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1.发明专利
公开(公告)号：JP2006329851A
公开(公告)日：2006-12-07
申请号：JP2005155021
申请日：2005-05-27
Applicant: Toppan Printing Co Ltd , 凸版印刷株式会社
Inventor： YOSHIDA YOSHIHISA
IPC: G01R31/02
Abstract: PROBLEM TO BE SOLVED: To provide a producing method and a machine for test data, and a wiring testing machine that perform a wiring test of printed-wiring boards and semiconductor package substrates with various kinds and small quantity, very fine designs, and low prices.
SOLUTION: The wiring testing machine 100 includes a producing machine 10 for test data, a package testing machine 20 forming with a test jig 21 using a spring probe and test jig 41 using a conductive rubber 42, a flying prober 30 using a probe 31 of the flying prober, and an object 50 to be tested composed of wiring substrates and others.
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：为了提供测试数据的制造方法和机器以及进行各种和少量非常精细设计的印刷电路板和半导体封装基板的布线测试的布线测试机， 价格低廉。 线路测试机100包括用于测试数据的生产机器10，使用弹簧探头形成测试夹具21的封装测试机器20和使用导电橡胶42的测试夹具41，使用 飞行探测器的探针31以及由接线基板等构成的被测体50。 版权所有（C）2007，JPO＆INPIT
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公开(公告)号：JP2005207912A
公开(公告)日：2005-08-04
申请号：JP2004015590
申请日：2004-01-23
Applicant: Toppan Printing Co Ltd , 凸版印刷株式会社
Inventor： YOSHIDA YOSHIHISA
IPC: G01R31/02
Abstract: PROBLEM TO BE SOLVED: To provide a wiring testing method and wiring testing device for testing the electric quality of wiring in printed wiring boards and various semiconductor package substrates (BGA, CSP, TAB, etc.) which are superior in positioning accuracy.
SOLUTION: The wiring test device 100 is constituted of a test probe 10, a recognition means 20 for reading a positioning mark and test point, a moving and positioning means 30 for moving/positioning the test probe, a calibration jig 40 having reference marks 41X and 41Y, a judging means 50 for deciding the electrical quality of the wiring, and a control means 60 for controlling testing device as a whole. Before initiating a wiring test, moving dimension accuracy of the test probe is calibrated by using the calibration jig having a reference mark, and then wiring test is initiated.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：提供一种用于测试印刷电路板和各种半导体封装基板（BGA，CSP，TAB等）中布线的电气质量的布线测试方法和布线测试装置，其定位精度优越 。 布线测试装置100由测试探针10，读取定位标记和测试点的识别装置20，用于移动/定位测试探针的移动和定位装置30构成，校准夹具40具有 参考标记41X和41Y，用于确定布线的电气质量的判断装置50以及用于整体控制测试装置的控制装置60。 在开始接线测试之前，通过使用具有参考标记的校准夹具校准测试探头的移动尺寸精度，然后启动接线测试。 版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：JP2003329409A
公开(公告)日：2003-11-19
申请号：JP2002135397
申请日：2002-05-10
Applicant: Toppan Printing Co Ltd , 凸版印刷株式会社
Inventor： AKIYAMA YUKIO , YOSHIDA YOSHIHISA , SHIBAYAMA TAKAHIRO
IPC: G01B11/00
Abstract: PROBLEM TO BE SOLVED: To provide a positioning method and a positioning device which can be used when the accurate positioning is required irrespective of the increase in size of an object.
SOLUTION: The present invention provides a positioning method which comprises image-picking up the entire object roughly in such a degree of accuracy that the rough position of a positioning mark can be understood, recognizing a region where the positioning mark is present from the result of the rough image-pickup, image-picking up the recognized region where the mark is present in detail, recognizing the detailed position of the positioning mark from the detailed image-pickup of the region where the mark is present, recognizing the position of the object to be positioned from the recognized detailed position of the positioning mark, and positioning the object based on the recognized position of the object to be positioned, and the present invention also provides a positioning device.
