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公开(公告)号：US20210310869A1
公开(公告)日：2021-10-07
申请号：US17121100
申请日：2019-06-13
Inventor： Ichiro ISHIMARU
Abstract: A combining light emitted from a measurement point of an object to be measured into one parallel light beam by combining optical system; dividing, by phase shifter, parallel light beam emitted from combining optical system into first and second light beam, emitting first and second light beam toward light-receiving face while providing an optical path length difference between the first and second light beam, and causing the first and second light beam to planarly enter the light-receiving face so that at least a part of an incident region of first light beam on the light-receiving face and at least a part of an incident region of second light beam overlap with each other; and obtaining an interferogram at measurement point based on intensity distribution of light in a region where an incident region of the first and second light beam on light-receiving face overlap, and acquiring spectrum by Fourier-transforming interferogram.
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公开(公告)号：US20200333128A1
公开(公告)日：2020-10-22
申请号：US16764526
申请日：2018-10-30
Inventor： Takeshi AKAGAWA , Masahiro KUBO , Katsumi ABE , Ersin ALTINTAS , Yuji OHNO , Tetsuri ARIYAMA , Ichiro ISHIMARU
Abstract: Optical measuring apparatus includes: a light source irradiating an object to be measured; a splitter splitting transmitted light or reflected light from the object to be measured; a phase changer changing a phase of a first light which is one of the lights split; a phase fixer maintaining a phase of a second light which is the other light split; a multiplexer multiplexing lights output from the phase changer and the phase fixer; a detector detecting the light (interference image) output from the multiplexer; and a controller that extracts a reference point from the interference image, when a displacement of the reference point is detected, corrects a luminance value for each pixel of the interference images in accordance with a displacement of the object to be measured indicated by a displacement of the reference point, constructs an interferogram based on the luminance value for each pixel of the interference images after the correction.
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公开(公告)号：US20150198483A1
公开(公告)日：2015-07-16
申请号：US14668106
申请日：2015-03-25
Inventor： Ichiro ISHIMARU
CPC classification number: G01J3/0208 , A61B5/1455 , A61B2562/0233 , G01J3/021 , G01J3/2803 , G01J3/4531 , G01J3/4535
Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.
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公开(公告)号：US20170336263A1
公开(公告)日：2017-11-23
申请号：US15597544
申请日：2017-05-17
Inventor： Hiroki HAYASHI , Ichiro ISHIMARU
CPC classification number: G01J3/447 , G01J3/0224 , G01J3/0289 , G01J3/45 , G01J3/50 , G01N21/21 , G01N21/255 , G01N21/55 , G01N2021/217 , G01N2021/559 , G01N2201/0642
Abstract: Reflected light detecting device and method with surface reflected light components collectively be extracted/removed when detecting reflected light arising in casting light onto target-object range having non-planar surface. The device includes: a first illuminating device causing first-measurement light in predetermined polarization direction to enter target-object first region from first direction; polarization optical system position part of first-surface reflected light enters the polarization optical system, the first-surface reflected light being the first-measurement in the first region surface; a second illuminating device causing second-measurement light in the same first-measurement light polarization direction to enter second region from second direction, the second region being on the target-object surface, different from the first region; adjusting direction of the second-measurement light optical axis so part of second-surface reflected light enters the polarization optical system, the second-surface reflected light being the second-measurement in second region surface; and detecting light having passed through the polarization optical system.
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公开(公告)号：US20200284717A1
公开(公告)日：2020-09-10
申请号：US16326006
申请日：2017-08-18
Inventor： Ichiro ISHIMARU
Abstract: A light source, a standing wave forming unit, a detector, and an absorbance calculating unit. The light source irradiates a sample with light. The standing wave forming unit forms, in the sample, an acoustic standing wave perpendicular to a surface of the sample. A node of the acoustic standing wave is positioned at a predetermined distance from the surface of the sample, the light from the light source entering the surface of the sample. The detector detects light emitted from the surface of the sample, and is disposed on the surface of the sample on a side where the light source is disposed. The absorbance calculating unit obtains absorbance.
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Patent Agency Ranking
公开(公告)号：US20190204065A1
公开(公告)日：2019-07-04
申请号：US16322592
申请日：2017-08-07
Inventor： Takeshi AKAGAWA , Masahiro KUBO , Katsumi ABE , Kimiyasu TAKOH , Ersin ALTINTAS , Yuji OHNO , Tetsuri ARIYAMA , Ichiro ISHIMARU
CPC classification number: G01B9/02067 , G01B9/02041 , G01B9/02061 , G01B9/02068 , G01J3/45
Abstract: A light measurement device that maintains high measurement precision. The light measurement device includes: light source that irradiates light upon measurement object; branch part that splits transmitted light or reflected light from measurement object; phase-changing unit that changes the phase of one beam of the branched light beams; phase-fixing unit that maintains the phase of the other beam of the branched light beams; adjustment mechanism, which is provided in phase-changing unit or phase-fixing unit, for adjusting the propagation direction of light; multiplexer that causes the light emitted by each of phase-changing unit and phase-fixing unit to interfere with each other; detection unit that detects light that is interfered with by multiplexer; and control unit that controls the adjustment mechanism on the basis of the luminance values of an interference image that is detected by detection unit and adjusts the propagation direction of light in phase-changing unit or phase-fixing unit.
