抗类型信息的数字电路部分（2）。
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