In-package fly-by signaling
    123.
    发明授权
    In-package fly-by signaling 有权
    包装内飞行信号

    公开(公告)号:US09241420B2

    公开(公告)日:2016-01-19

    申请号:US14275098

    申请日:2014-05-12

    Abstract: In-package fly-by signaling can be provided in a multi-chip microelectronic package having address lines on a package substrate configured to carry address information to a first connection region on the substrate having a first delay from terminals of the package, and the address lines being configured to carry the address information beyond the first connection region to at least to a second connection region having a second delay from the terminals that is greater than the first delay. Address inputs of a first microelectronic element, e.g., semiconductor chip, can be coupled with each of the address lines at the first connection region, and address inputs of a second microelectronic element can be coupled with each of the address lines at the second connection region.

    Abstract translation: 可以在具有在封装衬底上的地址线的多芯片微电子封装中提供封装内的飞越信号,该封装衬底被配置为将地址信息传送到具有来自封装端子的第一延迟的衬底上的第一连接区域,并且地址 线路被配置为将地址信息超出第一连接区域至少至少具有来自大于第一延迟的端子的具有第二延迟的第二连接区域。 第一微电子元件(例如,半导体芯片)的地址输入可以与第一连接区域处的每个地址线耦合,并且第二微电子元件的地址输入可以在第二连接区域与每个地址线耦合 。

    Manufacture of face-down microelectronic packages
    130.
    发明授权
    Manufacture of face-down microelectronic packages 有权
    面朝下的微电子封装的制造

    公开(公告)号:US08945987B2

    公开(公告)日:2015-02-03

    申请号:US13837724

    申请日:2013-03-15

    Abstract: In a high volume method for manufacturing a microelectronic package, a spacer element and a first die, i.e., microelectronic element, can be attached face-down to a surface of a substrate, contacts on the first die facing a first through opening of the substrate. Then, a second die can be attached face-down atop the first die and the spacer element, contacts on the second die disposed beyond an edge of the first die and facing a second through opening in the substrate. Electrical connections can then be formed between each of the first and second dies and the substrate. The first and second dies can be transferred from positions of a single diced wafer which are selected to maximize compound speed bin yield of the microelectronic package.

    Abstract translation: 在用于制造微电子封装的高体积方法中,间隔元件和第一裸片(即微电子元件)可以面朝下地附着到衬底的表面,在第一裸片上的与衬底的第一通孔相接触 。 然后,可以将第二模具面朝下地安装在第一模具和间隔元件的顶部上,在第二模具上接触设置在第一模具的边缘之外并且面向衬底中的第二通孔。 然后可以在第一和第二模具和基板中的每一个之间形成电连接。 第一和第二模具可以从单个切割晶片的位置转移,其被选择为使微电子封装的复合速度仓产量最大化。

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