公开(公告)号：US20240350011A1

公开(公告)日：2024-10-24

申请号：US18686176

申请日：2022-08-23

Applicant: The General Hospital Corporation

Inventor： Andrew D. Thrapp ,  Osman O. Ahsen ,  Guillermo J. Tearney ,  Farouc A. Jaffer ,  Joseph A. Gardecki ,  Mohamad B. Kassab ,  Adam Mauskapf

IPC: A61B5/00 ,  G01N21/64

CPC classification number: A61B5/0035 ,  A61B5/004 ,  A61B5/0066 ,  A61B5/0071 ,  A61B5/0086 ,  A61B5/6852 ,  G01N21/6456 ,  G01N2201/06113

Abstract: A method for detecting inflammatory activity, including: providing a catheter including a near-infrared fluorescence (NIRF) imaging system configured to perform NIRF imaging and an optical coherence tomography (OCT) imaging system configured to perform structural imaging; introducing a near-infrared fluorescent cathepsin-activatable imaging agent into a blood vessel; placing a distal end of the catheter within the blood vessel; obtaining, using the OCT imaging system, structural images of an atherosclerotic plaque within the blood vessel; obtaining, using the NIRF imaging system. NIRF images of the atherosclerotic plaque within the blood vessel; detecting the near-infrared fluorescent cathepsin-activatable imaging agent in the NIRF images; and identifying inflammation within the atherosclerotic plaque based on detecting the near-infrared fluorescent cathepsin-activatable imaging agent in the NIRF images.

公开(公告)号：US12123834B2

公开(公告)日：2024-10-22

申请号：US16900008

申请日：2020-06-12

Applicant: Quantum-Si Incorporated

Inventor： Jonathan M. Rothberg ,  Ali Kabiri ,  Jason W. Sickler ,  Brett J. Gyarfas ,  Jeremy Lackey ,  Gerard Schmid

IPC: B01L3/00 ,  C12Q1/6869 ,  C12Q1/6874 ,  G01N21/64 ,  G01N21/77

CPC classification number: G01N21/6486 ,  B01L3/5085 ,  C12Q1/6869 ,  C12Q1/6874 ,  G01N21/64 ,  G01N21/645 ,  G01N21/6452 ,  G01N21/648 ,  G01N21/7743 ,  G01N21/7746 ,  B01L2200/12 ,  B01L2300/0829 ,  B01L2300/0887 ,  B01L2300/0893 ,  B01L2300/168 ,  C12Q2521/101 ,  C12Q2525/101 ,  C12Q2537/157 ,  C12Q2563/107 ,  C12Q2565/607 ,  G01N2021/6419 ,  G01N2021/6441 ,  G01N2021/6478 ,  G01N2201/02 ,  G01N2201/06113 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/068 ,  G01N2201/125 ,  Y10T29/49016 ,  C12Q1/6874 ,  C12Q2521/101 ,  C12Q2525/101 ,  C12Q2537/157 ,  C12Q2563/107 ,  C12Q2565/607

Abstract: An active-source-pixel, integrated device capable of performing biomolecule detection and/or analysis, such as single-molecule nucleic acid sequencing, is described. An active pixel of the integrated device includes a sample well into which a sample to be analyzed may diffuse, an excitation source for providing excitation energy to the sample well, and a sensor configured to detect emission from the sample. The sensor may comprise two or more segments that produce a set of signals that are analyzed to differentiate between and identify tags that are attached to, or associated with, the sample. Tag differentiation may be spectral and/or temporal based. Identification of the tags may be used to detect, analyze, and/or sequence the biomolecule.

