公开(公告)号：EP2818838A4

公开(公告)日：2015-11-11

申请号：EP13751849

申请日：2013-02-06

Applicant: UNIV OSAKA

Inventor： KONISHI TSUYOSHI ,  TAKAHASHI KOJI ,  NAGASHIMA TOMOTAKA

IPC: G01J11/00 ,  G02F1/365

CPC classification number: H04B10/07955 ,  G01J11/00 ,  H04B10/25

Abstract: A waveform reconstruction device (140) includes: a phase-spectrum calculation unit (143) which (i) simulates, for each intensity of an input optical signal assumed to have a given phase spectrum, propagation of the input optical signal through an optical transmission medium, to calculate a power spectrum of an output optical signal, and (ii) performs iterations of simulating the propagation while changing the given phase spectrum to reduce differences between calculated power spectra and measured power spectra of the input optical signal having the intensities, to search for a phase spectrum of the input optical signal; and a waveform reconstruction unit (144) which reconstructs a time waveform of the input optical signal using the phase spectrum found through the search, wherein the phase-spectrum calculation unit (143) changes the given phase spectrum or simulates the propagation, based on a nonlinear optical effect or a dispersion effect.

公开(公告)号：EP2975372A4

公开(公告)日：2016-12-21

申请号：EP14765498

申请日：2014-03-10

Applicant: UNIV OSAKA

Inventor： KONISHI TSUYOSHI ,  SATOH TAKEMA ,  NAGASHIMA TOMOTAKA

IPC: G01J9/00 ,  G01J3/02 ,  G01J3/36 ,  G02B6/12

CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).