公开(公告)号：US09488577B2

公开(公告)日：2016-11-08

申请号：US14589340

申请日：2015-01-05

Applicant: Commissariat à l'énergie atomique et aux énergies alternatives

Inventor： Luc Andre

IPC: G01N21/61 ,  G01N21/3504 ,  G01N21/03

CPC classification number: G01N21/61 ,  G01N21/031 ,  G01N21/3504 ,  G01N2201/0636 ,  G01N2201/0638

Abstract: A gas sensor (20) comprising a substrate (231); an objective (211) situated on the substrate (231), adapted to collect a light beam (212, 213) emitted by a light source (210); an eyepiece (250) situated on the substrate (231), adapted to collect an incident light beam to focus it on a detector (251); return reflective surfaces (281, 282), situated facing said substrate; and at least one field lens (221), arranged on an intermediate reflective surface (222) formed on the substrate (231), and adapted to deviate the rays (213) of the light beam emitted by the light source, to bring them closer to the optical axis of the eyepiece (250).

Abstract translation: 一种气体传感器（20），包括基底（231）; 位于所述基板（231）上的物镜（211），适于收集由光源（210）发射的光束（212,213）; 位于所述基板（231）上的目镜（250），适于收集入射光束以将其聚焦在检测器（251）上; 返回反射表面（281,282），位于面对所述衬底的位置; 以及布置在形成在所述基板（231）上的中间反射表面（222）上并且适于偏离由所述光源发射的光束的光线（213）的至少一个场透镜（221），以使它们更接近 到目镜（250）的光轴。

公开(公告)号：US20160252447A1

公开(公告)日：2016-09-01

申请号：US15032463

申请日：2014-10-27

Applicant: Kenneth T. KOTZ ,  Ramin HAGHGOOIE ,  Anne C. PETROFSKY ,  Robert GRANIER ,  Ronald G. TOMPKINS

Inventor： Kenneth T. Kotz ,  Ramin Haghgooie ,  Anne C. Petrosfky ,  Robert Granier ,  Ronald G. Tompkins

IPC: G01N15/14 ,  G01N21/64

CPC classification number: G01N15/1436 ,  G01N15/1404 ,  G01N15/1459 ,  G01N15/1484 ,  G01N21/6428 ,  G01N2015/0073 ,  G01N2015/008 ,  G01N2015/0084 ,  G01N2015/1006 ,  G01N2015/1486 ,  G01N2021/6439 ,  G01N2201/0638

Abstract: The present invention provides a microfluidic system, device, and kit for particle analysis. In one example, the device includes a fluid channel for spacing the particles, an excitation waveguide to guide an excitation beam from a source to the fluid channel, and an excitation lens to focus the excitation beam to a width less than the spacing of the particles in the fluid channel. The device also includes a detection lens to guide light transmitted from the channel along a number of paths, axial and scatter light waveguide to receive light guided by the detection lens, a detector to receive transmitted light from the waveguides and generate a detection signal, and a processor configured to receive the detection signal and determine characteristic features of each of the particles based on the detection signal.

Abstract translation: 本发明提供一种用于粒子分析的微流体系统，装置和试剂盒。 在一个示例中，该装置包括用于间隔颗粒的流体通道，用于将激发束从源引导到流体通道的激励波导，以及激发透镜，以将激发光束聚焦到小于颗粒间隔的宽度 在流体通道中。 该装置还包括检测透镜，用于引导从多个通道的光路传输的光，轴向和散射光波导以接收由检测透镜引导的光;检测器，用于接收来自波导的透射光并产生检测信号;以及 处理器，其被配置为基于所述检测信号接收所述检测信号并确定每个所述粒子的特征特征。

公开(公告)号：US20160241811A1

公开(公告)日：2016-08-18

申请号：US15002448

申请日：2016-01-21

Applicant: MediaTek Inc.

Inventor： Chih-Kai CHANG ,  Tsu-Ming LIU

IPC: H04N7/15 ,  G06K9/00 ,  G06T3/60 ,  G06F3/0488 ,  G06T7/00

CPC classification number: H04N5/2252 ,  G01N15/1434 ,  G01N21/53 ,  G01N21/55 ,  G01N2201/062 ,  G01N2201/0638 ,  G06F1/1626 ,  G06F1/1686 ,  G06F3/016 ,  G06F3/0414 ,  G06F3/0416 ,  G06F3/0484 ,  G06F3/0488 ,  G06F3/16 ,  G06F2203/04806 ,  G06F2203/04808 ,  G06K9/00255 ,  G06T3/60 ,  H04M1/0264 ,  H04N5/2253 ,  H04N5/2254 ,  H04N5/2257 ,  H04N7/144 ,  H04N7/15 ,  H04N2007/145

