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公开(公告)号：CN102741671B
公开(公告)日：2016-07-06
申请号：CN201080054366.7
申请日：2010-11-30
Applicant: IMEC公司
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: 一种用于成像系统的集成电路，具有光学传感器阵列(40)和光学滤波器阵列(10)，每个光学滤波器被配置为使一波长带传递至一个或多个传感器，光学滤波器阵列与传感器阵列集成，并且该集成电路还具有从传感器阵列读出像素值以表示图像的读出电路(30)，不同的光学滤波器被配置为具有不同的厚度，以借助干涉传递不同的波长带，并允许波长光谱的检测。读出电路可以使得位于一个光学滤波器下的多个像素以并行读出。厚度可以跨阵列非单调变化。读出或后面的图像处理可包括波长之间的选择或内插，以实施光谱采样或移动，以补偿厚度误差。
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公开(公告)号：CN102741671A
公开(公告)日：2012-10-17
申请号：CN201080054366.7
申请日：2010-11-30
Applicant: IMEC公司
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: 一种用于成像系统的集成电路，具有光学传感器阵列(40)和光学滤波器阵列(10)，每个光学滤波器被配置为使一波长带传递至一个或多个传感器，光学滤波器阵列与传感器阵列集成，并且该集成电路还具有从传感器阵列读出像素值以表示图像的读出电路(30)，不同的光学滤波器被配置为具有不同的厚度，以借助干涉传递不同的波长带，并允许波长光谱的检测。读出电路可以使得位于一个光学滤波器下的多个像素以并行读出。厚度可以跨阵列非单调变化。读出或后面的图像处理可包括波长之间的选择或内插，以实施光谱采样或移动，以补偿厚度误差。
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公开(公告)号：US20120327248A1
公开(公告)日：2012-12-27
申请号：US13482860
申请日：2012-05-29
Applicant: Klaas TACK , Andy Lambrechts , Luc Haspeslagh
Inventor： Klaas TACK , Andy Lambrechts , Luc Haspeslagh
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system is disclosed. In one aspect, an integrated circuit has an array of optical sensors, an array of optical filters integrated with the sensors and configured to pass a band of wavelengths onto one or more of the sensors, and read out circuitry to read out pixel values from the sensors to represent an image. Different ones of the optical filters are configured to have a different thickness, to pass different bands of wavelengths by means of interference, and to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 公开了一种用于成像系统的集成电路。 在一个方面，集成电路具有光学传感器阵列，与传感器集成的光学滤波器阵列，并被配置为将波长带传递到一个或多个传感器上，并且读出电路以从 传感器来表示图像。 不同的滤光器被配置为具有不同的厚度，以通过干涉传递不同波长的波段，并且允许检测波长谱。 读出电路可以使一个光学滤波器下的多个像素平行读出。 厚度可以在整个阵列上单调变化。 读出或稍后的图像处理可能涉及波长之间的选择或插值，以进行频谱采样或移位，以补偿厚度误差。
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公开(公告)号：US20160252395A1
公开(公告)日：2016-09-01
申请号：US15059715
申请日：2016-03-03
Applicant: IMEC
Inventor： Klaas Tack , Andy Lambrechts , Luc Haspeslagh
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system is disclosed. In one aspect, an integrated circuit has an array of optical sensors, an array of optical filters integrated with the sensors and configured to pass a band of wavelengths onto one or more of the sensors, and read out circuitry to read out pixel values from the sensors to represent an image. Different ones of the optical filters are configured to have a different thickness, to pass different bands of wavelengths by means of interference, and to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non-monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 公开了一种用于成像系统的集成电路。 在一个方面，集成电路具有光学传感器阵列，与传感器集成的光学滤波器阵列，并被配置为将波长带传递到一个或多个传感器上，并且读出电路以从 传感器来表示图像。 不同的滤光器被配置为具有不同的厚度，以通过干涉传递不同波长的波段，并且允许检测波长谱。 读出电路可以使一个光学滤波器下的多个像素平行读出。 厚度可以在阵列之间非单调地变化。 读出或稍后的图像处理可能涉及波长之间的选择或插值，以进行频谱采样或移位，以补偿厚度误差。
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公开(公告)号：US5319441A
公开(公告)日：1994-06-07
申请号：US114287
申请日：1993-09-01
Applicant: Mitsugu Terada , Ken Ohmata , Michito Uehara , Hideaki Shibata , Yasuo Oeda , Yuichiro Terashi
Inventor： Mitsugu Terada , Ken Ohmata , Michito Uehara , Hideaki Shibata , Yasuo Oeda , Yuichiro Terashi
CPC classification number: G01J9/0246 , G01J2003/265
Abstract: A laser light, whose wavelength is to be measured, is introduced into an etalon, a concentric circular interference stripe derived from the etalon is irradiated onto a one-dimensional photodetector array and a diameter of the interference stripe is measured to measure the wavelength of the laser light. Alternatively, if a reference laser light of known wavelength is introduced into the etalon, as described above, a wavelength measurement of extremely high accuracy can be made without being affected by positional deviations of the optical system.
