DARK-FIELD MID-INFRARED PHOTOTHERMAL MICROSCOPY

    公开(公告)号:US20230408805A1

    公开(公告)日:2023-12-21

    申请号:US18205152

    申请日:2023-06-02

    CPC classification number: G02B21/16 G02B21/025 G02B21/361

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    Dark-field mid-infrared photothermal microscopy

    公开(公告)号:US11709352B2

    公开(公告)日:2023-07-25

    申请号:US17704896

    申请日:2022-03-25

    CPC classification number: G02B21/16 G02B21/025 G02B21/361

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

    公开(公告)号:US20250012557A1

    公开(公告)日:2025-01-09

    申请号:US18761623

    申请日:2024-07-02

    Abstract: A wide-field bond-selective optical coherence tomography (OCT) system and method for imaging a sample includes generating infrared light and directing the infrared light onto the sample to selectively heat the sample. Probe light is also directed onto the sample. A first actuator provides sample depth scanning with respect to a first objective in a reference arm of the system, and a second actuator provides sample depth scanning with respect to a second objective in a sample arm of the system. A detection system receives scattered probe light reflected from the sample. A change in the received probe light from the sample that is indicative of absorption of infrared light.

    Dark-field mid-infrared photothermal microscopy

    公开(公告)号:US12147022B2

    公开(公告)日:2024-11-19

    申请号:US18205152

    申请日:2023-06-02

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    DARK-FIELD MID-INFRARED PHOTOTHERMAL MICROSCOPY

    公开(公告)号:US20220308327A1

    公开(公告)日:2022-09-29

    申请号:US17704896

    申请日:2022-03-25

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

Patent Agency Ranking