Abstract: A display method for video conferencing and an associated video conferencing system are provided. The video conferencing system includes a display, an image capturing unit, and a network interface unit. The method includes the steps of: utilizing the image capturing unit to capture images of a local user in a video conference; performing foreground segmentation on the captured images to obtain a foreground object; flipping the foreground object horizontally; identifying a human face from the flipped foreground object and correcting a facing angle of the human face; determining interaction data from the local user on the display; encoding the interaction data and the flipped foreground object into an interaction stream and a video stream, respectively; packing the interaction stream and the video stream into an output stream; and transmitting the output stream to a remote user of the video conference through the network interface unit.

Abstract translation: 提供了用于视频会议的显示方法和相关联的视频会议系统。 视频会议系统包括显示器，图像捕获单元和网络接口单元。 该方法包括以下步骤：利用图像捕获单元在视频会议中捕获本地用户的图像; 对所捕获的图像执行前景分割以获得前景对象; 水平翻转前景物体; 从翻转的前景物体识别人脸并校正人脸的面对角度; 在显示器上确定来自本地用户的交互数据; 将交互数据和翻转的前景对象分别编码为交互流和视频流; 将交互流和视频流打包成输出流; 并通过网络接口单元将输出流发送到视频会议的远程用户。

公开(公告)号：US09372160B2

公开(公告)日：2016-06-21

申请号：US14876192

申请日：2015-10-06

Applicant: GII ACQUISITION, LLC

Inventor： Michael G. Nygaard

IPC: G01B11/24 ,  G01N21/952

CPC classification number: G01N21/952 ,  B07C5/342 ,  F42B35/00 ,  G01B11/2425 ,  G01B11/2433 ,  G01N21/909 ,  G01N21/9515 ,  G01N2201/02 ,  G01N2201/0621 ,  G01N2201/0638 ,  G01N2201/103 ,  G01N2201/12

Abstract: A method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis are provided. The system includes a fixture assembly having a rotatable first fixturing component and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component has a device for holding the part in a generally horizontal orientation and permit rotation of the horizontally held part between first and second angular positions about the measurement axis. The system also includes an actuator assembly, an illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly to determine at least one geometric dimension or any visual defects at the ends of the part.

Abstract translation: 提供了一种用于在具有测量轴的单个检查站上光学地检查制造部件的端部的方法和系统。 该系统包括具有可旋转的第一夹紧部件和可旋转的第二夹紧部件的夹具组件，该可旋转的第二夹紧部件配合并可拆卸地连接到第一夹持部件，以将力矩从第一夹持部件传递到第二夹持部件。 第二固定部件具有用于将部件保持在大致水平取向并允许水平保持部分围绕测量轴线在第一和第二角度位置之间旋转的装置。 该系统还包括致动器组件，照明装置，透镜和检测器组件以及至少一个处理器，用于处理由透镜和检测器组件产生的电信号，以确定部件端部处的至少一个几何尺寸或任何视觉缺陷 。

公开(公告)号：US20160161749A1

公开(公告)日：2016-06-09

申请号：US14871943

申请日：2015-09-30

Applicant: KLA-Tencor Corporation

Inventor： Qibiao Chen

IPC: G02B27/09 ,  G01N21/47 ,  G02B13/14 ,  G01N21/95

CPC classification number: G02B27/0927 ,  G01N21/4738 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2021/8822 ,  G01N2201/0631 ,  G01N2201/0638 ,  G02B13/143 ,  G02B27/0961

Abstract: Systems configured to provide illumination for wafer inspection performed by a wafer inspection tool are provided. One system includes one or more pupil lenses configured to focus a first far field pattern having a shape different than a shape of light generated by a light source. The system also includes a field lens array positioned between the one or more pupil lenses and an aperture stop. In addition, the system includes a lens group configured to focus a second far field pattern generated by the field lens array to a back focal plane of the lens group. The back focal plane of the lens group is a field plane of a wafer inspection tool at which a wafer to be inspected is placed during wafer inspection.

