公开(公告)号：US20130278577A1

公开(公告)日：2013-10-24

申请号：US13600970

申请日：2012-08-31

Applicant: Beong-Hun BEON ,  Kwang-Hyun KIM ,  Dae Won KIM ,  Ji-Hoon KIM ,  Seung Beom PARK ,  Na Young SHIN

Inventor： Beong-Hun BEON ,  Kwang-Hyun KIM ,  Dae Won KIM ,  Ji-Hoon KIM ,  Seung Beom PARK ,  Na Young SHIN

IPC: G09G5/00 ,  G01J1/08 ,  G01J5/00 ,  G02F1/13357

CPC classification number: G01J3/501 ,  G02F1/13318 ,  G02F1/133362 ,  G02F2001/133622 ,  G03G15/758 ,  G06F3/0412 ,  G06F3/042 ,  G09G3/3413

Abstract: The sensing device is provided. A sensing device according to an exemplary embodiment of the present invention includes a lower panel, an upper panel facing the lower panel, a liquid crystal layer positioned between the lower panel and the upper panel, an infrared ray sensor formed in at least one of the lower panel and the upper panel, a visible light sensor formed in at least one of the lower panel and the upper panel, and a backlight device positioned at an outer surface of the lower panel, wherein the backlight device includes a plurality of light emitting members representing different colors and an infrared ray light emitting member.

Abstract translation: 提供感测装置。 根据本发明的示例性实施例的感测装置包括下面板，面向下面板的上面板，位于下面板和上面板之间的液晶层，红外线传感器，形成在至少一个 下面板和上面板，形成在下面板和上面板中的至少一个中的可见光传感器和位于下面板的外表面的背光装置，其中背光装置包括多个发光构件 代表不同的颜色和红外线发光部件。

公开(公告)号：US20100230611A1

公开(公告)日：2010-09-16

申请号：US12308619

申请日：2007-06-06

Applicant: Hiroya Fukuyama

Inventor： Hiroya Fukuyama

IPC: G01J1/58 ,  F21V3/04 ,  G01J1/08

CPC classification number: H01J63/06 ,  B82Y15/00 ,  B82Y20/00 ,  G02B1/007

Abstract: There is provided a lighting system having a high spatial resolution appropriate to a high-frequency component by evanescent waves in a negative refraction lens. The lighting system includes a light emitter thin film (106) which includes a light emitting material which emits light when an energy is applied, a cathode (101) for applying an electron beam (102) which is the energy, to the light emitter thin film (106), and a negative refraction lens (110) which is formed of a material exhibiting negative refraction, and has an optical system for projecting light emitted from the light emitter thin film (106), on an object.

Abstract translation: 提供了一种具有适合于在负折射透镜中的ev逝波的高频分量的高空间分辨率的照明系统。 照明系统包括发光体薄膜（106），其包括在施加能量时发光的发光材料，用于将作为能量的电子束（102）施加到发光体薄膜的阴极（101） 薄膜（106）和由折射材料形成的负折射透镜（110），并且具有用于将从发光体薄膜（106）发射的光投射到物体上的光学系统。

公开(公告)号：US20050218304A1

公开(公告)日：2005-10-06

申请号：US11098402

申请日：2005-04-05

Applicant: Daisuke Utsunomiya

Inventor： Daisuke Utsunomiya

IPC: G01J1/00 ,  G01J1/02 ,  G01J1/04 ,  G01J1/08 ,  G01M11/00 ,  G06K7/10 ,  H01J40/14 ,  H01L27/14 ,  H01L31/12

CPC classification number: G01J1/08 ,  G01J1/04 ,  G01J1/0403

Abstract: A measuring device measures sensitivity distribution of a photo sensor including a light projector element for projecting detection light externally, and a photoreceptor element for receiving the detection light reflected externally, and photoelectrically detects an article. The measuring device includes a test panel, having a test pattern, formed on a surface thereof and in at least two colors, for being read by the photo sensor photoelectrically for inspection. A moving mechanism moves the test panel relative to the photo sensor and at a regular speed. A controller actuates the moving mechanism, and evaluates an output from the photoreceptor element, in order to determine the sensitivity distribution of the photo sensor according thereto. Sensitivity distribution of the photo sensor is initially expressed two-dimensionally. Also, a plurality of the sensitivity distribution being obtained are used to determine sensitivity distribution of the photo sensor expressed three-dimensionally.