公开(公告)号：US20240344995A1

公开(公告)日：2024-10-17

申请号：US18294489

申请日：2022-08-04

Applicant: NATIONAL RESEARCH COUNCIL OF CANADA

Inventor： André MOREAU ,  André HAMEL ,  Mohamad SABSABI

IPC: G01N21/71 ,  G01N21/03 ,  G01N21/09

CPC classification number: G01N21/718 ,  G01N21/09 ,  G01N2021/0342 ,  G01N2021/0378 ,  G01N2201/06113

Abstract: Described are various embodiments of a refractory lance assembly and a composite refractory lance. In one embodiment, a refractory lance assembly is provided that comprises: an immersion tube having an immersion tip immersible within a melt and an extension tube coupled at an opposed end thereof to form a longitudinally extended composite tube therewith defining an optical path therein, wherein said longitudinally extended composite tube is injectable, in use. with an inert gas to form and probe an immersed melt surface. The assembly further comprises a shroud longitudinally encasing the composite tube and injectable with inert gas to mitigate fluid contamination of the composite tube and immersed melt surface.

公开(公告)号：US20240337592A1

公开(公告)日：2024-10-10

申请号：US18750156

申请日：2024-06-21

Applicant: Renishaw PLC

Inventor： Ian Robert Thomas ASHTON ,  Stephan Kloss ,  Christopher Sutcliffe ,  Ben Ian Ferrar

IPC: G01N21/27 ,  B22F10/00 ,  B22F10/28 ,  B22F10/31 ,  B22F10/36 ,  B22F10/366 ,  B22F10/368 ,  B22F12/41 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B29C64/153 ,  B29C64/268 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  G01J3/28 ,  G01N21/71

CPC classification number: G01N21/274 ,  B22F10/00 ,  B22F10/28 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B29C64/153 ,  B29C64/268 ,  G01J3/28 ,  G01N21/718 ,  B22F10/31 ,  B22F10/36 ,  B22F10/366 ,  B22F10/368 ,  B22F12/41 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  G01N2201/06113 ,  Y02P10/25

Abstract: This invention concerns a laser solidification apparatus for building objects by layerwise solidification of powder material. The apparatus including a build chamber containing a build platform, a device for depositing layers of powder material on to the build platform, an optical unit for directing a laser beam to selectively solidify areas of each powder layer and a spectrometer for detecting characteristic radiation emitted by plasma formed during solidification of the powder by the laser beam. The invention also relates to a spectrometer for detecting characteristic radiation generated by interaction of the metal with the or a further laser beam. The spectra recorded using the spectrometer may be used for feedback control during the solidification process.

公开(公告)号：US12111266B2

公开(公告)日：2024-10-08

申请号：US17044571

申请日：2018-12-13

Applicant: Shimadzu Corporation

Inventor： Takahide Hatahori ,  Yuya Nagata ,  Kenji Takubo

IPC: G01N21/88 ,  G01B9/02 ,  G01N29/24

CPC classification number: G01N21/8806 ,  G01B9/02094 ,  G01N29/2418 ,  G01N2021/8838 ,  G01N2201/06113 ,  G01N2201/0635

Abstract: A vibration measurement device 10 includes an excitation unit (signal generator 11 and vibrator 12) for exciting an elastic wave to an inspection target S, an illumination unit (wavelength stabilized laser beam source 13 and illumination light lens 14) for performing stroboscopic illumination to a measurement region of a surface of the inspection target S using a wavelength stabilized laser beam source 13, a displacement measurement unit (speckle-sharing interferometer 15) for collectively measuring a displacement of each point of the measurement region in the back-and-forth direction by speckle interferometry or speckle-sharing interferometer. By using the wavelength stabilized laser beam source 13, an interference image can be obtained even when the inspection target S has large surface irregularities.