COPYRIGHT: (C)2004,JPOAbstract translation: 要解决的问题：提供一种当需要精确定位时可以使用的定位方法和定位装置，而不管物体的尺寸增加。 解决方案：本发明提供了一种定位方法，其包括以大致精确的程度对整个物体进行图像拾取，使得可以理解定位标记的粗略位置，从而识别存在定位标记的区域 通过粗略的图像拾取的结果，对识别出的标记存在的识别区域进行图像拾取，从识别标记的区域的详细图像拾取中识别定位标记的详细位置，识别位置 从定位标记的识别的详细位置定位物体，并且基于所识别的待定位物体的位置来定位物体，并且本发明还提供定位装置。 版权所有（C）2004，JPO
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公开(公告)号：JP2002031646A
公开(公告)日：2002-01-31
申请号：JP2000217087
申请日：2000-07-18
Applicant: TOPPAN PRINTING CO LTD
Inventor： AKIYAMA YUKIO , YOSHIDA YOSHIHISA , SHIBAYAMA TAKAHIRO
Abstract: PROBLEM TO BE SOLVED: To provide a conductive sheet, for electric inspection, which can be used independently of the pattern of an object to be inspected and which can deal with the pattern which is highly finer than that in conventional cases and to provide its manufacturing method. SOLUTION: Conductive patterns 321 are formed on an insulating substrate 311. The prescribed number of insulating substrates 311 on which the patterns 321 are formed is laminated, heated, pressurized and molded. A laminated block 330 is manufactured. When the laminated block 330 is sliced along a cutting line, the conductive sheet 330, for electric inspection, in which electrodes 321a obtained by cutting the conductive patterns 321 in a prescribed thickness are buried in prescribed positions of an insulating sheet 331 is obtained. Alternatively, plated films are formed on one end face or both end faces of every electrode 321a, and the conductive sheet, for electric inspection, on which the plated films are formed is obtained.
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公开(公告)号：JPH0419575A
公开(公告)日：1992-01-23
申请号：JP12267190
申请日：1990-05-11
Applicant: TOPPAN PRINTING CO LTD
Inventor： YOSHIDA YOSHIHISA , IKEDA SADAO , SAKAI ITSUSEI , HOTTA MASAHIRO , TORIGOE TAKESHI
Abstract: PURPOSE:To make a preparation work easy and speedy and also to enable a prevention of error generation by making inspection points not positioned on grid points which are classified from the inspection points extracted from the connection informations of a wiring circuit board, to move to the grid point most adjacent thereto. CONSTITUTION:The connection informations such as wiring information, net information, land information, etc., from a CAD system used for the arrangement and wiring design of an object to be inspected, are inputted in a data input means 1. The inspection points are extracted therefrom in an arithmetic process means 5 and also the classification is made whether these points are positioned on the grid points settled beforehand or not, then the inspection points not positioned on the grid points are moved to the most adjacent one among the vacant grid points. The movement information of the inspection points is outputted by a magnetic disk device or a printer based on the movement result. Also, the result processed in the means 5 is stored in a storage means 4 as data base.
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Patent Agency Ranking
公开(公告)号：JP2007271469A
公开(公告)日：2007-10-18
申请号：JP2006097745
申请日：2006-03-31
Applicant: Toppan Printing Co Ltd , 凸版印刷株式会社
Inventor： YOSHIDA YOSHIHISA
Abstract: PROBLEM TO BE SOLVED: To provide an inspection tool and a method for fixing a probe to it, allowing facilitation of probe replacement and adaptation to the miniaturization of inspection points of an object to be inspected.
SOLUTION: The inspection tool 100 comprises a probe-holding tool 50 which fixes primary plates 10, thorough which probe insertion holes 11 are formed at the same positions as those of secondary plates 20 and the secondary plates 20 by holding frames 30, and a probe-fixing plate 60, through which probe insertion holes 11 are formed at the same positions as those of the secondary plates 20.
COPYRIGHT: (C)2008,JPO&INPITAbstract translation: 要解决的问题：提供一种检测工具和用于将探针固定到其上的方法，允许促进探针更换并适应于待检查对象的检查点的小型化。 检查工具100包括：探针保持工具50，其固定主板10，通过夹持框架30将通过哪个探针插入孔11形成在与次级板20和次级板20相同的位置处， 和探针固定板60，探针插入孔11通过该探针固定板与辅助板20的位置相同的位置形成。（C）2008，JPO＆INPIT
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公开(公告)号：JP2002148279A
公开(公告)日：2002-05-22
申请号：JP2000343486
申请日：2000-11-10
Applicant: TOPPAN PRINTING CO LTD
Inventor： AKIYAMA YUKIO , YOSHIDA YOSHIHISA , SHIBAYAMA TAKAHIRO
Abstract: PROBLEM TO BE SOLVED: To drastically reduce inspection time by reducing the diameter of a probe and applying to finer inspection objects in electricity inspection for high frequency by simultaneous contact. SOLUTION: The coaxial probe for electricity inspection of this invention is constituted of a conductor cable 1, an insulation coating layer 2 covering the outside of the conductor cable 1, a conduction coating layer 3 covering the outside of the insulation coating layer 2, and an outer insulation layer 4 covering the outside of the conduction coating layer 3. On one end of the probe, the tip end of only the conduction cable 1 in the center is projected more than the outer coating layers, so as to be easy to be brought into contact with a body to be inspected. At the other end of the probe, the conduction cable 1 in the center is longest, and other coating layers are shorter for outer side, so that the conduction cable 1 in the center and the conduction layer 3 are easily connected to individual electrodes.
