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公开(公告)号：US11248955B2
公开(公告)日：2022-02-15
申请号：US16536709
申请日：2019-08-09
Inventor： Daesuk Kim
Abstract: The present inventive concepts relate to an inspection apparatus that snapshots an interference image pattern having a high spatial carrier frequency produced from a one-piece off-axis polarimetric interferometer and that precisely and promptly measures a Stokes vector including spatial polarimetric information. The inspection apparatus dynamically measure in real-time a two-dimensional polarization information without employing a two-dimensional scanner.
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公开(公告)号：US11237056B2
公开(公告)日：2022-02-01
申请号：US15806305
申请日：2017-11-07
Applicant: California Institute of Technology
Inventor： Seyedeh Sona Hosseini
Abstract: Novel monolithic cyclical reflective spatial heterodyne spectrometers (CRSHS) are presented. Monolithic CRSHS in accordance with the invention have a single frame wherein a flat mirror, roof mirror, and symmetric grating are affixed. The invention contains only fixed parts; the flat mirror, roof mirror, and symmetric grating do not move in relation to the frame. Compared to conventional CRSHS known in the art, the present invention enables much smaller and lighter CRSHS, requires less time and skill for maintenance, and is a better economic option. The disclosed invention may include fixed field-widening optical elements or a fiber-fed assembly.
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公开(公告)号：US11215440B2
公开(公告)日：2022-01-04
申请号：US16839488
申请日：2020-04-03
Applicant: Lumentum Technology UK Limited
Inventor： Adrian Perrin Janssen
IPC: G01B9/02 , H04B10/572 , G01J3/453 , H01S5/0687
Abstract: There is described an interferometer for use in an optical locker. The interferometer comprises at least two transparent materials having different thermal path length sensitivities. The interferometer is configured such that an input beam is split by the interferometer into first and second intermediate beams, which recombine to form an output beam, the first and second intermediate beams travelling along respective first and second intermediate beam paths which do not overlap. At least one of the intermediate beam paths passes through at least two of the transparent materials. A length of each intermediate beam path which passes through each transparent material is selected such that an optical path difference between the first and second intermediate beam path is substantially independent of temperature.
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公开(公告)号：US20210404969A1
公开(公告)日：2021-12-30
申请号：US17471139
申请日：2021-09-09
Applicant: UNM Rainforest Innovations
Inventor： Mani Hossein-Zadeh
Abstract: The present invention provides a sensor having, one or more optical slab waveguides having one or more target regions. The target regions may interact with gas molecules or trap, entrain or capture one or more targets of interest. The optical slab waveguides are adapted to receive one or more input optical beams from one or more light sources to create a plurality of propagating optical waves in optical slab waveguide. The propagating optical waves interact with said one or more target regions to create an optical output wavefront that may be in the form of a diffraction pattern. The target regions may be functionalized with an antibody, polymer, cell, tissue, or biological material.
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公开(公告)号：US20210310869A1
公开(公告)日：2021-10-07
申请号：US17121100
申请日：2019-06-13
Inventor： Ichiro ISHIMARU
Abstract: A combining light emitted from a measurement point of an object to be measured into one parallel light beam by combining optical system; dividing, by phase shifter, parallel light beam emitted from combining optical system into first and second light beam, emitting first and second light beam toward light-receiving face while providing an optical path length difference between the first and second light beam, and causing the first and second light beam to planarly enter the light-receiving face so that at least a part of an incident region of first light beam on the light-receiving face and at least a part of an incident region of second light beam overlap with each other; and obtaining an interferogram at measurement point based on intensity distribution of light in a region where an incident region of the first and second light beam on light-receiving face overlap, and acquiring spectrum by Fourier-transforming interferogram.
