公开(公告)号：US20100256938A1

公开(公告)日：2010-10-07

申请号：US12743693

申请日：2008-11-05

Applicant: Alain Rosak ,  Clémence Pierangelo

Inventor： Alain Rosak ,  Clémence Pierangelo

IPC: G01J3/45 ,  G06F19/00

CPC classification number: G01J3/45

Abstract: The invention relates according to a first aspect to an interferometric inversion method for measuring a characteristic variable of a radiation source and/or of a medium through which the radiation passes between the source and an interferometer, the interferometer being capable of generating an interferogram of the radiation by creating a finite number of optical step differences between two rays that have followed the same path between the source and the interferometer, characterized by the implementation of the steps whereby a quantity characterizing an improvement in the inversion is determined, step differences that contribute mainly to optimizing the quantity characterizing an improvement in the inversion are selected without sampling regularity constraints, and a free interferogram is generated using only the selected step differences. According to a second aspect, the invention provides an interferometer for implementing the method according to the first aspect of the invention.

Abstract translation: 本发明涉及根据第一方面的用于测量辐射源和/或辐射在源和干涉仪之间通过的介质的特征变量的干涉反演方法，所述干涉仪能够产生干涉图的干涉图 通过在源和干涉仪之间产生沿着相同路径的两条光线之间产生有限数量的光学步长的辐射，其特征在于执行步骤，由此确定表征反演改善的量，主要贡献的步差 在不采样规则约束的情况下选择表征反演改进的量的优化，并且仅使用所选择的步差产生自由干涉图。 根据第二方面，本发明提供了一种用于实现根据本发明的第一方面的方法的干涉仪。

公开(公告)号：US20100245833A1

公开(公告)日：2010-09-30

申请号：US12410409

申请日：2009-03-24

Applicant: Hemang J. Shah

Inventor： Hemang J. Shah

IPC: G01J3/45

CPC classification number: G01J3/2823 ,  G01J3/02 ,  G01J3/0264 ,  G01J3/50 ,  G01J3/506 ,  G01J2003/1282

Abstract: A system and method for measuring display quality by using a hyperspectral imager are disclosed. In one embodiment, the system comprises a hyperspectral imager configured to determine an intensity of light for a plurality of locations in a first area on a display for a plurality of spectral channels, and a processor configured to determine a measure of display quality based on the determined intensities.

Abstract translation: 公开了一种通过使用高光谱成像仪测量显示质量的系统和方法。 在一个实施例中，该系统包括高光谱成像器，该高光谱成像器被配置为确定用于多个光谱通道的显示器上的第一区域中的多个位置的光强度;以及处理器，被配置为基于 确定强度。

公开(公告)号：US20100225921A1

公开(公告)日：2010-09-09

申请号：US11521771

申请日：2006-09-15

Applicant: Mark F. Krol ,  Thomas C. Moore ,  David A. Pastel ,  Gordon M. Shedd

Inventor： Mark F. Krol ,  Thomas C. Moore ,  David A. Pastel ,  Gordon M. Shedd

IPC: G01N1/28 ,  G01N1/10 ,  G01B9/02 ,  G01J3/45 ,  G01N21/55

CPC classification number: G01N35/028 ,  G01J3/453 ,  G01N21/0332 ,  G01N21/553 ,  G01N21/7743 ,  G01N2035/00346 ,  G01N2035/00366

Abstract: A screening device and a method are described herein which can automatically handle and measure (interrogate) a plurality of sensor carriers (i.e., multiwell plates, microplates) with multi-dimensionally arranged, temperature-compensated or temperature-compensatable optical sensors, while maintaining a substantially constant temperature gradient for a relatively long period of time around the optical sensors where temperature compensation has been performed on the sensor carriers.

