中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

6 records (took 0.021 seconds)

    PROBE FOR TESTING SEMICONDUCTOR DEVICES
    1.
    发明申请
    PROBE FOR TESTING SEMICONDUCTOR DEVICES 审中-公开
    用于测试半导体器件的探针

    公开(公告)号：WO2008127801A2

    公开(公告)日：2008-10-23

    申请号：PCT/US2008/055835

    申请日：2008-03-04

    Applicant: TOUCHDOWN TECHNOLOGIES, INC.

    Inventor： TEA, Nim ,  KHOO, Melvin ,  HU, Ting ,  AN, Zhiyong

    IPC: G01R1/073

    CPC classification number: G01R1/06733 ,  G01R1/06727 ,  G01R3/00

    Abstract: A novel probe design is presented that increases a probe tolerance to stress fractures. Specifically, what is disclosed are three features increase stress tolerance. These features include a various union angle interface edge shapes, pivot cutouts and buffers.

    Abstract translation: 提出了一种新的探针设计，增加了对应力骨折的探针耐受性。 具体来说，公开的是增加压力容忍度的三个特征。 这些特征包括各种联合角度界面边缘形状，枢轴切口和缓冲区。

    TORSION SPRING PROBE CONTACTOR DESIGN
    3.
    发明公开
    TORSION SPRING PROBE CONTACTOR DESIGN 审中-公开
    扭力弹簧探针接触器设计

    公开(公告)号：EP1910849A1

    公开(公告)日：2008-04-16

    申请号：EP05825103.4

    申请日：2005-11-18

    Applicant: Touchdown Technologies, Inc.

    Inventor： KHOO, Melvin ,  TEA, Nim ,  ISMAIL, Salleh ,  HSU, Yang ,  TANG, Weilong ,  GARABEDIAN, Raffi

    IPC: G01R1/067 ,  G01R3/00

    CPC classification number: G01R1/06727 ,  G01R1/06738 ,  G01R3/00

    Abstract: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.

    Abstract translation: 本发明涉及一种用于与微电子器件上的接触垫电连接的探针。 具有长度，厚度，宽度，近端和远端的脚连接到基底。 脚的长度大于其宽度。 具有长度，宽度，厚度，近端和远端的扭杆在扭杆的近端处连接到脚的远端。 扭杆位于第一个平面内。 具有长度，宽度和厚度的间隔件连接到扭杆的远端。 具有长度，宽度，厚度，近端和远端的臂在臂近端处连接到所述间隔件。 手臂位于第二个平面，第二个平面与第一个平面位于不同的平面。 具有顶侧和底侧的第一柱与靠近臂末端的臂连接。 尖端电连接到柱的顶侧。

    PROBECARD SYSTEM AND METHOD
    4.
    发明申请
    PROBECARD SYSTEM AND METHOD 审中-公开
    PROBECARD系统和方法

    公开(公告)号：WO2011126628A1

    公开(公告)日：2011-10-13

    申请号：PCT/US2011/026723

    申请日：2011-03-01

    Applicant: TOUCHDOWN TECHNOLOGIES, INC. ,  LOSEY, Matt ,  KHOO, Melvin ,  DESTA, Yohannes ,  HUANG, Chang

    Inventor： LOSEY, Matt ,  KHOO, Melvin ,  DESTA, Yohannes ,  HUANG, Chang

    IPC: G01R31/00

    CPC classification number: G01R31/2889 ,  G01R1/06744

    Abstract: A microelectronic contactor assembly can include a probe head having microelectronic contactors for contacting terminals of semiconductor devices to test the semiconductor devices. A stiffener assembly can provide mechanical support to microelectronic contactors and for connecting a probe card assembly to a prober machine. A stiffener assembly may include first and second stiffener bodies that are connected together at their central portions with adjustment mechanisms such as three differential screw mechanisms. A probe head may be attached to a first stiffener body at locations outside its central portion, while a prober machine may be attached to a second stiffener body at locations outside its central portion. The first and second stiffener bodies may have different coefficients of thermal expansion. The stiffener assembly allows for differential thermal expansion of various components of the microelectronic contactor assembly while minimizing accompanying dimensional distortion that could interfere with contacting the terminals of semiconductor devices.

    Abstract translation: 微电子接触器组件可以包括具有微电子接触器的探针头，用于接触半导体器件的端子以测试半导体器件。 加强件组件可以为微电子接触器提供机械支撑并将探针卡组件连接到探测机。 加强件组件可以包括第一和第二加强件本体，其在其中心部分处与诸如三个差速螺旋机构的调节机构连接在一起。 探针头可以在其中心部分外部的位置处附接到第一加强体，而探针机可以在其中心部分外部的位置处附接到第二加强体。 第一和第二加强体可具有不同的热膨胀系数。 加强件组件允许微电子接触器组件的各种部件的差分热膨胀，同时最小化可能干扰接触半导体器件的端子的伴随的尺寸变形。

    TORSION SPRING PROBE CONTACTOR DESIGN
    5.
    发明申请
    TORSION SPRING PROBE CONTACTOR DESIGN 审中-公开
    扭力弹簧探头接触器设计

    公开(公告)号：WO2007015713A1

    公开(公告)日：2007-02-08

    申请号：PCT/US2005/042135

    申请日：2005-11-18

    Applicant: TOUCHDOWN TECHNOLOGIES, INC.

    Inventor： KHOO, Melvin ,  TEA, Nim ,  ISMAIL, Salleh ,  HSU, Yang ,  TANG, Weilong ,  GARABEDIAN, Raffi

    IPC: G01R1/067 ,  G01R3/00

    CPC classification number: G01R1/06727 ,  G01R1/06738 ,  G01R3/00

    Abstract: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.

    Abstract translation: 本发明涉及一种用于与微电子器件上的接触焊盘进行电连接的探针。 具有长度，厚度，宽度，近端和远端的脚连接到基底。 脚的长度大于其宽度。 具有长度，宽度，厚度，近端和远端的扭杆在扭杆的近端处连接到脚的远端。 扭杆位于第一平面内。 具有长度，宽度和厚度的间隔件连接到扭杆的远端。 具有长度，宽度，厚度，近端和远端的臂在臂近端处连接到所述间隔件。 臂位于第二平面中，第二平面位于与第一平面不同的平面上。 具有顶侧和底侧的第一柱连接到臂的远端附近的臂。 尖端电连接到柱的顶侧。

Patent Agency Ranking