Abstract:
Procédé de réalisation d'une plaque de semi-conducteur adaptée pour la fabrication d'un substrat SOI, comprenant les étapes suivantes : - réalisation, sur la face supérieure (2) d'un support semi-conducteur (1), d'une première couche (4) de semi-conducteur polycristallin; puis - formation d'une zone d'interface (12) sur la face supérieure (7) de ladite première couche (4), ladite zone d'interface (12) présentant une structure distincte de la structure cristalline celle de ladite première couche (4); puis - réalisation sur ladite zone d'interface ( 12), d'une deuxième couche ( 14) de semi-conducteur polycristallin.
Abstract:
Method for production of a semiconductor wafer suitable for the manufacture of an SOI substrate, comprising the following steps: - production, on the upper face (2) of a semiconductor support (1), of a first layer (4) of polycrystalline semiconductor; then - formation of an interface area (12) on the upper face (7) of said first layer (4), the interface area (12) having a structure distinct from the crystalline structure of said first layer (4); then - production on said interface area (12) of a second layer (14) of polycrystalline semiconductor.
Abstract:
The invention concerns a method comprising: 1)a first phase including steps which consist in forming in the upper part of a first initial semiconductor substrate a first layer of insulating material above a sectional plane of said first substrate, contacting the first layer of insulating material with the insulating upper part of a second initial substrate, so as to form a single layer of insulating material, a break at the sectional plane, so as to obtain an intermediate semiconductor substrate on the single insulating material layer; then, 2) in a second phase which consists in forming in the intermediate semiconductor substrate an additional insulating material layer adjacent to the single insulating material and topped with an upper layer of a final semiconductor substrate.