公开(公告)号：US20140270080A1

公开(公告)日：2014-09-18

申请号：US13841527

申请日：2013-03-15

Applicant: LAWRENCE LIVERMORE NATIONAL SECURITY, LLC

Inventor： Bassem S. EL-DASHER ,  Joseph C. FARMER ,  Samuel TORRES ,  Sharon G. TORRES

IPC: G01N23/201

CPC classification number: G01N23/201 ,  G01N2223/635

Abstract: An electrochemical test cell apparatus is disclosed for enabling in-situ X-ray transmission of a flowing fluid using a small angle X-ray scattering technique. A base has a recessed portion that partially defines a volume for containing a test sample. The base may have a fluid supply passage for providing a flowing fluid into the volume, a fluid return passage for allowing the flowing fluid to exit the volume and flow out of the test cell, and a first hole for allowing an X-ray beam to pass through the volume. A clamp member is coupled to the base to help define the volume and may have a second hole aligned with the first hole that allows the X-ray beam to pass through the clamp member. A pair of material portions may be clamped between the base and the clamp member to retain the fluid within the volume while allowing passage of the X-ray beam through first and second holes. A pair of electrodes may be used to supply a potential difference to the flowing fluid.

Abstract translation: 公开了一种使用小角度X射线散射技术实现流动流体的原位X射线透射的电化学测试电池装置。 底座具有部分限定用于容纳测试样品的体积的凹部。 基座可以具有用于将流动流体提供到体积中的流体供应通道，用于允许流动流体离开体积并流出测试单元的流体返回通道，以及用于允许X射线束 通过卷。 夹紧构件联接到基座以帮助限定体积，并且可以具有与允许X射线束穿过夹紧构件的第一孔对齐的第二孔。 一对材料部分可被夹持在基座和夹紧构件之间，以将流体保持在体积内，同时允许X射线束通过第一孔和第二孔。 可以使用一对电极来向流动的流体提供电位差。

公开(公告)号：US20140205068A1

公开(公告)日：2014-07-24

申请号：US14237915

申请日：2012-09-11

Applicant: Ryo Mashita ,  Hiroyuki Kishimoto

Inventor： Ryo Mashita ,  Hiroyuki Kishimoto

IPC: G01N23/201 ,  G01N23/202

CPC classification number: G01N23/201 ,  G01N23/202 ,  G01N2223/1016 ,  G01N2223/106 ,  G01N2223/623 ,  G01N2223/627

Abstract: The present invention provides a method for evaluating the rebound resilience, hardness, or energy loss of polymer materials, capable of sufficiently evaluating the difference in performance between samples with excellent measurement accuracy. The present invention relates to a method for evaluating the rebound resilience, hardness, or energy loss of a polymer material, including irradiating the polymer material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement.

Abstract translation: 本发明提供一种用于评价聚合物材料的回弹性，硬度或能量损失的方法，其能够以良好的测量精度充分评估样品之间的性能差异。 本发明涉及一种用于评价聚合物材料的回弹性，硬度或能量损失的方法，包括用X射线或中子照射聚合物材料以进行X射线散射测量或中子散射测量。

公开(公告)号：US08744046B2

公开(公告)日：2014-06-03

申请号：US13203095

申请日：2009-03-19

Applicant: Kazuto Yamauchi ,  Hidekazu Mimura ,  Hiromi Okada

Inventor： Kazuto Yamauchi ,  Hidekazu Mimura ,  Hiromi Okada

IPC: G01N23/20

CPC classification number: G01N23/201 ,  G21K2201/06 ,  G21K2207/00

Abstract: Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.

Abstract translation: 提供了一种精确测量x射线nanobeam的强度分布的方法和装置，其可以用一个刀刃测量具有不同波长的x射线，并且可以执行对应于x射线束的焦深的最佳测量 以及使用暗场测量方法的其他测量装置的条件，其能够使用刀刃精确测量X射线束的轮廓并使用衍射和透射的x射线。 刀刃（4）由重金属形成，其使穿过其的X射线的相位前进，并且以这样的方式制造，使得厚度可以在纵向方向上连续地或以逐步的方式改变。 刀刃（4）被设定为使得X射线束可以在这样的厚度位置处横穿刀刃（4），以在其中透射的x射线和衍射的X射线衍射的范围内实现相移 在刀刃的端部可以彼此加强，并且通过x射线检测器测量衍射X射线和透射的X射线的叠加X射线。

公开(公告)号：US20130329861A1

公开(公告)日：2013-12-12

申请号：US13912364

申请日：2013-06-07

Applicant: Rigaku Innovative Technologies, Inc.

Inventor： Licai Jiang ,  Boris Verman

IPC: G21K1/06

CPC classification number: G21K1/067 ,  G01N23/201 ,  G21K2201/064

Abstract: A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode.