Abstract translation: 提供被配置为提供由晶片检查工具执行的用于晶片检查的照明的系统。 一个系统包括配置成聚焦具有不同于由光源产生的光的形状的形状的第一远场图案的一个或多个光瞳透镜。 该系统还包括位于一个或多个光瞳透镜与孔径光阑之间的场透镜阵列。 此外，该系统包括被配置为将由场透镜阵列产生的第二远场图案聚焦到透镜组的后焦平面的透镜组。 透镜组的后焦平面是晶片检查工具的场平面，在晶片检查期间将待检查的晶片放置在晶圆检查工具中。

公开(公告)号：US09329134B2

公开(公告)日：2016-05-03

申请号：US14635411

申请日：2015-03-02

Applicant: Hidemasa Suzuki ,  Koji Masuda ,  Susumu Momma

Inventor： Hidemasa Suzuki ,  Koji Masuda ,  Susumu Momma

IPC: G01N21/892 ,  G01N21/89 ,  G01N21/55

CPC classification number: G01N21/892 ,  G01N21/55 ,  G01N21/8903 ,  G01N2201/0638

Abstract: A reflection type optical sensor that detect a surface condition of a moving body and that is used for an image generation apparatus which forms images on a recording media includes a light-emitting device which has a plurality of light emitter systems including at least two light-emitting members and a light-emitting optical system having a plurality of light-emitting lenses corresponding to a plurality of the light emitter systems and guiding light emitted from the light emitter systems to the moving body and a light-receiving device which has a light receiver system including at least two light-receiving members and a light-receiving optical system having light-receiving lenses corresponding to the at least two light-receiving members and guiding light reflected by the moving body to the light receiver system. The image generation apparatus has further a surface condition judging device in addition to the reflection type optical sensor.

公开(公告)号：US09285318B2

公开(公告)日：2016-03-15

申请号：US13619679

申请日：2012-09-14

Applicant: Steven J. Boege ,  Mark F. Oldham ,  Eugene F. Young

Inventor： Steven J. Boege ,  Mark F. Oldham ,  Eugene F. Young

IPC: G01N21/00 ,  G01N21/64 ,  F21K99/00 ,  G01J3/10 ,  G01J3/02 ,  F21V29/54 ,  F21V29/67 ,  F21V29/74 ,  G05D23/19 ,  G05D23/20 ,  F21Y101/02

CPC classification number: G01N21/64 ,  F21K9/00 ,  F21K9/64 ,  F21V29/54 ,  F21V29/677 ,  F21V29/74 ,  F21Y2115/10 ,  G01J3/0286 ,  G01J3/10 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/0638 ,  G01N2201/1211 ,  G05D23/1919 ,  G05D23/20

Abstract: An optical instrument is provided for simultaneously illuminating two or more spaced-apart reaction regions with an excitation beam generated by a light source. A collimating lens can be disposed along a beam path between the light source and the reaction regions to form bundles of collimated excitation beams, wherein each bundle corresponds to a respective reaction region. Methods of analysis using the optical instrument are also provided.

Abstract translation: 提供了一种光学仪器，用于同时用由光源产生的激发光束照射两个或更多间隔开的反应区域。 准直透镜可以沿着光源和反应区域之间的光束路径设置，以形成准直激励束的束，其中每个束对应于相应的反应区域。 还提供了使用光学仪器的分析方法。

公开(公告)号：US20150316479A1

公开(公告)日：2015-11-05

申请号：US14699755

申请日：2015-04-29

Applicant: BIO-RAD LABORATORIES, INC.

Inventor： EVAN THRUSH ,  STEVE SWIHART ,  Neeraj Bhatt

IPC: G01N21/64

CPC classification number: G01N21/6456 ,  G01N21/6486 ,  G01N2021/6439 ,  G01N2021/6471 ,  G01N2021/6482 ,  G01N2201/062 ,  G01N2201/0627 ,  G01N2201/0638 ,  G01N2201/12

Abstract: An imaging assembly and processing system that includes a sample platform having a target region which can hold a sample, where the sample can be marked with fluorescent or phosphorescent markers. The imaging assembly can have an excitation light module proximate to the sample platform that emits light to excite the markers, and a lens module positioned to receive emission light from excited markers in target region. At least one series filter assembly or interference filter can be arranged in front of, behind, or both in front of and behind the lens module. The assembly includes a light sensor and a processor and imaging module configured to process data captured by the light sensor. Images of the sample are generated based on the emission light from the sample that transmit through and are filtered by the lens assembly and series filter assembly or interference filter.