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公开(公告)号：JPH022944A
公开(公告)日：1990-01-08
申请号：JP14639088
申请日：1988-06-14
Applicant: TOPPAN PRINTING CO LTD
Inventor： SHIBAYAMA TAKAHIRO , YOSHIDA YOSHIHISA , IKEDA SADAO , YAMAKAWA TAKUMI
Abstract: PURPOSE:To make it possible to measure a material to be measured having closely arranged measuring points by providing a multilayered pattern between upper surface terminal and lower surface terminals. CONSTITUTION:An upper surface terminal 18 is provided in an upper surface. A lower surface terminal 19 is provided in a lower surface. Furthermore, one or more intermediate conductor layers are provided between the upper surface and the lower surface. The intermediate conductor layer is electrically conducted to the upper surface by way of through holes and also electrically conducted to the lower surface by way of through holes. In this way, the terminal 18 and the terminal 19 are electrically conducted through the intermediate conductor layer. Anisotropic conductive rubber sheets 17 are assembled on the surface of the upper surface and on the surface of the lower surface. Thus this device is utilized as a converter device 11. When grid-shaped probes 31 are compressed, they are electrically connected to measuring points 22 surely by the action of the springs of the probes 31. Under this state, short circuits and open states between the intended measuring points can be examined by examining short circuits and open states between the probes 31.
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公开(公告)号：JPH022943A
公开(公告)日：1990-01-08
申请号：JP14520688
申请日：1988-06-13
Applicant: TOPPAN PRINTING CO LTD
Inventor： SHIBAYAMA TAKAHIRO , YOSHIDA YOSHIHISA , IKEDA SADAO
Abstract: PURPOSE:To make it possible to perform wiring at one time and to make it possible to prevent erroneous wiring by using a circuit wiring board for wiring between an upper plate and a lower plate. CONSTITUTION:A connecting terminal 14 is provided in an upper plate. A probe hole 15 is provided at a position corresponding to a probe hole 16 in a lower plate. A circuit wiring board 17 is soldered at the part of each terminal 14. Finally, the probe 16 is inserted into the probe hole 15. The probe 16 is aligned to the position of each measuring point 22 of a body to be inspected 21. Further more, a grid-shaped probe 31 is aligned to the position of each terminal 14. When the grid-shaped probe 31 is compressed from the upper part the probe 16 is electrically connected to the measuring point 22 and to each lower surface terminal 19 securely utilizing the inclination of the spring of the probe 16. Under this state, short circuits and open states between the corresponding measuring points can be examined by examining short circuits and open states between the grid-shaped probes 31. Therefore, the wiring between the upper plate and the lower plate can be surely performed at one time.
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公开(公告)号：JPS61235766A
公开(公告)日：1986-10-21
申请号：JP7744785
申请日：1985-04-11
Applicant: TOPPAN PRINTING CO LTD , TOPPAN PRECISION BOARD KK
Inventor： SHIBAYAMA TAKAHIRO , YOSHIDA YOSHIHISA
Abstract: PURPOSE:To shorten an operation time by providing a confirming means which compares the contents of input error data and decides a defect in continuity and a marking mechanism which marks an electrode at a defective position of a printed circuit confirmed by the confirming means. CONSTITUTION:A translation machine is provided with an input device 9 which inputs error data on a defect in continuity obtained by the wiring inspection of a printed circuit and a connecting mechanism 31 which connects an electrode for inspection to two points of an electrode of the printed circuit specified by the error data. Further, the machine is equipped with an inspecting means which inspects whether there is electric continuity between the two points, a CPU 32 which performs general control over the confirming means for comparing the contents of the input error data and deciding a defect in continuity, and the marking mechanism 33 which marks the electrode at the defective position of the printed circuit board confirmed by the confirming means. a memory 34 and a display device 10 are added to the CPU 32. This translation machine is used to shorten the operation time.
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