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171.Adjustable light aperture, particularly a slit in a diaphragm in an optical system 失效
Title translation: 可调光孔,特别是在光学系统中的隔膜中的狭缝公开(公告)号:US3397025A
公开(公告)日:1968-08-13
申请号:US37829964
申请日:1964-06-26
Applicant: RASMUS STRANDE ALM
Inventor: STRANDE ALM RASMUS
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公开(公告)号:US3374705A
公开(公告)日:1968-03-26
申请号:US50393565
申请日:1965-10-23
Applicant: FABRI TEK INC
Inventor: OTT SR GEORGE H
IPC: G01J3/04
CPC classification number: G01J3/04
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173.Self-compensating spectrometer incorporating a diffraction grating 失效
Title translation: 包含衍射光栅的自补偿光谱仪公开(公告)号:US3312824A
公开(公告)日:1967-04-04
申请号:US31735463
申请日:1963-10-18
Applicant: NAT RES DEV
Inventor: HUGH COOK ALAN
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公开(公告)号:US3211056A
公开(公告)日:1965-10-12
申请号:US15530061
申请日:1961-11-28
Applicant: AMERICAN INSTR CO INC
Inventor: GOLDSTEIN JACK M , LOWY GEORGE W
IPC: G01J3/04
CPC classification number: G01J3/04
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公开(公告)号:US2994950A
公开(公告)日:1961-08-08
申请号:US67308957
申请日:1957-07-19
Applicant: PERKIN ELMER CORP
Inventor: SIEGLER JR EDOUARD HORACE
CPC classification number: B21D53/00 , G01J3/04 , Y10S359/90 , Y10T29/49789 , Y10T29/4984
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公开(公告)号:US2914987A
公开(公告)日:1959-12-01
申请号:US43420454
申请日:1954-06-03
Applicant: WALTER G FINCH
Inventor: CROSSWHITE JR HENRY M , FASTIE WILLIAM G
IPC: G01J3/04
CPC classification number: G01J3/04
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177.Multiple slit spectrograph for direct reading spectrographic analysis 失效
Title translation: 用于直读光谱分析的多缝光谱仪公开(公告)号:US2823577A
公开(公告)日:1958-02-18
申请号:US24118851
申请日:1951-08-10
Applicant: LEEDS & NORTHRUP CO
Inventor: MACHLER RAYMOND C
IPC: G01J3/32
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公开(公告)号:US2782685A
公开(公告)日:1957-02-26
申请号:US25449651
申请日:1951-11-02
Applicant: RCA CORP
Inventor: DIMMICK GLENN L , WIDDOP MARY E
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公开(公告)号:US2021232A
公开(公告)日:1935-11-19
申请号:US66380833
申请日:1933-03-31
Applicant: BAUSCH & LOMB
Inventor: GUSTAVE FASSIN
IPC: G01J3/04
CPC classification number: G01J3/04
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公开(公告)号:US12117341B1
公开(公告)日:2024-10-15
申请号:US18523463
申请日:2023-11-29
Applicant: ANSWERAY INC.
Inventor: Seong Ho Cho
CPC classification number: G01J3/1804 , G01J3/0208 , G01J3/04 , G01J3/2823
Abstract: Disclosed is a spectrometer including a slit unit and a collimating member sequentially arranged along a path of pre-diffraction radiation light, a focusing member and a detection unit sequentially arranged along a path of post-diffraction radiation light, and the diffraction grating located between the collimating member and the focusing member, wherein the slit unit, the collimating member, the diffraction grating, and the focusing member are seated in one plane and are spaced apart from each other by a predetermined distance, and the detection unit is spaced apart from one plane and is located under or above the diffraction grating.
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