Abstract translation: 一种成像组件和处理系统，其包括具有可容纳样品的目标区域的样品平台，其中可以用荧光或磷光标记物标记样品。 成像组件可以具有靠近样本平台的激发光模块，其发射光以激发标记;以及透镜模块，其定位成接收来自目标区域中的激发标记的发射光。 至少一个串联滤波器组件或干涉滤波器可以布置在透镜模块的前面，后面或者两者之间。 组件包括光传感器，以及被配置为处理由光传感器捕获的数据的处理器和成像模块。 基于来自样品的发射光，通过透镜组件和串联滤光器组件或干涉滤光器滤光而产生样品的图像。

公开(公告)号：US09164031B2

公开(公告)日：2015-10-20

申请号：US14372418

申请日：2013-02-27

Applicant: CANON KABUSHIKI KAISHA

Inventor： Takeaki Itsuji

IPC: G01N21/3586 ,  G01N21/3581 ,  G01N21/35 ,  G01B11/06 ,  G01N21/41 ,  G01N21/47

CPC classification number: G01N21/3586 ,  G01B11/06 ,  G01N21/35 ,  G01N21/3581 ,  G01N21/41 ,  G01N21/47 ,  G01N21/4795 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/0697

Abstract: An apparatus configured to obtain a physical property of an object by time-domain spectroscopy includes: a detection unit; a delay unit configured to adjust a time difference between generation and detection; a shaping unit configured to collect the electromagnetic wave pulses; a waveform obtaining unit configured to construct a time waveform of the electromagnetic wave pulses; and a collecting position adjusting unit configured to adjust a collecting position. When the collecting position is moved, an amount of adjustment when the collecting position matches first and second reflection portions, respectively, of the object, and a difference by the delay unit required for detecting first and second pulses of the time waveform are obtained, and from an amount of change of the amount of adjustment and the difference, a thickness and a refractive index of a region between the first and second reflection portions of the object are calculated.

Abstract translation: 一种被配置为通过时域光谱获得物体的物理性质的装置，包括：检测单元; 延迟单元，被配置为调整生成和检测之间的时间差; 成形单元，被配置为收集电磁波脉冲; 波形获取单元，构造为构成电磁波脉冲的时间波形; 以及收集位置调整单元，被配置为调整收集位置。 当收集位置移动时，获得与收集位置分别与物体的第一和第二反射部分相匹配的调节量，以及通过检测时间波形的第一和第二脉冲所需的延迟单元的差异，以及 从调整量的变化量和差值的角度，算出物体的第一反射部和第二反射部之间的区域的厚度和折射率。

公开(公告)号：US20150260659A1

公开(公告)日：2015-09-17

申请号：US14643148

申请日：2015-03-10

Applicant: KLA-Tencor Corporation

Inventor： Yung-Ho Alex Chuang ,  Jingjing Zhang ,  John Fielden

IPC: G01N21/95 ,  H01L27/146 ,  H01L31/18 ,  H01L31/107 ,  H01L31/028 ,  G01N21/88 ,  H01L27/148

CPC classification number: H01L27/14632 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2201/061 ,  G01N2201/0638 ,  G01N2201/12 ,  H01L27/14609 ,  H01L27/1461 ,  H01L27/14612 ,  H01L27/1462 ,  H01L27/1464 ,  H01L27/14643 ,  H01L27/14645 ,  H01L27/14647 ,  H01L27/14681 ,  H01L27/14685 ,  H01L27/14687 ,  H01L27/14689 ,  H01L27/14698 ,  H01L27/14825 ,  H01L27/14831 ,  H01L27/14856 ,  H01L31/028 ,  H01L31/107 ,  H01L31/1804

Abstract: A high sensitivity image sensor comprises an epitaxial layer of silicon that is intrinsic or lightly p doped (such as a doping level less than about 1013 cm−3). CMOS or CCD circuits are fabricated on the front-side of the epitaxial layer. Epitaxial p and n type layers are grown on the backside of the epitaxial layer. A pure boron layer is deposited on the n-type epitaxial layer. Some boron is driven a few nm into the n-type epitaxial layer from the backside during the boron deposition process. An anti-reflection coating may be applied to the pure boron layer. During operation of the sensor a negative bias voltage of several tens to a few hundred volts is applied to the boron layer to accelerate photo-electrons away from the backside surface and create additional electrons by an avalanche effect. Grounded p-wells protect active circuits as needed from the reversed biased epitaxial layer.

Abstract translation: 高灵敏度图像传感器包括硅的外延层，其是固有的或轻掺杂的（例如掺杂水平小于约1013cm-3）。 CMOS或CCD电路制造在外延层的前侧。 外延p和n型层生长在外延层的背面。 在n型外延层上沉积纯硼层。 在硼沉积过程中，一些硼从背面被驱动到几nm的n型外延层中。 可以将抗反射涂层施加到纯硼层。 在传感器的操作期间，将数十至几百伏的负偏压施加到硼层，以加速光电子远离背面，并通过雪崩效应产生额外的电子。 接地的p阱可以根据需要从反向偏置的外延层保护有源电路。