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Patent Agency Ranking
公开(公告)号：US20210310864A1
公开(公告)日：2021-10-07
申请号：US17089518
申请日：2020-11-04
Inventor： Jiangquan Mai
Abstract: Systems and methods which provide a high-throughput point source light coupling structure implementing a condenser configured according to one or more condenser configuration rules are described. Embodiments of a high-throughput point source light coupling structure utilize a birefringent plate configuration in combination with a condenser and point source to provide a light coupler structure for a birefringent-static-Fourier transform interferometer implementation. According to some examples, the optical axis of a first and second birefringent plate of a birefringent plate configuration are not in the same plane. A condenser of a high-throughput point source light coupling structure of embodiments is provided in a defined (e.g., spaced, relational, etc.) relationship with respect to the point source and/or a camera lens used in capturing an interference pattern generated by the light coupling structure. High-throughput point source light coupling structures herein may be provided as external accessories for processor-based mobile devices having image capturing capabilities.
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公开(公告)号：US20210302716A1
公开(公告)日：2021-09-30
申请号：US17214091
申请日：2021-03-26
Applicant: Battelle Memorial Institute
Inventor： Anthony George
Abstract: The disclosed discrete or continuous optical delay is a medium with high transmission, a high index of refraction and a low dispersion coefficient at the wavelength of light of interest. One side of the medium, orthogonal to the incident light, is fabricated to delay the light at discrete values in a periodic pattern that repeats as the optical delay rotates. The disclosed discrete or continuous optical delay enables the creation of compact interferometry equipment to be used outside a laboratory environment.
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178.发明申请公开(公告)号：US20210278276A1
公开(公告)日：2021-09-09
申请号：US16318038
申请日：2017-07-13
Applicant: Mettler-Toledo GmbH
Inventor： Frank KILLICH
Abstract: An optical arrangement has a light source, which emits a light beam along a first optical axis. A first reflector is provided, and a second reflector reflects light reflected by the first reflector. The first reflector has a transverse offset from the first optical axis to reflect light along a second optical axis which has a parallel offset of two times the transverse offset of the first optical axis. The second reflector reflects the light beam back to the first reflector along a third optical axis having a parallel offset with a fixed amount in a fixed transverse direction in relation to the second optical axis. The light beam is reflected by the first reflector along a fourth optical axis which has a parallel offset in relation to the first optical axis with a fixed amount counter to the fixed transverse direction.
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公开(公告)号：US20210270671A1
公开(公告)日：2021-09-02
申请号：US17181411
申请日：2021-02-22
Inventor： Fabian Steinlechner , Marta Gilaberte Basset , Markus Gräfe
Abstract: A system and method is provided for imaging and/or spectroscopy involving generation of a first signal field and a first idler field, illumination of the object with the first idler field, generation of second signal field and a second idler field, combination of the first and second idler fields, such that the two fields are indistinguishable, combination of the first and second signal fields, such that the two fields interfere, first measurement of the interfered signal field by a detection means, one or more additional measurements of the interfered signal field, wherein for each additional measurement a different phase shift is generated in the setup, and wherein all measurements are carried out within the stability time of the setup, and calculation of a phase function.
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公开(公告)号：US11073424B2
公开(公告)日：2021-07-27
申请号：US16648104
申请日：2018-09-10
Applicant: Yokogawa Electric Corporation
Inventor： Yasuyuki Suzuki , Yukihiro Nakamura , Masashi Nishi , Tetsushi Namatame
Abstract: A Fourier spectroscopic analyzer includes: a light receiver that receives a first wavelength component of a first wavelength band and a second wavelength component of a second wavelength band different from the first wavelength band, emits an interferogram to a sample, and outputs a first light reception signal acquired by receiving the first wavelength component and a second light reception signal acquired by receiving the second wavelength component; and a signal processing device that eliminates noise of the first wavelength component and acquires the spectrum by Fourier transform processing using the first light reception signal and the second light reception signal. The first wavelength band is a wavelength band of which a spectrum is acquired among wavelength components included in light that has passed through the sample. The interferogram is interference light and the sample is an analysis target.
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