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    Apparatus and Methods for Selecting Light Emitters
    121.
    发明申请
    Apparatus and Methods for Selecting Light Emitters 有权
    用于选择光发射器的装置和方法

    公开(公告)号：US20120275147A1

    公开(公告)日：2012-11-01

    申请号：US13548646

    申请日：2012-07-13

    Applicant: John Roberts ,  Chenhua You

    Inventor： John Roberts ,  Chenhua You

    IPC: F21V9/00

    CPC classification number: G01J3/46 ,  F21K9/00 ,  F21K9/62 ,  G01J3/00 ,  G01J3/462 ,  G01J2001/4247 ,  G01J2003/467 ,  G02F1/1336 ,  G02F1/133602 ,  G09G3/00 ,  G09G3/3406 ,  G09G3/36 ,  H05B33/0803 ,  H05B33/086 ,  H05B33/0863

    Abstract: Provided are devices and methods for grouping light emitters and devices including the same. Embodiments of such methods may include selecting a portion of the light emitters using a region of a multiple axis color space that is configured to represent each of a plurality of colors as at least two chromaticity coordinates. The region may be proximate a predefined point on the multiple axis color space and includes a major axis having a first length and a minor axis having a second length that is less than the first length.

    Abstract translation: 提供了用于对发光体和包括其的装置进行分组的装置和方法。 这种方法的实施例可以包括使用被配置为将多个颜色中的每一个表示为至少两个色度坐标的多轴颜色空间的区域来选择一部分发光体。 该区域可以接近多轴颜色空间上的预定点，并且包括具有第一长度的长轴和具有小于第一长度的第二长度的短轴。

    Stand-off chemical detector
    122.
    发明授权
    Stand-off chemical detector 有权
    分离式化学检测器

    公开(公告)号：US08124936B1

    公开(公告)日：2012-02-28

    申请号：US11955674

    申请日：2007-12-13

    Applicant: William M. Lagna

    Inventor： William M. Lagna

    IPC: H01L27/14

    CPC classification number: G01N33/22 ,  G01J3/00 ,  G01J3/2803 ,  G01J3/36 ,  G01J5/025 ,  G01J2005/0077 ,  G01N21/00 ,  G01N21/35 ,  G01N2021/1793

    Abstract: A stand-off chemical detector has an array of charge-coupled-device electromagnetic radiation sensing elements. One or more first charge-coupled-device electromagnetic radiation sensing elements of the array are selectively responsive to non-visible electromagnetic radiation having at least a first wavelength, and one or more second charge-coupled-device electromagnetic radiation sensing elements of the array are selectively responsive to non-visible electromagnetic radiation having at least a second wavelength that is different that the at least first wavelength.

    Abstract translation: 独立的化学检测器具有电荷耦合器件电磁辐射感测元件阵列。 阵列的一个或多个第一电荷耦合器件电磁辐射感测元件选择性地响应具有至少第一波长的不可见电磁辐射，并且该阵列的一个或多个第二电荷耦合器件电磁辐射感测元件是 选择性地响应于具有不同于至少第一波长的至少第二波长的不可见电磁辐射。

    Apparatus to produce spectrums
    123.
    发明授权
    Apparatus to produce spectrums 失效
    产生光谱的装置

    公开(公告)号：US07609963B2

    公开(公告)日：2009-10-27

    申请号：US11416232

    申请日：2006-05-03

    Applicant: Roger Wayne Brown

    Inventor： Roger Wayne Brown

    IPC: G03B11/00

    CPC classification number: G01J3/00 ,  G01J3/2803

    Abstract: A method of placing a grating material at an optimum distance from a sensor that will produce a reference spectrum on that sensor. In a preferred embodiment of the present invention, a device with a diffraction grating end will protrude into the empty lens well of a camera and with the camera inserted into a telescope eyepiece holder will focus both a image of an object, that the telescope is pointed to, and its spectrum onto the light sensor in the camera. This dual image, called a reference spectrum, allows the separation between the image of the object and a point in the image of its spectrum to be determined quickly. This separation distance to the spectral point within the spectrum is then a referenced distance. Once a reference distance is known it is then used to determine the wavelength of any other point or spectral line within the spectrum.

