公开(公告)号：US3756721A

公开(公告)日：1973-09-04

申请号：US3756721D

申请日：1972-03-06

Applicant: UNIV FLORIDA STATE

Inventor： WILLIAMS D

IPC: G01J3/433 ,  G01J3/04 ,  G01J3/42

CPC classification number: G01J3/433

Abstract: A wobbling single slit is provided as the entrance slit of a spectrometer which rectilinearly reciprocates at a constant amplitude, such amplitude being selectively adjustable. A control signal is obtained from a circuit that oscillates the slit for controlling the frequency and phase of the ac signal component detected and amplified from the detector after the superposed dc detected signal component is separated from the ac signal component. The invention described herein was made in the course of work under a grant or award from the Department of Health, Education and Welfare.

Abstract translation: 提供摆动的单个狭缝作为以恒定振幅直线往复运动的光谱仪的入口狭缝，这样的幅度可选择性地调节。 从重叠的直流检测信号分量与交流信号分量分离之后，从用于控制从检测器检测和放大的交流信号分量的频率和相位的狭缝振荡的电路获得控制信号。

公开(公告)号：US3454338A

公开(公告)日：1969-07-08

申请号：US3454338D

申请日：1966-02-07

Applicant: ONERA (OFF NAT AEROSPATIALE)

Inventor： GIRARD ANDRE J ,  BERNY JEAN G

IPC: G01J3/00 ,  G01J3/14 ,  G01J3/18 ,  G01J3/433 ,  G01J3/453 ,  G01J3/42

CPC classification number: G01J3/18 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/14 ,  G01J3/433 ,  G01J3/453

公开(公告)号：US3211051A

公开(公告)日：1965-10-12

申请号：US19056262

申请日：1962-04-27

Applicant: FANNY FREI JAEL ,  HEINRICH FREI EPHRAIM ,  OPPENHEIM URI P ,  COWAN CLAUDE I

Inventor： FANNY FREI JAEL ,  HEINRICH FREI EPHRAIM ,  OPPENHEIM URI P ,  COWAN CLAUDE I

IPC: G01J3/433 ,  G01N21/45

CPC classification number: G01N21/45 ,  G01J3/433

公开(公告)号：US2648249A

公开(公告)日：1953-08-11

申请号：US1196248

申请日：1948-02-28

Applicant: GEN ELECTRIC

Inventor： CANADA ALFRED H

IPC: G01J3/433 ,  G01N21/31

CPC classification number: G01N21/314 ,  G01J3/433

公开(公告)号：US20250155287A1

公开(公告)日：2025-05-15

申请号：US18945980

申请日：2024-11-13

Applicant: The Regents of The University of Michigan

Inventor： Jennifer OGILVIE

IPC: G01J3/453 ,  G01J3/02 ,  G01J3/433 ,  G01N21/35

Abstract: A phase-modulated approach for ultrabroadband Fourier transform electronic spectroscopy is presented. To overcome the bandwidth limitations and spatial chirp introduced by acousto-optic modulators (AOMs), pulses from a 1 μm laser are modulated using AOMs prior to continuum generation. This phase modulation is transferred to the continuum generated in an Yttrium Aluminum Garnet crystal. Separately generated phase-modulated continua in two arms of a Mach-Zehnder interferometer interfere at the difference of their modulation frequencies, enabling physical under-sampling of the signal and the suppression of low-frequency noise. By interferometrically tracking the relative time delay of the continua, one can perform continuous, rapid-scanning Fourier transform electronic spectroscopy with a high signal-to-noise ratio and spectral resolution.

公开(公告)号：US12276548B2

公开(公告)日：2025-04-15

申请号：US18141647

申请日：2023-05-01

Applicant: Government of the United States of America, as represented by the Secretary of Commerce

Inventor： Ian Robert Coddington ,  Nathan Reynolds Newbury ,  Jean-Daniel Deschenes ,  Fabrizio Raphael Giorgetta ,  Esther Baumann

IPC: G01J3/433 ,  G01J3/02 ,  G01J3/28 ,  G01J3/45

Abstract: Embodiments of the present invention relate to apparatus and methods for dual comb spectroscopy with deterministic stepping and scanning of temporal pulse offset. In one embodiment, the present invention relates to a novel dual-comb spectroscopy including mode locked robust Er-combs and digital phase-locking electronics for step scanning between the two frequency combs and applicable to any phase-locked dual-comb system. The tight phase control of the DCS source allows for the control of temporal offset between the two comb pulses during measurements.

公开(公告)号：US20250116505A1

公开(公告)日：2025-04-10

申请号：US18909189

申请日：2024-10-08

Applicant: Monstr Sense Technologies, LLC

Inventor： Eric W. Martin ,  Torben L. Purz ,  Steven T. Cundiff

IPC: G01B11/06 ,  G01J3/433

Abstract: A method determines the number of layers in a sample material. The method includes measuring, as a function of two or more wavelengths, a four-wave mixing (FWM) spectrum of the sample material. The method further includes using the FWM spectrum to determine a thickness of the sample material, wherein the thickness is a number of layers in the sample material.

公开(公告)号：US12270706B2

公开(公告)日：2025-04-08

申请号：US17402571

申请日：2021-08-15

Applicant: Picarro, Inc.

Inventor： Alejandro Dario Farinas ,  John A. Hoffnagle ,  Chris W. Rella ,  Sze Meng Tan

IPC: G01J3/433 ,  G01N21/39

Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.

公开(公告)号：US20240426659A1

公开(公告)日：2024-12-26

申请号：US18705721

申请日：2022-10-25

Applicant: Agency for Science, Technology and Research

Inventor： Ee Jin Teo ,  Chi Jin Darren Neo ,  Min Xin Maxine Ong

IPC: G01J3/02 ,  G01J3/12 ,  G01J3/42 ,  G01J3/433 ,  G01J3/44

Abstract: Disclosed are optical detection device, system, and method which increase photodetection area and enables omnidirectional and self-aligning photodetection through the use of a fluorescent lens. An optical detection device comprises a fluorescent lens having a light collecting area being a spherical, hemispherical, or cylindrical surface of the fluorescent lens, and a light outcoupling area; and a fluorophore dispersed throughout the light collection area and the fluorescent lens, wherein the fluorophore is excitable by a light beam, which is incident at any position or angle in relation to the spherical surface, to produce a light emission, wherein the light outcoupling area is arranged to allow an extraction of the light emission from the fluorescent lens, wherein the light collecting area is larger than the light outcoupling area.

公开(公告)号：US12111254B2

公开(公告)日：2024-10-08

申请号：US17611471

申请日：2020-05-12

Applicant: HORIBA, Ltd.

Inventor： Takahito Inoue ,  Hiroshi Uchihara ,  Kyoji Shibuya

IPC: G01N21/39 ,  G01J3/433 ,  G01N1/44 ,  G01N21/3504 ,  G01N21/31 ,  G01N21/3518

CPC classification number: G01N21/39 ,  G01J3/4338 ,  G01N21/3504 ,  G01N1/44 ,  G01N2021/3129 ,  G01N21/3518

Abstract: A sample analyzing apparatus analyzes a component to be measured securely while reducing a frequency of maintenance of the sample analyzing apparatus. The sample analyzing apparatus includes a heating furnace that heats a sample held by a sample holding body and a gas analysis section that analyzes a component to be measured contained in a gas generated by heating the sample, and the gas analysis section includes a laser light source that irradiates the gas with a laser light, and a photodetector that detects an intensity of a sample light as being the laser light that has transmitted through the gas.