Abstract translation: 提供了一种用于分析样品的系统。 该系统包括能够提供一维光束和二维光束的光学系统。 所述系统可以包括波束选择装置，用于在以一维操作模式向所述样本提供一维X射线束和以二维操作模式向所述样本提供二维X射线束之间进行选择。

公开(公告)号：US08552370B2

公开(公告)日：2013-10-08

申请号：US11977409

申请日：2007-10-24

Applicant: Larry Joe Schultz ,  Alexei Vasilievich Klimenko ,  Andrew Mcleod Fraser ,  Christopher Morris ,  John Christopher Orum ,  Konstantin N. Borozdin ,  Michael James Sossong ,  Nicolas W. Hengartner

Inventor： Larry Joe Schultz ,  Alexei Vasilievich Klimenko ,  Andrew Mcleod Fraser ,  Christopher Morris ,  John Christopher Orum ,  Konstantin N. Borozdin ,  Michael James Sossong ,  Nicolas W. Hengartner

IPC: G01N23/201

CPC classification number: G01N23/201 ,  G01N23/20 ,  G01V5/0025 ,  G01V5/0075 ,  G06F17/18

Abstract: Systems and methods for charged particle detection including statistical reconstruction of object volume scattering density profiles from charged particle tomographic data to determine the probability distribution of charged particle scattering using a statistical multiple scattering model and determine a substantially maximum likelihood estimate of object volume scattering density using expectation maximization (ML/EM) algorithm to reconstruct the object volume scattering density. The presence of and/or type of object occupying the volume of interest can be identified from the reconstructed volume scattering density profile. The charged particle tomographic data can be cosmic ray muon tomographic data from a muon tracker for scanning packages, containers, vehicles or cargo. The method can be implemented using a computer program which is executable on a computer.

Abstract translation: 用于带电粒子检测的系统和方法，包括从带电粒子层析成像数据的物体体积散射密度分布的统计重建，以使用统计多重散射模型确定带电粒子散射的概率分布，并使用期望确定物体体积散射密度的基本最大似然估计 最大化（ML / EM）算法重建物体体积散射密度。 可以从重建的体积散射密度分布中识别占据感兴趣体积的物体的存在和/或类型。 带电粒子断层数据可以是用于扫描包装，集装箱，车辆或货物的muon跟踪器的宇宙射线μon断层摄影数据。 该方法可以使用可在计算机上执行的计算机程序来实现。

公开(公告)号：US08513601B2

公开(公告)日：2013-08-20

申请号：US13591118

申请日：2012-08-21

Applicant: Christopher L. Morris ,  Mark F. Makela

Inventor： Christopher L. Morris ,  Mark F. Makela

IPC: G01N23/00

CPC classification number: G01N23/201 ,  G01N23/20 ,  G01V5/0025 ,  G01V5/0075 ,  G06F17/18

Abstract: Techniques, apparatus and systems for detecting particles such as muons. In one implementation, a monitoring system has a cosmic ray-produced charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoing charged particles, such as cosmic ray-produced muons, while also detecting gamma rays. The system can selectively detect devices or materials, such as iron, lead, gold and/or tungsten, occupying the volume from multiple scattering of the charged particles passing through the volume and can also detect any radioactive sources occupying the volume from gamma rays emitted therefrom. If necessary, the drift tubes can be sealed to eliminate the need for a gas handling system. The system can be employed to inspect occupied vehicles at border crossings for nuclear threat objects.

Abstract translation: 用于检测诸如μ子之类的颗粒的技术，装置和系统。 在一个实现中，监视系统具有带有多个漂移单元的宇宙射线产生的带电粒子跟踪器。 可以将漂移电池（例如铝漂移管）布置在待扫描的体积的至少上方和下方，从而跟踪进入和离开的带电粒子，例如宇宙射线产生的μ子，同时还检测γ射线。 该系统可以选择性地检测诸如铁，铅，金和/或钨的装置或材料，其占据通过该体积的带电粒子的多次散射的体积，并且还可以检测占据由其发射的γ射线的体积的任何放射源 。 如有必要，漂移管可以被密封，以消除对气体处理系统的需要。 该系统可用于检查过境点的被占用车辆的核威胁物体。

公开(公告)号：US20130101091A1

公开(公告)日：2013-04-25

申请号：US13587410

申请日：2012-08-16

Applicant: Hugh F. Garvey ,  Michael A. Damento

Inventor： Hugh F. Garvey ,  Michael A. Damento

IPC: G01N23/201

CPC classification number: G01N23/201

Abstract: A detector system for capturing and resolving WAXS and SAXS beams is provided along with a device for determining structural information of a material incorporating said detector system and a method for examining the structure of a material using said detector system. The detector system generally comprises a sample capable of interacting with the incident x-ray beam, a primary detector and a secondary detector. Upon interaction with a sample of the material, the incident x-ray beam is scattered into wide angle x-ray scattering (WAXS) beams and small angle x-ray scattering (SAXS) beams that are captured by the primary or secondary detectors.