    Abstract translation: 将光栅材料放置在距传感器最佳距离处的方法，该传感器将在该传感器上产生参考光谱。 在本发明的优选实施例中，具有衍射光栅端的装置将突出到相机的空透镜孔中，并且插入望远镜目镜支架中的相机将聚焦物体的图像，望远镜指向 以及其光谱到相机中的光传感器上。 称为参考光谱的双重图像允许物体的图像与其光谱的图像中的点之间的分离被快速确定。 然后，到频谱内的光谱点的分离距离就是参考距离。 一旦参考距离已知，则用于确定频谱内任何其他点或谱线的波长。

    Apparatus to produce spectrums
    124.
    发明申请
    Apparatus to produce spectrums 失效
    产生光谱的装置

    公开(公告)号：US20070013905A1

    公开(公告)日：2007-01-18

    申请号：US11416232

    申请日：2006-05-03

    Applicant: Roger Brown

    Inventor： Roger Brown

    IPC: G01J1/10

    CPC classification number: G01J3/00 ,  G01J3/2803

    Abstract: A method of placing a grating material at an optimum distance from a sensor that will produce a reference spectrum on that sensor. In a preferred embodiment of the present invention, a device with a diffraction grating end will protrude into the empty lens well of a camera and with the camera inserted into a telescope eyepiece holder will focus both a image of an object, that the telescope is pointed to, and its spectrum onto the light sensor in the camera. This dual image, called a reference spectrum, allows the separation between the image of the object and a point in the image of its spectrum to be determined quickly. This separation distance to the spectral point within the spectrum is then a referenced distance. Once a reference distance is known it is then used to determine the wavelength of any other point or spectral line within the spectrum.

    Abstract translation: 将光栅材料放置在距传感器最佳距离处的方法，该传感器将在该传感器上产生参考光谱。 在本发明的优选实施例中，具有衍射光栅端的装置将突出到相机的空透镜孔中，并且插入望远镜目镜支架中的相机将聚焦物体的图像，望远镜指向 以及其光谱到相机中的光传感器上。 称为参考光谱的双重图像允许物体的图像与其光谱的图像中的点之间的分离被快速确定。 然后，到频谱内的光谱点的分离距离就是参考距离。 一旦参考距离已知，则用于确定频谱内任何其他点或谱线的波长。

    System and method of broad band optical end point detection for film change indication
    125.
    发明授权
    System and method of broad band optical end point detection for film change indication 有权
    用于胶片变化指示的宽带光端点检测系统和方法

    公开(公告)号：US07099013B2

    公开(公告)日：2006-08-29

    申请号：US10721136

    申请日：2003-11-24

    Applicant: Vladimir Katz ,  Bella Mitchell

    Inventor： Vladimir Katz ,  Bella Mitchell

    IPC: G01N21/55 ,  G01N21/00

    CPC classification number: B24B49/12 ,  B24B37/013 ,  G01B11/0625 ,  G01B11/0683 ,  G01J3/00

    Abstract: A system and method for detecting an endpoint is disclosed that includes illuminating a first portion of a surface of a wafer with a first broad beam of light. A first reflected spectrum data is received. The first reflected spectrum of data corresponds to a first spectra of light reflected from the first illuminated portion of the surface of the wafer. A second portion of the surface of the wafer with a second broad beam of light. A second reflected spectrum data is received. The second reflected spectrum of data corresponds to a second spectra of light reflected from the second illuminated portion of the surface of the wafer. The first reflected spectrum data is normalized and the second reflected spectrum data is normalized. An endpoint is determined based on a difference between the normalized first spectrum data and the normalized second spectrum data.

    Abstract translation: 公开了一种用于检测端点的系统和方法，其包括用第一宽光束照射晶片表面的第一部分。 接收到第一反射光谱数据。 数据的第一反射光谱对应于从晶片表面的第一照射部分反射的光的第一光谱。 具有第二宽光束的晶片表面的第二部分。 接收第二反射光谱数据。 数据的第二反射光谱对应于从晶片的表面的第二照射部分反射的光的第二光谱。 将第一反射光谱数据归一化，并将第二反射光谱数据归一化。 基于归一化的第一光谱数据和归一化的第二光谱数据之间的差来确定端点。

    REFERENCING SYSTEM
    130.
    发明公开
    REFERENCING SYSTEM 审中-公开

    公开(公告)号：US20230360269A1

    公开(公告)日：2023-11-09

    申请号：US18077290

    申请日：2022-12-08

    Applicant: Purdue Research Foundation

    Inventor： Jian Jin

    IPC: G06T7/80 ,  G01J3/00 ,  G01N21/27 ,  G01J3/02

    CPC classification number: G06T7/85 ,  G01J3/00 ,  G01N21/274 ,  G01J3/0297 ,  G06T2207/10028 ,  G06T2207/10024 ,  H04N17/00

    Abstract: A reference imaging system including a planar reference piece. The reference imaging system further includes a three-axis gantry for positioning the planar reference piece at a plurality of points in a 3D coordinate system. Additionally, the reference imaging system includes a yaw actuator for adjusting the yaw angle of the object. Furthermore, the reference imaging system includes a pitch actuator for adjusting the pitch of the object. Moreover, the reference imaging system includes a computer processing unit for controlling the 3D position, pitch and yaw of the planar reference piece.

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