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公开(公告)号：US20170045437A1
公开(公告)日：2017-02-16
申请号：US15117536
申请日：2015-02-20
Inventor： Ichiro ISHIMARU
CPC classification number: G01N15/1436 , B01L3/502 , B01L2200/0647 , B01L2300/0609 , B01L2300/0654 , B01L2300/0861 , B01L2300/168 , G01N15/1434 , G01N15/1459 , G01N21/253 , G01N21/645 , G01N21/65 , G01N2015/0073 , G01N2015/1006 , G01N2021/6421 , G01N2021/6463 , G01N2201/06113
Abstract: In a microparticle measurement device, a sample is passed through each channel in a multi-flow channel, and a predetermined linear area is illuminated with light. Measurement light originating from a microparticle in the sample, such as scattered or fluorescent light, is shaped into a parallel beam by an objective lens and passes through a first and second transmission portions. The beams transmitted through these two portions are converged as first and second measurement beams onto the same straight line by a cylindrical lens. The intensity of the interference light formed by these beams is detected with a detector. Meanwhile, the light emitted from the light source and passing through the multi-flow channel without hitting the microparticle falls through the objective lens onto a non-reflection portion and does not travel toward the cylindrical lens. Accordingly, only the interference light formed by the measurement beams is allowed to fall onto the detector.
Abstract translation: 在微粒测量装置中，样品通过多通道中的每个通道，并且用光照射预定的线性区域。 来自样品中的微粒（例如散射或荧光）的测量光通过物镜成形为平行光束，并通过第一和第二透射部分。 透过这两个部分的光束通过柱面透镜作为第一和第二测量光束会聚在相同的直线上。 由检测器检测由这些光束形成的干涉光的强度。 同时，从光源发射并穿过多流通道而不撞击微粒的光通过物镜落到非反射部分上，并且不朝向柱面透镜行进。 因此，只有由测量光束形成的干涉光才能落在检测器上。
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公开(公告)号：US20240385107A1
公开(公告)日：2024-11-21
申请号：US18691179
申请日：2022-09-01
Inventor： Ichiro ISHIMARU
IPC: G01N21/35
Abstract: A spectrometry device 1 includes: a collimating optical system 15 configured to collimate object light from a measurement point a on a sample S; a photodetector 21 having a light-receiving face in which a plurality of pixels are arrayed in a predetermined direction; a conjugate plane imaging optical system 11 provided between the sample and the collimating optical system to form a plane optically conjugate with respect to a surface of the sample; an amplitude-type diffraction grating 1 disposed on the conjugate surface and having a light incident face on which the object light is incident or a light emission face from which the object light is emitted, the light incident face or the light emission face being formed by a light-shielding member made of a material having a light shielding rate higher than that of silicon in a wavelength band of the object light and provided with a plurality of openings, an optical path length differentiating optical system 16 configured to divide collimated object light into a first light beam and a second light beam to provide an optical path length difference; and an interference optical system 17 configured to cause the first light beam and the second light beam provided with the optical path length difference to interfere with each other to form an interference image on the light-receiving face along the predetermined direction.
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公开(公告)号：US20240268719A1
公开(公告)日：2024-08-15
申请号：US18285763
申请日：2022-03-30
Inventor： Ichiro ISHIMARU
IPC: A61B5/1455 , A61B5/145
CPC classification number: A61B5/1455 , A61B5/14532
Abstract: A spectral measurement device to detect measurement light including light emitted from a measurement object and to measure spectral characteristic of the light, including: a spectral optical system to disperse the measurement light; a detection unit to detect intensity of light dispersed by the spectral optical system; a spectral characteristic acquisition unit to acquire a measurement light spectral characteristic indicating a relationship between a light intensity and a wavelength of the measurement light on a basis of a detection result; a storage unit to store spectral characteristic information on possible background light, the information indicating a spectral characteristic of the possible background light, which involves a spectral sensitivity characteristic of the detection unit; and a processing unit to obtain a spectral characteristic of background light emitted from the ambience of the measurement object, from the measurement light spectral characteristic and the spectral characteristic information on the possible background light.
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公开(公告)号：US20220316945A1
公开(公告)日：2022-10-06
申请号：US17640225
申请日：2020-08-28
Inventor： Ichiro ISHIMARU
Abstract: A spectrometry device wherein light rays emitted from an object face measurement point combine into one parallel light beam by an objective lens, this is divided into a first and second light beam by a phase shifter, and the first and second light beam emit toward a light-receiving face of a photodetector while providing an optical path length difference. A light-shielding plate is arranged on a face optically conjugate the object face respective to the objective lens, and only light passed through translucent portions of the light-shielding plate is directed to the objective lens. A lateral length of each light-shielding plate translucent portion and the interval between two adjacent translucent portions are based on the objective lens focal length, the distance from the phase shifter to the photodetector light-receiving face, a photodetector pixel pitch, a pixel length, and a predetermined wavelength range of the light emitted from the measurement point.
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