RESIN COMPOSITION, CURED RELIEF PATTERN THEREOF, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELECTRONIC COMPONENT OR SEMICONDUCTOR EQUIPMENT USING THE SAME

    公开(公告)号:SG11201807054RA

    公开(公告)日:2018-09-27

    申请号:SG11201807054R

    申请日:2017-01-24

    Abstract: An object of the present invention is to provide a resin composition capable of suppressing surface roughness in a thin film portion and maintaining insulation reliability of a thin film portion, a cured relief pattern of the resin composition, and a method for manufacturing a semiconductor electronic component or a semiconductor equipment using the cured relief pattern. The constitution of the present invention for achieving the above-mentioned object is as follows. That is, the present invention provides a resin composition containing: (a) at least one resin selected from an alkali-soluble polyimide, an alkali-soluble polybenzoxazole, an alkali-soluble polyamide-imide, precursors thereof, and copolymers thereof; and (b) an alkali-soluble phenol resin, wherein a ratio (Rb/Ra) between an alkali dissolution rate (Ra) of the resin (a) and an alkali dissolution rate (Rb) of the resin (b) satisfies a relationship of 0.5≤Rb/Ra≤2.0. The present invention also provides a cured relief pattern of the resin composition, and a method for manufacturing a semiconductor electronic component or a semiconductor equipment using the cured relief pattern.

    POLISHING PAD
    5.
    发明专利

    公开(公告)号:SG192774A1

    公开(公告)日:2013-09-30

    申请号:SG2013061759

    申请日:2012-02-08

    Abstract: A polishing pad comprising at least a polishing layer and a cushion layer, wherein a groove is formed on a polishing surface of the polishing pad, at least one of angles formed by the polishing surface and a side surface of the groove which continues to the polishing surface is 105-150° inclusive, and the cushion layer has a strain constant of 7.3x10-6 to 4.4x10-4 µm/Pa inclusive. The use of the polishing pad can achieve a purpose of preventing the fluctuation in apolishing rate while keeping the polishing rate at a high level.Figure 2

    6.
    发明专利
    未知

    公开(公告)号:DE69922155T2

    公开(公告)日:2005-12-08

    申请号:DE69922155

    申请日:1999-09-07

    Abstract: The present invention relates to a positive-working photosensitive resin precursor composition which is characterized in that it contains (a) polymer in which the chief component comprises structural units of the kind where the bonding between structural units is represented by general formula (1) and (b) photoacid generator, and it can form a pattern by light irradiation and subsequent developing, and the total carboxyl groups contained in said polymer is from 0.02 to 2.0 mmol/g, and it provides a photosensitive resin composition of high sensitivity which can be developed by alkali. (R is an organic group of valency from 3 to 8 having at least 2 carbon atoms, R is an organic group of valency from 2 to 6 having at least 2 carbon atoms, R is hydrogen or an organic group with from 1 to 20 carbons. n is an integer of value from 3 to 100,000, m is 1 or 2, p and q are integers of value from 0 to 4 and p + q > 0.)

    RESIN COMPOSITION
    8.
    发明专利

    公开(公告)号:SG11201901693YA

    公开(公告)日:2019-03-28

    申请号:SG11201901693Y

    申请日:2017-08-30

    Abstract: The present invention is a resin composition including (a) a resin, (b) an antioxidizing agent, and (d) a crosslinking agent, wherein the resin composition is characterized by the following: the resin (a) is formed of one or more kinds of resins selected from among polyimide precursor, polyamide, polyimide, polybenzoxazole, and copolymers thereof; and the crosslinking agent (d) includes a phenolic hydroxyl group in one molecule, and also includes a substituent group having a molecular weight of 40 or more at both ortho positions of the phenolic hydroxyl group. Provided is the resin composition by which obtained is a pattern-cured film that enables fine patterns to be obtained, that exhibits excellent in-plane pattern uniformity while being curable at a low temperature of 250° C. or less, and that retains high extensibility and high adhesion with metal wires even after a reliability evaluation which is an actual-use accelerated test.

    10.
    发明专利
    未知

    公开(公告)号:DE69922155D1

    公开(公告)日:2004-12-30

    申请号:DE69922155

    申请日:1999-09-07

    Abstract: The present invention relates to a positive-working photosensitive resin precursor composition which is characterized in that it contains (a) polymer in which the chief component comprises structural units of the kind where the bonding between structural units is represented by general formula (1) and (b) photoacid generator, and it can form a pattern by light irradiation and subsequent developing, and the total carboxyl groups contained in said polymer is from 0.02 to 2.0 mmol/g, and it provides a photosensitive resin composition of high sensitivity which can be developed by alkali. (R is an organic group of valency from 3 to 8 having at least 2 carbon atoms, R is an organic group of valency from 2 to 6 having at least 2 carbon atoms, R is hydrogen or an organic group with from 1 to 20 carbons. n is an integer of value from 3 to 100,000, m is 1 or 2, p and q are integers of value from 0 to 4 and p + q > 0.)

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