公开(公告)号：US09939320B2

公开(公告)日：2018-04-10

申请号：US15362037

申请日：2016-11-28

Applicant: Electronic Photonic IC Inc. (EPIC Inc.)

Inventor： Seng-Tiong Ho ,  Yingyan Huang

IPC: G01J3/28 ,  G01J3/20 ,  G01J3/04 ,  G01J3/02 ,  G02B6/293 ,  G02B5/18 ,  G01J3/18

CPC classification number: G01J3/20 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/04 ,  G01J3/18 ,  G01J3/1895 ,  G01J3/24 ,  G01J3/28 ,  G01J2003/1842 ,  G01J2003/1847 ,  G02B5/1861 ,  G02B6/29326 ,  G02B6/2938

Abstract: The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (COGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.

公开(公告)号：US08705154B2

公开(公告)日：2014-04-22

申请号：US13888504

申请日：2013-05-07

Applicant: Canon Kabushiki Kaisha

Inventor： Tokuji Takizawa ,  Kazumi Kimura ,  Nobuyuki Tochigi ,  Masayasu Teramura

IPC: H04N1/46 ,  G01J3/28 ,  G03G15/04 ,  G03G15/00

CPC classification number: G01N21/251 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0216 ,  G01J3/0237 ,  G01J3/024 ,  G01J3/0291 ,  G01J3/20 ,  G01J3/2803 ,  G01J3/50 ,  G03G15/0131 ,  G03G15/0194 ,  G03G15/50 ,  G03G2215/0132 ,  G03G2215/0164

Abstract: A spectral colorimetric apparatus for detecting a color of an image of a subject, including: an illumination optical system illuminating the subject on a detection surface; a spectral optical system including a spectral element spectrally separating the beam diffused by the subject and a light receiving element array detecting a spectral intensity distribution; and a guiding optical system for guiding a beam diffused by the subject, wherein: the detection surface is parallel to a spectral plane including a principal ray of a beam entering the spectral optical system and a principal ray of a beam spectrally separated; the principal ray of the beam enters the spectral optical system within the spectral plane obliquely to a line joining a center of the light receiving element array with a surface vertex of the spectral element; and a light receiving surface of the light receiving element array is orthogonal to the spectral plane.

Abstract translation: 一种用于检测被摄体的图像的颜色的光谱比色装置，包括：照射光学系统，在检测面上照射被摄体; 光谱光学系统，包括频谱分离由对象漫射的光束的光谱元件和检测光谱强度分布的光接收元件阵列; 以及引导光学系统，用于引导被对象漫射的光束，其中：所述检测表面平行于包括进入所述光谱系统的光束的主光线和光谱分离的光束的主光束的光谱平面; 光束的主射线进入光谱平面内的光谱系统，倾斜于连接光接收元件阵列的中心与光谱元件的表面顶点的线; 并且光接收元件阵列的光接收表面与光谱平面正交。

公开(公告)号：US08422012B2

公开(公告)日：2013-04-16

申请号：US12772621

申请日：2010-05-03

Applicant: Masayasu Teramura ,  Kazumi Kimura ,  Nobuyuki Tochigi ,  Tokuji Takizawa

Inventor： Masayasu Teramura ,  Kazumi Kimura ,  Nobuyuki Tochigi ,  Tokuji Takizawa

IPC: G01J3/28

CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/18 ,  G01J3/20 ,  G01J3/50

Abstract: There is provided is a spectrometer having a concave reflection type diffraction element, wherein, among surfaces other than a diffraction surface of the diffraction element, non-diffraction surfaces which are located outside the diffraction surface at the same side as the diffraction surface are a glossy surface, the spectrometer includes a light detection unit which is located at an imaging position of a first-order diffracted light diffracted by the diffraction element to receive the first-order diffracted light, and the light detection unit is disposed inside optical paths of light beams regularly reflected on the non-diffraction surfaces outside the diffraction surface. Accordingly, it is possible to effectively suppress a stray light reflected on the surfaces other the diffraction surface from being incident into the light detection unit and to detect the light spectrally diffracted by the diffraction surface at high accuracy.

