公开(公告)号：US11835474B2

公开(公告)日：2023-12-05

申请号：US17783183

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Karsten Joensen ,  Peter Hoghoj ,  Ronan Mahe

IPC: G01N23/201 ,  G01N23/041 ,  G01N23/207

CPC classification number: G01N23/041 ,  G01N23/201 ,  G01N23/207 ,  G01N2223/054 ,  G21K2201/067

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.