公开(公告)号：US20240328949A1

公开(公告)日：2024-10-03

申请号：US18286320

申请日：2022-04-12

Applicant: PURDUE RESEARCH FOUNDATION

Inventor： Garth Jason Simpson ,  Aleksandr Razumtcev ,  Minghe Li

IPC: G01N21/64 ,  G01N21/17 ,  G01N21/35 ,  G01N21/63

CPC classification number: G01N21/6458 ,  G01N21/35 ,  G01N21/636 ,  G01N2021/1731 ,  G01N2021/3595 ,  G01N2021/6439 ,  G01N2201/06113

Abstract: A method of selectively photothermally heating a sample in a fluorescence-detected mid-infrared photothermal microscopy is disclosed which includes energizing a sample with one or more modulated infrared (IR) beams sourced by a multichannel laser array, concurrently continuously illuminating the sample with a probe beam, thereby generating a fluorescence response signal, capturing the fluorescence response signal, processing the captured modulated fluorescence response signal into two IR absorption spectra corresponding to chemical properties of two components in the sample by scanning over each channel of the multichannel laser array, generating a binary mask associated with the two spectra, establishing a cost function based on the generated binary mask, optimizing the cost function by optimizing the binary mask, and selectively energizing channels of the multichannel laser array based on the optimized binary mask thereby maximizing discrimination between the two components.

公开(公告)号：US20240319109A1

公开(公告)日：2024-09-26

申请号：US18679478

申请日：2024-05-31

Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor： Chung-Pin Chou

IPC: G01N21/95 ,  G01B11/30 ,  H01L21/67

CPC classification number: G01N21/9505 ,  G01B11/303 ,  H01L21/67288 ,  G01N2201/06113 ,  G01N2201/066 ,  G01N2201/10

Abstract: Wafer inspection apparatuses and methods are described. The wafer inspection apparatus includes an optical module, at least one wafer holder for carrying a plurality of wafers, and a plurality of optical sensors. The optical module is configured to emit a plurality of light beams for simultaneously scanning the plurality of wafers carried by the at least one wafer holder. The plurality of optical sensors is configured to receive the light beams reflected by the plurality of wafers.

公开(公告)号：US20240319082A1

公开(公告)日：2024-09-26

申请号：US18611916

申请日：2024-03-21

Applicant: SEIKO EPSON CORPORATION

Inventor： Kohei YAMADA

IPC: G01N21/31 ,  G01B11/02

CPC classification number: G01N21/31 ,  G01B11/02 ,  G01N2201/06113 ,  G01N2201/0636

Abstract: An optical device includes: an analysis optical system; and a length measurement optical system. The analysis optical system includes a moving mirror configured to reflect analysis light to add a first modulation signal to the analysis light, a gas cell with a gas that absorbs light of a predetermined wavelength sealed therein and configured to add a light absorption signal to the analysis light, and a first light receiving element configured to receive the analysis light including a sample-derived signal, the first modulation signal, and the light absorption signal. The length measurement optical system includes a second light source and obtains a displacement signal corresponding to a position of the moving mirror using laser light.

公开(公告)号：US12085507B2

公开(公告)日：2024-09-10

申请号：US17645026

申请日：2021-12-17

Applicant: California Institute of Technology

Inventor： Lance E. Christensen ,  Kamjou Mansour

IPC: G01N21/61 ,  A61M16/00 ,  G01N33/00

CPC classification number: G01N21/61 ,  A61M16/0003 ,  A61M2202/0208 ,  G01N33/004 ,  G01N2201/06113

Abstract: An in-situ sensor system that is configured to be placed inside of an oxygen mask for a pilot. The sensor system is readily placed in a position over the exhalation valve such that it can capture data from the exhaled air of the pilot. The sensor system has an optical sensor element that can capture data real time and feed the data to a control module that can subsequently be use to generate output data for the pilot and/or ground elements.

公开(公告)号：US20240295490A1

公开(公告)日：2024-09-05

申请号：US18237589

申请日：2023-08-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaeho Kim ,  Younghoon Sohn ,  Sunhong Jun

IPC: G01N21/25 ,  G01N21/956

CPC classification number: G01N21/255 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/0683

Abstract: A measurement apparatus includes a light source assembly configured to emit light to a sample, a measuring device configured to measure reflected light, and a stage on which the sample is provided, where the light source assembly includes a first plate, a plurality of light sources connected to the first plate and a blocking panel comprising a hole, and one of the plurality of light sources is aligned with the hole in a first direction.