Abstract:
To efficiently apply jitter to an optical signal using a simple configuration, provided is an optical signal output apparatus that outputs an optical pulse pattern signal including jitter, the optical signal generating apparatus comprising a light source section that outputs an optical signal having an optical frequency corresponding to a frequency control signal; an optical modulation section that modulates the optical signal output by the light source section, according to a designated pulse pattern; and an optical jitter generating section that delays an optical signal passed by the optical modulation section according to the optical frequency, to apply jitter to the optical signal.
Abstract:
Provided is a test apparatus that tests a device under test including an optical coupler transmitting optical signals in a direction perpendicular to a device surface. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical transmission path that transmits the optical signals: and a lens section that is provided facing the optical coupler on the substrate and that focuses the optical signals from an end of one of the optical coupler and the optical transmission path to an end of the other.
Abstract:
There is provided a light receiving device including a polarization dispersing section that disperses a polarization direction of incoming light into a plurality of polarization directions, a light collecting section that has a metal pattern shaped like concentric circles on a surface thereof, where the light collecting section collects light that has passed through the polarization dispersing section, and a light receiving section that receives the light collected by the light collecting section. Also provided are a light receiving device manufacturing method and a light receiving method. The light collecting section may have a surface plasmon antenna that has the metal pattern shaped like the concentric circles on a surface thereof, and the light receiving section may receive the light collected toward a center of the concentric circles of the metal pattern of the light collecting section, through a hole at the center of the concentric circles, on a rear side of the light collecting section.
Abstract:
It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.
Abstract:
Provided is a test apparatus that tests a device under test including an optical coupler for transmitting optical signals in a surface direction and a first groove for holding an optical transmission path connected to the optical coupler. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical transmission path to be connected to the optical coupler; and a pressing section that presses the optical transmission path from the substrate side toward the first groove. Also provided is a test method.
Abstract:
The object is to measure the carrier envelope offset frequency of a mode-locked laser. Provided is a pulse laser that measures a carrier envelope offset frequency of a mode-locked laser, pulse laser comprising a mode-locked laser that generates an optical pulse; a band expanding section that expands an oscillated frequency range of the mode-locked laser; a harmonic generating section that generates a harmonic component of the mode-locked laser; a light transmitting section that inputs light to the harmonic generating section without changing relative timings of a predetermined frequency component of the mode-locked laser output from the band expanding section and a frequency component that is at least double the predetermined frequency component; a detecting section that detects a beat signal of the harmonic component and the component passed through the harmonic generating section by the mode-locked laser; and a calculating section that calculates a carrier envelope offset frequency and a repeating frequency based on the beat signal.
Abstract:
Provided is an optical modulator that modulates input light with a high frequency and low half-wave voltage. An optical device comprises a substrate; a dielectric film that is formed on the substrate and includes a first optical waveguide and a second optical waveguide that run parallel to each other; an insulating film formed on the dielectric film; a coplanar line that is formed on the insulating film and includes a signal line arranged between the first optical waveguide and the second optical waveguide, a first ground line arranged in a first region, and a second ground line arranged in a second region; and auxiliary electrodes that are arranged in the first region and the second region, are formed in contact with the dielectric film or within the insulating film, and apply bias voltages to the first optical waveguide and the second optical waveguide.
Abstract:
There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.