Abstract translation: 测量装置测量包括用于在外部投射检测光的光投射器元件的光传感器的灵敏度分布，以及用于接收从外部反射的检测光并且光电检测物品的感光体元件。 测量装置包括具有测试图案的测试面板，其测试图案形成在其表面上且具有至少两种颜色，用于光电检测用于光电传感器的读取。 移动机构使测试面板相对于光传感器以规则的速度移动。 控制器致动移动机构，并且评估感光体元件的输出，以便确定根据它们的光传感器的灵敏度分布。 光传感器的灵敏度分布最初是二维表示的。 此外，获得的多个灵敏度分布被用于确定三维表示的光传感器的灵敏度分布。

公开(公告)号：US20050127303A1

公开(公告)日：2005-06-16

申请号：US10851308

申请日：2004-05-21

Applicant: Alex Waluszko

Inventor： Alex Waluszko

IPC: G01J1/08 ,  G01J1/58 ,  G01N21/64 ,  G01N27/447 ,  G01T1/18

CPC classification number: G01N21/6428 ,  G01J1/08 ,  G01J1/58 ,  G01N21/6447 ,  G01N21/6456 ,  G01N27/44721 ,  G01N2201/0634

Abstract: A method and apparatus for genomic or proteomic research to visualize fluorescent labeled DNA, RNA or protein samples that have been separated for documentation and analysis. The apparatus includes a novel radiation source for uniformly irradiating the samples which comprises a grid constructed from a continuous, serpentine shaped ultraviolet light producing tube that is strategically formed to provide a multiplicity of side-by-side, immediately adjacent irradiating segments. In one form of the invention the apparatus also includes a first conversion plate that is carried by the housing at a location intermediate the radiation source and the sample supporting platform for converting the radiation emitted from the source to radiation at a second wavelength.

公开(公告)号：US5852494A

公开(公告)日：1998-12-22

申请号：US819107

申请日：1997-03-17

Applicant: Victor N. Skladnev ,  Richard L. Thompson ,  Irwin Wunderman

Inventor： Victor N. Skladnev ,  Richard L. Thompson ,  Irwin Wunderman

IPC: A61B5/00 ,  G01J1/04 ,  G01J1/08 ,  G01N21/47 ,  G01J1/02

CPC classification number: G01N21/4785 ,  A61B5/1495 ,  A61B2560/0233 ,  G01J1/08

Abstract: An apparatus which permits an analytical probe to be calibrated by pressing the tip against a block of material of controlled characteristics. A transparent elastomer is used into which has been incorporated a light-scattering material. Elastomer calibrators may also be made part of a preassembled probe component such as a disposable sheath. In that case the turbid elastomer is assembled on the tip with the other components of the sheath and is removed after calibrating the system and before the probe put into use. An additional film of flexible polymer having optical characteristics analogous to the material to be detected by the probe may be placed on top to simulate the structure of the material that is to be measured.

Abstract translation: 允许通过将尖端压靠受控特征材料块来校准分析探针的装置。 使用透明弹性体，其中掺入光散射材料。 弹性体校准器也可以制成预组装的探针组件的一部分，例如一次性护套。 在这种情况下，浑浊的弹性体与护套的其他部件组装在尖端上，并且在校准系统之后并且在探头投入使用之前被去除。 具有类似于由探针检测的材料的光学特性的柔性聚合物的另外的膜可以放置在顶部以模拟要被测量的材料的结构。

公开(公告)号：US5827438A

公开(公告)日：1998-10-27

申请号：US754128

申请日：1996-11-22

Applicant: Martti Blomberg ,  Altti Torkkeli ,  Stefan Lindblad ,  Ari Lehto

Inventor： Martti Blomberg ,  Altti Torkkeli ,  Stefan Lindblad ,  Ari Lehto

IPC: G01N21/01 ,  G01J1/08 ,  G01J3/10 ,  G01N21/35 ,  H01K1/00 ,  H01K7/00 ,  H05B3/12 ,  H05B3/16 ,  H05B3/00

CPC classification number: H01K7/00 ,  G01J3/108 ,  H01K1/00 ,  H05B3/12 ,  H05B3/16

Abstract: The invention is related to an electrically modulatable thermal radiant source with a multilayer structure. The radiant source includes a substrate, a first insulating layer formed onto the substrate, a radiant surface layer formed onto the first insulating layer, a second insulating layer formed on the radiant surface layer, a first metallization (incandescent filament) layer formed on the second insulating layer, a third insulating layer formed on the first metallization layer, and a second metallization layer for contacting formed on the third insulating layer. According to the invention, very thin incandescent filaments are formed from the first metallization layer and surrounded by the other elements of the multilayer structure as a uniform, planar plate.