公开(公告)号：US20120327416A1

公开(公告)日：2012-12-27

申请号：US13579838

申请日：2011-02-15

Applicant: Rainer Simons ,  Armin Schmidt

Inventor： Rainer Simons ,  Armin Schmidt

IPC: G01J3/46

CPC classification number: G01J3/20 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/443

Abstract: The invention relates to a spectrometer comprising a hollow main optical body having at least one light channel, a light source, a diffraction grating having a grating central point, a light inlet opening, and a detector unit, which are arranged in such a way that the focal curve of the spectrometer satisfies the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, which spectrometer is able to operate in a large temperature interval even without thermostatic control, according to the invention the light inlet opening is arranged on a compensation body, the compensation body is arranged in the light channel and fastened to the main optical body between the light source and the diffraction grating, and the compensation body is dimensioned in such a way that the compensation body changes the distance between the light inlet opening and the grating central point when the main optical body thermally expands.

Abstract translation: 本发明涉及一种光谱仪，其包括具有至少一个光通道的中空主光学主体，光源，具有光栅中心点的衍射光栅，光入口和检测器单元，其布置成 光谱仪的焦点曲线满足后焦点方程。 为了从低价格，轻便且易于处理的材料制造具有足够的光谱分辨率的光谱仪，即使没有恒温控制，该光谱仪也能够在大的温度范围内操作，根据本发明，光入口开口 被配置在补偿体上，补偿体配置在光通道中并且紧固在光源与衍射光栅之间的主光学体上，并且补偿体的尺寸使得补偿体的尺寸使得补偿体之间的距离 当主光学体热膨胀时，光入口和光栅中心点。

公开(公告)号：US20110080584A1

公开(公告)日：2011-04-07

申请号：US12966083

申请日：2010-12-13

Applicant: Cheng-Hao Ko

Inventor： Cheng-Hao Ko

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0218 ,  G01J3/0291 ,  G01J3/1804 ,  G01J3/1838 ,  G01J3/20 ,  G01J3/24 ,  G02B5/1861

Abstract: The invention concerns an optical system. The optical system comprises an input for receiving an optical signal, a predetermined output plane, and a diffraction grating for separating the optical signal received at the input into spectral elements thereof. The grating has a diffraction surface, which is formed by a photolithography process. The diffraction surface has a first predetermined profile. The first profile is formed by a plurality of points each conducted by different equations. Consequently, each spectral component is focused on the predetermined output plane.

Abstract translation: 本发明涉及一种光学系统。 光学系统包括用于接收光信号，预定输出平面的输入端和用于将在输入处接收的光信号分离为其光谱元件的衍射光栅。 光栅具有通过光刻工艺形成的衍射表面。 衍射面具有第一预定轮廓。 第一轮廓由多个点组成，每个点由不同方程式进行。 因此，每个频谱分量聚焦在预定的输出平面上。

公开(公告)号：US07869036B2

公开(公告)日：2011-01-11

申请号：US12196224

申请日：2008-08-21

Applicant: Kousuke Kajiki ,  Toshihiko Ouchi ,  Ryota Sekiguchi

Inventor： Kousuke Kajiki ,  Toshihiko Ouchi ,  Ryota Sekiguchi

IPC: G01J3/18 ,  G01J3/20 ,  G01J3/28

CPC classification number: G01J3/42 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/20 ,  G01J3/36 ,  G01N21/31 ,  G01N21/3563 ,  G01N21/8901

Abstract: An analysis apparatus for analyzing a specimen comprises a spectral separator for dispersing spatially an electromagnetic wave introduced from the specimen into spectral components, a sensing element array containing plural sensing elements for sensing the spectral components of the electromagnetic wave dispersed spatially by the spectral separator, and a spectrum calculator for calculating the spectrum from the signal sensed by the sensing elements; the sensing element array having sensitivities different to each of the spectral components of the electromagnetic wave dispersed spatially by the spectral separator, and the spectral separator and the sensing element array being placed so as to receive the spectral components by each of the sensing elements at different incident angles.

