PROBE FOR TESTING SEMICONDUCTOR DEVICES
    1.
    发明申请
    PROBE FOR TESTING SEMICONDUCTOR DEVICES 审中-公开
    用于测试半导体器件的探针

    公开(公告)号:WO2008127801A2

    公开(公告)日:2008-10-23

    申请号:PCT/US2008/055835

    申请日:2008-03-04

    CPC classification number: G01R1/06733 G01R1/06727 G01R3/00

    Abstract: A novel probe design is presented that increases a probe tolerance to stress fractures. Specifically, what is disclosed are three features increase stress tolerance. These features include a various union angle interface edge shapes, pivot cutouts and buffers.

    Abstract translation: 提出了一种新的探针设计,增加了对应力骨折的探针耐受性。 具体来说,公开的是增加压力容忍度的三个特征。 这些特征包括各种联合角度界面边缘形状,枢轴切口和缓冲区。

    TORSION SPRING PROBE CONTACTOR DESIGN
    3.
    发明公开
    TORSION SPRING PROBE CONTACTOR DESIGN 审中-公开
    扭力弹簧探针接触器设计

    公开(公告)号:EP1910849A1

    公开(公告)日:2008-04-16

    申请号:EP05825103.4

    申请日:2005-11-18

    CPC classification number: G01R1/06727 G01R1/06738 G01R3/00

    Abstract: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.

    Abstract translation: 本发明涉及一种用于与微电子器件上的接触垫电连接的探针。 具有长度,厚度,宽度,近端和远端的脚连接到基底。 脚的长度大于其宽度。 具有长度,宽度,厚度,近端和远端的扭杆在扭杆的近端处连接到脚的远端。 扭杆位于第一个平面内。 具有长度,宽度和厚度的间隔件连接到扭杆的远端。 具有长度,宽度,厚度,近端和远端的臂在臂近端处连接到所述间隔件。 手臂位于第二个平面,第二个平面与第一个平面位于不同的平面。 具有顶侧和底侧的第一柱与靠近臂末端的臂连接。 尖端电连接到柱的顶侧。

    TORSION SPRING PROBE CONTACTOR DESIGN
    4.
    发明申请
    TORSION SPRING PROBE CONTACTOR DESIGN 审中-公开
    扭力弹簧探头接触器设计

    公开(公告)号:WO2007015713A1

    公开(公告)日:2007-02-08

    申请号:PCT/US2005/042135

    申请日:2005-11-18

    CPC classification number: G01R1/06727 G01R1/06738 G01R3/00

    Abstract: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.

    Abstract translation: 本发明涉及一种用于与微电子器件上的接触焊盘进行电连接的探针。 具有长度,厚度,宽度,近端和远端的脚连接到基底。 脚的长度大于其宽度。 具有长度,宽度,厚度,近端和远端的扭杆在扭杆的近端处连接到脚的远端。 扭杆位于第一平面内。 具有长度,宽度和厚度的间隔件连接到扭杆的远端。 具有长度,宽度,厚度,近端和远端的臂在臂近端处连接到所述间隔件。 臂位于第二平面中,第二平面位于与第一平面不同的平面上。 具有顶侧和底侧的第一柱连接到臂的远端附近的臂。 尖端电连接到柱的顶侧。

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