Abstract:
A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.
Abstract:
Compact optical sources and methods for producing short and ultrashort optical pulses are described. A semiconductor laser or LED may be driven with a bipolar waveform to generate optical pulses with FWHM durations as short as approximately 85 ps having suppressed tail emission. The pulsed optical sources may be used for fluorescent lifetime analysis of biological samples and time-of-flight imaging, among other applications.
Abstract:
Some examples herein include systems and methods of creating standards of gemstones of various classifications, which may display certain characteristics of the various classifications when excited by ultraviolet radiation and fluoresce in response. In some examples, a set of standards are created using fluorescent material, filters, and a radiation source to compare against a sample gemstone.
Abstract:
Certain embodiments of the invention are directed to evaluating and identifying cells by recording and interpreting a time-dependent signal produced by unique cell respiration and permeability attributes of isolated viable cells.
Abstract:
Certain embodiments of the invention are directed to evaluating and identifying cells by recording and interpreting a time-dependent signal produced by unique cell respiration and permeability attributes of isolated viable cells.
Abstract:
An inspection system is configured for use with a conveyer apparatus including carrier bars. Each carrier bar conveys pellet-shaped articles along a predetermined path. The inspection system includes at least one camera unit for sensing a predetermined characteristic of the pellet-shaped articles, a removal unit, and a controller. The removal unit, downstream from the at least one camera unit, removes selected pellet-shaped article(s) from the carrier bar(s) depending on whether the characteristic is sensed by the at least one camera unit. The controller is in communication with the at least one camera unit and the removal unit. The controller provides a signal to the removal unit in accordance with the sensed characteristic. The removal unit includes a rotatable ejection drum having extended vacuum nozzles along its length, equal to the number of articles conveyed in each carrier bar. Each vacuum nozzle selectively removes article(s) from the carrier bar(s) by suction.
Abstract:
The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Embodiments—involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer (depending on whether the incident light beam is received by a detector recording it in reflection or transmission from the conductive layer). The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The method then provides for comparing the first and second values to detect a change in refractive index at the layer after the first signal and before the second signal was captured.
Abstract:
A method and system for inspecting a manufactured part at an inspection station are provided. A supported part is rotated about a measurement axis so that the part moves at predetermined angular increments during at least one rotational scan. A backside beam of collimated radiation is directed at and is occluded by the supported part at each of a first plurality of consecutive increments of movement to create a stream of unobstructed portions of the backside beam in rapid succession passing by and not blocked by the supported part. A frontside beam of radiation is directed at and is reflected by the supported part at each of a second plurality of consecutive increments of movement to create a stream of reflected portions of the frontside beam in rapid succession. The streams of reflected and unobstructed portions are detected at the inspection station to obtain electrical signals which are processed.
Abstract:
A method is described for determining the size of a transparent particle (2), wherein the particle (2) is illuminated with light from a light source (6), wherein using a radiation detector (7) a time-resolved intensity curve of light from the light source (6) scattered on the particle (2) is measured at a preselectable scattering angle θs, wherein characteristic scattered light peaks are determined in the intensity curve, and wherein the size of the particle (2) is determined on the basis of the time difference between two scattered light peaks, characterized in that, with the help of two radiation detectors (7) or light sources (6), a first and a second time-resolved intensity curve of scattered light, scattered on the particle (2) in the forward direction, are measured; a transmission peak (12) and a reflection peak (11) are determined from the first intensity curve and from the second intensity curve; a first time difference between the transmission peaks (12) is determined, and a second time difference between the reflection peaks (11) is determined; a characteristic variable α is determined from the ratio of the first time difference and the second time difference; and a size determination is performed for the particles (2) for which the characteristic variable α corresponds to a preselectable value. (FIG. 3)
Abstract:
A scattered-light smoke detector includes a detector unit that operates according to the scattered-light principle. The detector unit includes a light-emitting diode (LED) to irradiate particles to be detected and a spectrally sensitive photosensor to detect the light scattered by the particles. The LED and photosensor are aligned such that a principal optical axis of the LED and a principal optical axis of the photosensor define a scattered-light angle. The LED includes a first and a second LED chip for emitting first and second light beams with light in a first wavelength range and a different second wavelength range, and an LED chip carrier arranged orthogonally to the principal optical axis. The two LED chips are arranged side-by-side on the LED chip carrier. The LED is rotated such that a chip axis extending through the two LED chips is orthogonal to an angle plane defined by the two optical axes.