Abstract translation: 本发明涉及具有多层结构的可电调制热辐射源。 辐射源包括基板，形成在基板上的第一绝缘层，形成在第一绝缘层上的辐射表面层，形成在辐射表面层上的第二绝缘层，形成在第二绝缘层上的第一金属化（白炽灯丝）层 绝缘层，形成在第一金属化层上的第三绝缘层和形成在第三绝缘层上的第二接触金属化层。 根据本发明，从第一金属化层形成非常薄的白炽灯丝，并被多层结构的其它元件围绕成均匀的平板。

公开(公告)号：US5532813A

公开(公告)日：1996-07-02

申请号：US171277

申请日：1993-12-21

Applicant: Masahiro Ohishi ,  Fumio Ohtomo ,  Kazuaki Kimura ,  Masaaki Yabe ,  Yasutaka Katayama ,  Kazushige Koshikawa ,  Takeshige Saito

Inventor： Masahiro Ohishi ,  Fumio Ohtomo ,  Kazuaki Kimura ,  Masaaki Yabe ,  Yasutaka Katayama ,  Kazushige Koshikawa ,  Takeshige Saito

IPC: G01J1/08 ,  G01C3/06 ,  G01S7/486 ,  G01S17/10 ,  G01C3/08 ,  H01L31/14 ,  H01S3/10

CPC classification number: G01S7/486 ,  G01S17/10 ,  G01S7/4815 ,  G01S7/4818

Abstract: In a light-wave distance meter, a light source device emits reference modulated light beams from multiple spatially-separated light emitting areas, an optical means radiates a light beam derived from the multiple modulated light beams to the target of measurement, a light beam reception means receives the reflected return light beam from the target and converts it into an electrical pulse signal, and a distance measuring means calculates the distance to the target based on the time difference between the light beam emission and the return light beam reception. The low coherence and high intensity light beam produced by the light source device enables the extension of the maximum measurable distance.

Abstract translation: 在光波测距仪中，光源装置从多个空间分离的发光区域发射参考调制光束，光学装置将从多个调制光束导出的光束照射到测量对象，光束接收 装置接收来自目标的反射的返回光束并将其转换为电脉冲信号，并且距离测量装置基于光束发射和返回光束接收之间的时间差来计算到目标的距离。 由光源装置产生的低相干度和高强度光束能够延长最大可测距离。

公开(公告)号：US5229838A

公开(公告)日：1993-07-20

申请号：US823631

申请日：1992-01-21

Applicant: Alan M. Ganz ,  David H. Tracy

Inventor： Alan M. Ganz ,  David H. Tracy

IPC: G01J1/00 ,  G01J1/08 ,  G01J3/02 ,  G01M11/00 ,  G01N21/27

CPC classification number: G01J1/08 ,  G01N21/274

Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.

公开(公告)号：US5072112A

公开(公告)日：1991-12-10

申请号：US541731

申请日：1990-06-21

Applicant: Yoshihiro Ohno

Inventor： Yoshihiro Ohno

IPC: G01J1/08

CPC classification number: G01J1/08

Abstract: In a method for realizing a photometric standard of optical radiation based on an absolute responsivity for a photometric quantity, there are measured using a beam of light projected from a white light source through an optical filter for the spectral luminous efficacy correction onto a silicon photodiode, a surface reflectance of the silicon photodiode, a recombination loss in a rear region beyond a depletion layer thereof, and a recombination loss in the vicinity of a boundary region between an insulating layer and a silicon layer thereof, which are independent of the wavelength .lambda. of light. Thereafter, there is calculated an absolute responsivity [A/1m] for a photometric quantity [1m] of a photodetector composed of the silicon photodiode and the optical filter, from the measured surface reflectance of the silicon photodiode and the measured recombination losses thereof.

Abstract translation: 在基于对光度的绝对响应度实现光辐射的光度标准的方法中，使用从白光源投射的光束通过光学滤波器测量用于光电二极管上的光谱发光效率校正的方法， 硅光电二极管的表面反射率，超过其耗尽层的后部区域中的复合损耗以及绝缘层和硅层之间的边界区域附近的复合损耗，其与波长λ的波长λ 光。 此后，根据所测量的硅光电二极管的表面反射率及其测量的复合损耗，计算由硅光电二极管和滤光器组成的光电探测器的光度[1m]的绝对响应度[A / 1m]。

公开(公告)号：US4636072A

公开(公告)日：1987-01-13

申请号：US529376

申请日：1983-09-06

Applicant: Theodor G. Yahraus

Inventor： Theodor G. Yahraus

IPC: G01J1/08 ,  G01J1/02

CPC classification number: G01J1/08 ,  G01J2001/4247

Abstract: An improved method and apparatus for use in photometric testing of high intensity discharge lamps and luminaires is disclosed. The improved apparatus includes the creation of a mock high intensity discharge lamp having an incandescent emitting element replacing the arc plasma of the subject high intensity discharge lamp while carefully duplicating all other structural and electrical details of the lamp. The improved method incorporates the use of the mock high intensity discharge lamp to obtain accurate testing of the photometric qualities of the regular high intensity discharge lamp.

Abstract translation: 公开了用于高强度放电灯和灯具的光度测试的改进的方法和装置。 改进的装置包括创建具有白炽发射元件的模拟高强度放电灯，其替代了对象高强度放电灯的电弧等离子体，同时仔细地复制灯的所有其它结构和电气细节。 改进的方法包括使用模拟高强度放电灯来获得正常高强度放电灯的光度特性的准确测试。