Abstract translation: 本文描述了一种筛选装置和方法，其可以自动地处理和询问多个传感器载体（即，多孔板，微孔板），其具有多维布置的，温度补偿的或可温度补偿的光学传感器，同时保持 在对传感器载体进行温度补偿的光学传感器周围相当长的周期内的基本恒定的温度梯度。

公开(公告)号：US07733492B1

公开(公告)日：2010-06-08

申请号：US11431936

申请日：2006-05-10

Applicant: Eric Szarmes ,  Huan Ma

Inventor： Eric Szarmes ,  Huan Ma

IPC: G01B9/02 ,  G01J3/45

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/18 ,  G01J3/453

Abstract: Systems and methods are disclosed for a modified Sagnac interferometer having a plurality of gratings that can be reflective or transmissive. The gratings allow measurement of wavelength spectra in counter-circulating beams of the interferometer. In one embodiment, diffraction geometries at each pair of neighboring gratings are configured so that diffractive and angular contributions reinforce each other at the second of the pair of gratings. In one embodiment, diffraction geometries at the gratings are configured so that the exiting beams of the interferometer satisfy the crossing condition wherein the exiting beams are on the opposite sides of a reference beam axis for a design wavelength input beam. Also disclosed are techniques for restoring the reinforcement and/or crossing conditions when these conditions are not otherwise met.

Abstract translation: 公开了用于具有可以是反射或透射的多个光栅的经修改的Sagnac干涉仪的系统和方法。 光栅允许测量干涉仪的反循环光束中的波长光谱。 在一个实施例中，每对相邻光栅处的衍射几何形状被配置为使得衍射和角度贡献在所述一对光栅中的第二对处彼此加强。 在一个实施例中，光栅处的衍射几何形状被配置为使得干涉仪的出射光束满足交叉条件，其中出射光束在设计波长输入光束的参考光束轴线的相对侧上。 还公开了当不满足这些条件时恢复加强和/或交叉条件的技术。

公开(公告)号：US20100097613A1

公开(公告)日：2010-04-22

申请号：US12524335

申请日：2008-01-23

Applicant: Heikki Saari

Inventor： Heikki Saari

IPC: G01J3/26 ,  G01B9/02 ,  G01J3/45

CPC classification number: G01J3/10 ,  G01J3/26 ,  G01J3/433 ,  G02B26/001

Abstract: The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). In accordance with the invention the spectrometer has means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400), and the spectrometer has means for detecting (300, 400) and demodulating (306, 307) multiple pass bands simultaneously.

Abstract translation: 本发明涉及用于材料分析的光谱仪和用于光谱仪的控制方法。 光谱仪包括由具有不同中心波长的多个单一辐射源（141）形成的用于产生测量信号的辐射源（140），包含待分析材料的测量对象（100），至少一个电可调节法布里 - 珀罗 滤波器（120,220），用于通过至少两个通带对测量信号进行带通滤波;以及检测器（300,400），用于检测从测量对象（100）接收的所述滤波的测量信号。 根据本发明，光谱仪具有用于调制单个辐射源（141）和对应装置（307,309）中的每一个的装置（312），用于解调检测到的信号，使得可以将每个单个辐射源的信号与每个辐射源 另一个在检测器（300,400）中，并且光谱仪具有同时检测（300,400）和解调（306,307）多个通带的装置。

公开(公告)号：US20100079765A1

公开(公告)日：2010-04-01

申请号：US12558874

申请日：2009-09-14

Applicant: Johannes Kraus ,  Alois Herkommer ,  Bernhard Weigl ,  Michel Le Maire ,  Holger Muenz

Inventor： Johannes Kraus ,  Alois Herkommer ,  Bernhard Weigl ,  Michel Le Maire ,  Holger Muenz

IPC: G01J3/45

CPC classification number: G01J3/26 ,  G01J3/36

Abstract: A spectrometer arrangement for measuring a spectrum of a light beam emitted by a narrowband light source, such as a bandwidth-narrowed laser, includes at least one etalon, a beam splitter for splitting the light beam into a first partial beam and a second partial beam, one or more optical directing elements for directing the first partial beam n times and the second partial beam (n+k) times through the at least one etalon, wherein n and k are integers ≧1. The spectrometer arrangement further has at least one light-sensitive detector and an evaluation device for evaluating the spectra—recorded by the at least one detector—of the first partial beam that has passed through the at least one etalon n times and of the second partial beam that has passed through the at least one etalon (n+k) times in order to determine the light spectrum corrected for the apparatus function of the at least one etalon.

