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公开(公告)号：US20240069140A1
公开(公告)日：2024-02-29
申请号：US17893635
申请日：2022-08-23
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma
CPC classification number: G01R35/005 , G01R21/06 , G01R31/2601
Abstract: A system and method for performing production testing on high power semiconductor devices is disclosed. The system includes signal generators, RF meters, sockets, couplers and connectors which also function as switches when connected to an external cable. A calibration process is executed which allows the controller to create a correlation between measurements taken by the RF meter and the actual voltages, and power levels present at the device under test. By performing this calibration, it is possible to perform production testing of devices much more quickly and reliably.
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Patent Agency Ranking
公开(公告)号：US20220131548A1
公开(公告)日：2022-04-28
申请号：US17081707
申请日：2020-10-27
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma
Abstract: A system and method for performing discrete frequency transform including a pair of single-bit analog to digital converters (ADCs), a phase converter, a memory, a discrete frequency transform converter and summation circuitry. The ADCs convert an analog input signal into N pairs of binary in-phase and quadrature component samples each being one of four values at a corresponding one of four phases. The phase converter determines a phase value for each pair of component samples. The memory stores a set of discrete frequency transform coefficient values based on N. The discrete frequency transform converter uses a phase value and a pair of discrete frequency transform coefficient values retrieved from the memory for a selected frequency bin to determine a discrete frequency component for each pair of phase component samples. The summation circuitry sums the corresponding N frequency domain components for determining a frequency domain value for the selected frequency bin.
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公开(公告)号：US20250044393A1
公开(公告)日：2025-02-06
申请号：US18921236
申请日：2024-10-21
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma
Abstract: A system and method for performing production testing on high power semiconductor devices is disclosed. The system includes signal generators, RF meters, sockets, couplers and connectors which also function as switches when connected to an external cable. A calibration process is executed which allows the controller to create a correlation between measurements taken by the RF meter and the actual voltages, and power levels present at the device under test. By performing this calibration, it is possible to perform production testing of devices much more quickly and reliably.
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公开(公告)号：US12146935B2
公开(公告)日：2024-11-19
申请号：US17893635
申请日：2022-08-23
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma
Abstract: A system and method for performing production testing on high power semiconductor devices is disclosed. The system includes signal generators, RF meters, sockets, couplers and connectors which also function as switches when connected to an external cable. A calibration process is executed which allows the controller to create a correlation between measurements taken by the RF meter and the actual voltages, and power levels present at the device under test. By performing this calibration, it is possible to perform production testing of devices much more quickly and reliably.
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公开(公告)号：US20240110972A1
公开(公告)日：2024-04-04
申请号：US18174003
申请日：2023-02-24
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma , Rangakrishnan Srinivasan , Zhongda Wang
CPC classification number: G01R31/2824 , H04B17/14 , H04L27/12
Abstract: Modulation testing separately enables slices of an analog varactor array of an LC oscillator. For each enabled slice, a reference voltage supplying a resistor ladder is set to a plurality of different reference voltage values. Resistor ladder voltages generated for the different reference voltage values are supplied to the enabled slice and a control voltage coupled to the enabled slice is swept for each of the reference voltage values. Respective frequencies of an oscillator signal coupled to an output of the LC oscillator are measured for each enabled slice for each combination of the reference voltage values and the control voltage values. The linearity of LC oscillator gain is determined for each of the reference voltage values for each slice based on the respective frequencies and the control voltage values. Passing/failing the modulation testing is based on the linearity of the LC oscillator gain.
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公开(公告)号：US11601133B2
公开(公告)日：2023-03-07
申请号：US17081707
申请日：2020-10-27
Applicant: Silicon Laboratories Inc.
Inventor： Anant Verma
Abstract: A system and method for performing discrete frequency transform including a pair of single-bit analog to digital converters (ADCs), a phase converter, a memory, a discrete frequency transform converter and summation circuitry. The ADCs convert an analog input signal into N pairs of binary in-phase and quadrature component samples each being one of four values at a corresponding one of four phases. The phase converter determines a phase value for each pair of component samples. The memory stores a set of discrete frequency transform coefficient values based on N. The discrete frequency transform converter uses a phase value and a pair of discrete frequency transform coefficient values retrieved from the memory for a selected frequency bin to determine a discrete frequency component for each pair of phase component samples. The summation circuitry sums the corresponding N frequency domain components for determining a frequency domain value for the selected frequency bin.
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