Abstract translation: 将要测量其波长的激光引入标准具中，将衍生自标准具的同心圆形干涉条纹照射到一维光电检测器阵列上，并测量干涉条纹的直径以测量波长 激光灯。 或者，如果将已知波长的参考激光引入标准具，如上所述，可以在不受光学系统的位置偏差的影响的情况下进行极高精度的波长测量。
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Patent Agency Ranking
公开(公告)号：EP2511681A2
公开(公告)日：2012-10-17
申请号：EP12175340.4
申请日：2010-11-30
Applicant: IMEC
Inventor： Tack, Klaas , Lambrechts, Andy , Haspeslagh, Luc
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system has an array of optical sensors (40), and an array of optical filters (10) each configured to pass a band of wavelengths onto one or more of the sensors, the array of optical filters being integrated with the array of sensors, and the integrated circuit also having read out circuitry (30) to read out pixel values from the array of sensors to represent an image, different ones of the optical filters being configured to have a different thickness, to pass different bands of wavelengths by means of interference, to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 用于成像系统的集成电路具有光学传感器阵列（40）和光学滤波器阵列（10），每个光学滤波器被配置为将波长带传递到一个或多个传感器上，光学滤波器阵列与 传感器阵列以及集成电路还具有读出电路（30）以读出来自传感器阵列的像素值以表示图像，不同的光学滤波器被配置为具有不同的厚度以通过不同的频带 通过干涉的波长，以允许检测波长的光谱。 读出电路可以使一个光学滤波器下的多个像素并行读出。 阵列的厚度可能非单调变化。 读出或稍后的图像处理可能涉及波长之间的选择或内插，以执行频谱采样或移位，以补偿厚度误差。
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7.发明公开Integrated circuit for spectral imaging system 审中-公开Integrierte Schaltungfürspektrales Abbildungsystem
公开(公告)号：EP2522968A1
公开(公告)日：2012-11-14
申请号：EP12175335.4
申请日：2010-11-30
Applicant: IMEC
Inventor： Tack, Klaas , Lambrechts, Andy , Haspeslagh, Luc
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system has an array of optical sensors (40), and an array of optical filters (10) each configured to pass a band of wavelengths onto one or more of the sensors, the array of optical filters being integrated with the array of sensors, and the integrated circuit also having read out circuitry (30) to read out pixel values from the array of sensors to represent an image, different ones of the optical filters being configured to have a different thickness, to pass different bands of wavelengths by means of interference, to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 一种用于成像系统的集成电路具有光学传感器阵列（40）和每个被配置成将波长带传递到一个或多个传感器上的滤光器阵列（10），所述滤光器阵列与 所述传感器阵列和所述集成电路还具有读出电路（30），以从所述传感器阵列中读出像素值以表示图像，所述不同的所述滤光器被配置为具有不同的厚度以通过不同的带 的波长，以允许检测波长的光谱。 读出电路可以使一个光学滤波器下的多个像素平行读出。 厚度可以在整个阵列上单调变化。 读出或稍后的图像处理可能涉及波长之间的选择或插值，以进行频谱采样或移位，以补偿厚度误差。
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公开(公告)号：EP2507599A1
公开(公告)日：2012-10-10
申请号：EP10798279.5
申请日：2010-11-30
Applicant: IMEC
Inventor： TACK, Klaas , LAMBRECHTS, Andy , HASPESLAGH, Luc
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system has an array of optical sensors (40), and an array of optical filters (10) each configured to pass a band of wavelengths onto one or more of the sensors, the array of optical filters being integrated with the array of sensors, and the integrated circuit also having read out circuitry (30) to read out pixel values from the array of sensors to represent an image, different ones of the optical filters being configured to have a different thickness, to pass different bands of wavelengths by means of interference, to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 用于成像系统的集成电路具有光学传感器阵列（40）和光学滤波器阵列（10），每个光学滤波器被配置为将波长带传递到一个或多个传感器上，光学滤波器阵列与 传感器阵列以及集成电路还具有读出电路（30）以读出来自传感器阵列的像素值以表示图像，不同的光学滤波器被配置为具有不同的厚度以通过不同的频带 通过干涉的波长，以允许检测波长的光谱。 读出电路可以使一个光学滤波器下的多个像素并行读出。 阵列的厚度可能非单调变化。 读出或稍后的图像处理可能涉及波长之间的选择或内插，以执行频谱采样或移位，以补偿厚度误差。