Abstract translation: 用于分析试样的分析装置包括用于将从试样引入的电磁波空间分散到光谱分量中的光谱分离装置，包含用于感测由光谱分离器在空间上分散的电磁波的光谱分量的多个感测元件的感测元件阵列，以及 频谱计算器，用于根据由感测元件感测的信号计算频谱; 感测元件阵列具有与通过光谱分离器在空间上分散的电磁波的每个光谱分量不同的灵敏度，并且光谱分离器和感测元件阵列被放置以便通过每个感测元件在不同的方向上接收光谱分量 入射角度

公开(公告)号：US20100284084A1

公开(公告)日：2010-11-11

申请号：US12776649

申请日：2010-05-10

Applicant: Yoshihiro Ishibe

Inventor： Yoshihiro Ishibe

IPC: G02B5/18 ,  B23B3/00 ,  G01J3/28

CPC classification number: B23C3/00 ,  B23C2226/31 ,  G01J3/18 ,  G01J3/20 ,  G01J3/50 ,  G02B5/1842 ,  G02B5/1861 ,  G02B27/0944

Abstract: Objects are to obtain a highly accurate diffraction element that may prevent an intensity decrease of a light beam entering a light receiving unit without a decrease in diffraction efficiency and without a problem of flare or the like, a manufacturing method for the diffraction element, and a spectrometer using the same. A diffraction element (2) includes a diffraction grating formed on a substrate having a curved surface. In the diffraction element (2), the curved surface (3) has an anamorphic shape formed by pivoting a curved line (I) in a plane about a straight line (II) in the same plane serving as a rotation axis, and gratings (10a) of the diffraction grating (10) exist in cross sections orthogonal to the rotation axis.

Abstract translation: 目的是获得高精度的衍射元件，其可以防止进入光接收单元的光束的强度降低，而不会降低衍射效率，并且不存在耀斑等的问题，衍射元件的制造方法和 光谱仪使用相同。 衍射元件（2）包括形成在具有曲面的基板上的衍射光栅。 在衍射元件（2）中，弯曲表面（3）具有通过在与旋转轴线相同的平面上围绕直线（II）的平面中的曲线（I）旋转而形成的变形形状， 衍射光栅（10）的10a）位于与旋转轴正交的横截面中。

公开(公告)号：US20080198377A1

公开(公告)日：2008-08-21

申请号：US11814051

申请日：2005-11-04

Applicant: Heinz-Gerd Joosten

Inventor： Heinz-Gerd Joosten

IPC: G01J3/30 ,  G01J3/00

CPC classification number: G01J3/28 ,  G01J3/20 ,  G01J3/443 ,  G01N21/67

Abstract: The invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters, b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c, e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d, f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e.

Abstract translation: 本发明涉及金属样品的光谱分析方法，具体步骤如下：a。 用多个预设的激励参数记录未知样品的光谱，b。 将光谱与多个对照样品的储存光谱进行比较，c。 用最好的光谱一致性测定对照样品，d。 为在步骤c中确定的最佳和最接近的对照样品存储的激发参数的设定， 用步骤d，f中设定的激发参数记录未知样品的光谱。 计算存储在对照样品中的分析线和步骤e记录的光谱的内部标准的强度比。

公开(公告)号：US07034935B1

公开(公告)日：2006-04-25

申请号：US10394662

申请日：2003-03-24

Applicant: Roman V. Kruzelecky

Inventor： Roman V. Kruzelecky

IPC: G01J3/28

CPC classification number: G02B6/10 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0232 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/04 ,  G01J3/20 ,  G01J3/2803 ,  G01J3/2846

Abstract: An infrared spectrometer is described wherein a detector array is optically coupled to a slab waveguide structure. A focal plane is provided outside of the output face of the slab waveguide structure and the detector array is mounted onto the slab waveguide structure at a fixed distance from the output face on the output focal plane.

Abstract translation: 描述了一种红外光谱仪，其中检测器阵列光学耦合到平板波导结构。 焦平面设置在平板波导结构的输出面的外侧，检测器阵列以与输出焦平面上的输出面一定距离的方式安装在平板波导结构上。

公开(公告)号：US06839135B2

公开(公告)日：2005-01-04

申请号：US09832687

申请日：2001-04-11

Applicant: Thomas Hamm ,  Beno Mueller

Inventor： Thomas Hamm ,  Beno Mueller

IPC: G01J3/20 ,  G01J3/28 ,  H01L25/16 ,  H01L31/0232

CPC classification number: G01J3/20 ,  G01J3/28 ,  G01J3/2803 ,  H01L25/167 ,  H01L31/02325 ,  H01L2924/0002 ,  H01L2924/09701 ,  H01L2924/00

Abstract: An optical device includes an imaging device for imaging an incident beam onto a focal surface, and a support element which includes at least one side having a shape corresponding to the focal surface, where the side is located on the focal surface. The invention also includes a sensor array in close contact with the side of the support element having the shape of the focal surface.