光度计
    1.
    发明公开

    公开(公告)号:CN86101338A

    公开(公告)日:1986-12-03

    申请号:CN86101338

    申请日:1986-03-03

    CPC classification number: G01N21/3504 G01J5/34 G01J2001/1652

    Abstract: 一种光度计,在这种光度计中红外线从一个辐射器发出,经过调制、通过一个被测量气体流过的导管并由一个接收器输出口所接收,它设计成在测量导管前设有聚偏氟乙烯制成的第二个接收器(接收器输入口),它用来允许部分通过红外光束。

    Dual spectra optical pyrometer having a serial array of photodectectors
    4.
    发明授权
    Dual spectra optical pyrometer having a serial array of photodectectors 失效
    双光谱光学高温计具有串联的光电探测器阵列

    公开(公告)号:US4681434A

    公开(公告)日:1987-07-21

    申请号:US798213

    申请日:1985-11-14

    Applicant: Dean A. Kepple

    Inventor: Dean A. Kepple

    CPC classification number: G01J5/28 G01J2001/1652 G01J2005/604 G01J2005/607

    Abstract: A novel dual spectra optical pyrometer is characterized by a serial array of photodetectors. The first photodetector absorbs a spectral portion of a target optical beam incident thereto, and passes the remainder optical beam to the second photodetector. Signals from both photodetectors are provided along with signals indicative of the first detector's spectral absorption and an estimate of the equivalent black body temperature of a fireball to a signal processor which provides a compensated temperature signal therefrom.

    Abstract translation: 一种新型的双光谱光学高温计的特征在于一系列光电检测器。 第一光电检测器吸收入射到其中的目标光束的光谱部分,并将剩余光束传递到第二光电检测器。 提供来自两个光电检测器的信号以及指示第一检测器的光谱吸收的信号以及将火球的等效黑体温度估计给信号处理器,信号处理器从其提供经补偿的温度信号。

    Electro-optical instrument with self-contained photometer
    5.
    发明授权
    Electro-optical instrument with self-contained photometer 失效
    具有独立光度计的电光仪器

    公开(公告)号:US5113082A

    公开(公告)日:1992-05-12

    申请号:US580824

    申请日:1990-09-11

    CPC classification number: G01N21/55 G01B11/026 G01B11/303 G01J2001/1652

    Abstract: An optical instrument for measuring characteristics of a specimen comprises a light source and an axial reflective member spaced from the light source to define an optical axis for the instrument along a line between the light source and the reflective member. A non-axial reflector is positioned laterally of the reflective member and laterally of the optical axis to receive a beam reflected from the axial reflective member. The non-axial reflector is oriented to reflect the beam onto the specimen. The instrument also contains a segmented photosensor and a second non-axial reflector to receive the beam reflected from the specimen and reflect it onto the segmented photosensor. The photosensor is positioned in the instrument to receive the beam from the second non-axial reflector. A conductor connected to each segment of the photosensor is provided for carrying current to signal conditioning hardware used to compare the current from the segments of the photosensor to provide information concerning the specimen.

    Abstract translation: 用于测量样本特征的光学仪器包括光源和与光源间隔开的轴向反射构件,以沿着光源和反射构件之间的线限定器械的光轴。 非轴向反射器位于反射构件的横向并且在光轴的侧面上以接收从轴向反射构件反射的光束。 非轴向反射器被定向成将光束反射到样品上。 该仪器还包含分段的光传感器和第二非轴向反射器以接收从样本反射的光束并将其反射到分段的光传感器上。 光传感器位于仪器中以接收来自第二非轴向反射器的光束。 连接到光电传感器的每个段的导体被提供用于将电流传送到用于比较来自光电传感器的段的电流的信号调节硬件以提供关于样本的信息。

    Reflective optical instrument for measuring surface reflectance
    6.
    发明授权
    Reflective optical instrument for measuring surface reflectance 失效
    用于测量表面反射的反射光学仪器

    公开(公告)号:US5103106A

    公开(公告)日:1992-04-07

    申请号:US672317

    申请日:1991-03-20

    CPC classification number: G01B11/303 G01B11/026 G01N21/55 G01J2001/1652

    Abstract: An optical instrument for measuring characteristics of a specimen comprising a light source to project a beam onto the surface of a specimen at a selected oblique angle of incidence .beta.. The instrument also contains a photosensor to receive the beam reflected from the specimen at the same angle .beta.. A conductor connected to the photosensor is provided for carrying current to signal conditioning hardware used to compare the current from two or more photosensors or, if present, from different segments of the same photosensor to provide information concerning the specimen. Photosensor means is also positioned facing the specimen on an optical axis located normal to the surface of the specimen and intermediate the incident and reflected beams from the light source to receive a beam reflected from the specimen normal to its surface, i.e., along the optical axis. Signals from the photosensors are fed to the signal conditioning hardware to measure the optical power and to compare signals for measuring characteristics of the surface, e.g., its reflectivity or reflectance and to locate its position and/or orientation with respect to the instrument.

    Abstract translation: 一种用于测量样品特性的光学仪器,包括光源,以将光束以选定的倾斜角度β投影到样品的表面上。 该仪器还包含光电传感器,以相同的角度β接收从样品反射的光束。 连接到光传感器的导体被提供用于将电流传送到用于比较来自两个或更多个光电传感器的电流的信号调节硬件,或者如果存在,则从同一光电传感器的不同部分提供关于样本的信息。 光电传感器装置还定位在垂直于样品表面的光轴上面对样品,并且在来自光源的入射和反射光束之间中间接收从垂直于其表面的样品反射的光束,即沿着光轴 。 来自光电传感器的信号被馈送到信号调节硬件以测量光功率,并且比较用于测量表面特性的信号,例如其反射率或反射率,并且相对于仪器定位其位置和/或取向。

    REFLECTIVE OPTICAL INSTRUMENT
    7.
    发明申请
    REFLECTIVE OPTICAL INSTRUMENT 审中-公开
    反射光学仪器

    公开(公告)号:WO1992004619A1

    公开(公告)日:1992-03-19

    申请号:PCT/US1991006514

    申请日:1991-09-06

    CPC classification number: G01B11/303 G01B11/026 G01J2001/1652 G01N21/55

    Abstract: An optical instrument for measuring characteristics of a specimen comprising a light source (10) to project a beam (14) onto the surface of a specimen at a selected oblique angle of incidence β. The instrument contains a photosensor (30) to receive the beam reflected from the specimen at the same angle β. A conductor (31) is provided for carrying current to signal conditioning hardware (21) used to compare the current from two or more photosensors from different segments of the same photosensor providing information concerning the specimen. Photosensor means (30) is positioned facing the specimen on an optical axis located normal to the surface of the specimen and intermediate the incident and reflected beams from the light source to receive a beam reflected from the specimen normal to its surface. Signals from the photosensors are fed to the signal conditioning hardware (21) to measure the optical power and to compare signals for measuring characteristics of the surface.

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