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公开(公告)号：WO2011064403A1
公开(公告)日：2011-06-03
申请号：PCT/EP2010/068575
申请日：2010-11-30
Applicant: IMEC , TACK, Klaas , LAMBRECHTS, Andy , HASPESLAGH, Luc
Inventor： TACK, Klaas , LAMBRECHTS, Andy , HASPESLAGH, Luc
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826 , H04N5/332 , H04N5/378
Abstract: An integrated circuit for an imaging system has an array of optical sensors (40), and an array of optical filters (10) each configured to pass a band of wavelengths onto one or more of the sensors, the array of optical filters being integrated with the array of sensors, and the integrated circuit also having read out circuitry (30) to read out pixel values from the array of sensors to represent an image, different ones of the optical filters being configured to have a different thickness, to pass different bands of wavelengths by means of interference, to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.
Abstract translation: 一种用于成像系统的集成电路具有光学传感器阵列（40）和每个被配置成将波长带传递到一个或多个传感器上的滤光器阵列（10），所述滤光器阵列与 所述传感器阵列和所述集成电路还具有读出电路（30），以从所述传感器阵列中读出像素值以表示图像，所述不同的所述滤光器被配置为具有不同的厚度以通过不同的带 的波长，以允许检测波长的光谱。 读出电路可以使一个光学滤波器下的多个像素平行读出。 厚度可以在整个阵列上单调变化。 读出或稍后的图像处理可能涉及波长之间的选择或插值，以进行频谱采样或移位，以补偿厚度误差。
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公开(公告)号：US11733095B2
公开(公告)日：2023-08-22
申请号：US17302217
申请日：2021-04-27
Applicant: IMEC
Inventor： Nicolaas Tack , Andy Lambrechts , Luc Haspeslagh
CPC classification number: G01J3/2823 , G01J3/12 , G01J3/26 , G01J3/2803 , H04N23/11 , H04N25/75 , G01J2003/1226 , G01J2003/265 , G01J2003/2806 , G01J2003/2826
Abstract: A method for calibrating an image sensor begins by illuminating a portion of the image sensor with an input light spectrum, where the input light spectrum includes light of known wavelength and intensity. The method continues by sampling an output for each optical sensor of the image sensor, where each optical sensor is associated with one or more optical filters and where each optical filter being associated with a group of optical filters of a plurality of groups of optical filters. Each optical filter of a group of optical filters is configured to pass light in a different wavelength range and at least some optical filters in different groups of the plurality of groups of optical filters are configured to pass light in substantially a same wavelength range. The method then continues by comparing a sampled output for each optical sensor of the plurality of optical sensors with an expected output and generating a calibration factor for each of at least a subset of the plurality of optical sensors and storing the generated calibration factors in memory.
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