Abstract translation: 提供了用于捕获和分辨WAXS和SAXS光束的检测器系统以及用于确定包含所述检测器系统的材料的结构信息的装置以及使用所述检测器系统检查材料的结构的方法。 检测器系统通常包括能够与入射的X射线束相互作用的样本，初级检测器和次级检测器。 在与材料样品相互作用时，入射的X射线束被散射到由主要或次要检测器捕获的广角X射线散射（WAXS）光束和小角度X射线散射（SAXS）光束中。

公开(公告)号：US20120275568A1

公开(公告)日：2012-11-01

申请号：US13419497

申请日：2012-03-14

Applicant: Isaac Mazor ,  Matthew Wormington ,  Ayelet Dag ,  Bagrat Khachatryan

Inventor： Isaac Mazor ,  Matthew Wormington ,  Ayelet Dag ,  Bagrat Khachatryan

IPC: G01N23/201

CPC classification number: G01N23/201 ,  G01N21/211 ,  G01N21/274 ,  G01N21/33 ,  G01N21/8422 ,  G01N21/94 ,  G01N21/9501 ,  G01N2021/8438 ,  G01N2223/1006 ,  G01N2223/61

Abstract: Apparatus for inspection of a sample includes an X-ray source, which is configured to irradiate a location on the sample with a beam of X-rays. An X-ray detector is configured to receive the X-rays that are scattered from the sample and to output a first signal indicative of the received X-rays. A VUV source is configured to irradiate the location on the sample with a beam of VUV radiation. A VUV detector is configured to receive the VUV radiation that is reflected from the sample and to output a second signal indicative of the received VUV radiation. A processor is configured to process the first and second signals in order to measure a property of the sample.

Abstract translation: 用于检查样品的装置包括X射线源，其被配置为用X射线照射样品上的位置。 X射线检测器被配置为接收从样本散射的X射线并输出指示所接收的X射线的第一信号。 VUV源配置为用VUV辐射束照射样品上的位置。 VUV检测器被配置为接收从样本反射的VUV辐射并输出指示所接收的VUV辐射的第二信号。 处理器被配置为处理第一和第二信号以便测量样品的性质。

公开(公告)号：US20120183125A1

公开(公告)日：2012-07-19

申请号：US13275909

申请日：2011-10-18

Applicant: Robert J. Ledoux ,  William Bertozzi

Inventor： Robert J. Ledoux ,  William Bertozzi

IPC: G01N23/201

CPC classification number: G01N23/20 ,  G01N23/04 ,  G01N23/20083 ,  G01N23/201

Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from (lie target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

Abstract translation: 本文公开了使用从（散射目标）散射的光子的能量谱来扫描目标潜在威胁的方法和系统，以确定目标中的平均原子数和/或质量的空间分布。示例性方法包括： 使用光子束的目标的多个体素;确定每个体素上的入射通量;测量从体素散射的光子的能谱;使用能谱确定体素中的平均原子数;以及确定体素在 使用入射磁通的体素，体素中的材料的平均原子数，能谱和对应于体素的散射核。示例性系统可以使用威胁检测启发式来确定是否基于平均值触发进一步的动作 体素的原子序数和/或质量。

公开(公告)号：US20110305317A1

公开(公告)日：2011-12-15

申请号：US13203095

申请日：2009-03-19

Applicant: Kazuto Yamauchi ,  Hidekazu Mimura ,  Hiromi Okada

Inventor： Kazuto Yamauchi ,  Hidekazu Mimura ,  Hiromi Okada

IPC: G01N23/207

CPC classification number: G01N23/201 ,  G21K2201/06 ,  G21K2207/00

Abstract: Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.

Abstract translation: 提供了一种精确测量x射线nanobeam的强度分布的方法和装置，其可以用一个刀刃测量具有不同波长的x射线，并且可以执行对应于x射线束的焦深的最佳测量 以及使用暗场测量方法的其他测量装置的条件，其能够使用刀刃精确测量X射线束的轮廓并使用衍射和透射的x射线。 刀刃（4）由重金属形成，其使穿过其的X射线的相位前进，并且以这样的方式制造，使得厚度可以在纵向方向上连续地或以逐步的方式改变。 刀刃（4）被设定为使得X射线束可以在这样的厚度位置处横穿刀刃（4），以在其中透射的x射线和衍射的X射线衍射的范围内实现相移 在刀刃的端部可以彼此加强，并且通过x射线检测器测量衍射X射线和透射的X射线的叠加X射线。