Abstract translation: 用于测量由窄带光源（例如带宽变窄的激光器）发射的光束的光谱的光谱仪装置包括至少一个标准具，用于将光束分成第一部分光束的分束器和第二部分光束 一个或多个用于通过至少一个标准具指导第一部分光束n次和第二部分光束（n + k）的光学引导元件，其中n和k是整数≥1。 光谱仪布置还具有至少一个光敏检测器和评估装置，用于评估已经通过至少一个标准具的第一部分光束的至少一个检测器记录的光谱n次和第二部分光束 已经通过至少一个标准具（n + k）次的光束，以便确定校正了至少一个标准具的装置功能的光谱。

公开(公告)号：US07652769B2

公开(公告)日：2010-01-26

申请号：US11966057

申请日：2007-12-28

Applicant: Ziran Zhao ,  Zhiqiang Chen ,  Yingxin Wang ,  Bing Feng ,  Li Zhang ,  Zhuoyan Liu ,  Yinpeng Liang

Inventor： Ziran Zhao ,  Zhiqiang Chen ,  Yingxin Wang ,  Bing Feng ,  Li Zhang ,  Zhuoyan Liu ,  Yinpeng Liang

IPC: G01B9/02 ,  G01J3/45

CPC classification number: G01N21/3586 ,  G01N21/3577 ,  G01N2201/1293

Abstract: The present invention relates to a method for assessing the purity of vegetable oils by means of THz time-domain spectroscopy, comprising the steps of: measuring the THz time-domain spectra of standard vegetable oils to establish a spectral database; measuring the THz time-domain spectrum of vegetable oil to be detected; analyzing the purity of the detected vegetable oil based on the pre-built database. The present invention also relates to an apparatus for assessing purity of vegetable oil by means of THz time-domain spectroscopy, comprising: spectrum measuring device for measuring time-domain waveforms of THz pulses before and after transmitting the vegetable oil held in a container by transmission approach, or directly measuring time-domain waveforms of THz pulses before and after reflecting from the vegetable oil by reflection approach; and data processing device for extracting physical parameters of the vegetable oil in THz region according to the time-domain waveforms. Compared with the prior art, the method according to the present invention is easy, rapid and quantitative.

Abstract translation: 本发明涉及通过THz时域光谱法评估植物油的纯度的方法，包括以下步骤：测量标准植物油的THz时域谱以建立光谱数据库; 测量要检测的植物油的THz时域谱; 基于预建的数据库分析检测出的植物油的纯度。 本发明还涉及通过太赫兹时域光谱法评价植物油的纯度的装置，其特征在于，包括：频谱测量装置，用于测量传输通过传输方式容纳在容器中的植物油之前和之后的THz脉冲的时域波形 或通过反射方法直接测量从植物油反射之前和之后的太赫兹脉冲的时域波形; 以及根据时域波形提取太赫兹区植物油物理参数的数据处理装置。 与现有技术相比，根据本发明的方法容易，快速和定量。

公开(公告)号：US07643156B2

公开(公告)日：2010-01-05

申请号：US11663739

申请日：2006-06-14

Applicant: Masayuki Naya ,  Takeharu Tani

Inventor： Masayuki Naya ,  Takeharu Tani

IPC: G01B9/02 ,  G01J3/45 ,  G01N21/41 ,  G01N21/43 ,  G01N21/00

CPC classification number: G01N21/253 ,  B82Y20/00 ,  C25D1/10 ,  C25D11/04 ,  G01N21/45 ,  G01N21/554 ,  G01N2021/7773 ,  G01N2021/7776 ,  G01N2021/7779 ,  G01N2021/7789 ,  G02B17/0856 ,  G02B19/0028 ,  G02B19/0085

Abstract: A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S1) includes the following from measuring light (L1) input side in the order listed below: a first reflector (10) having semi-transmissive and semi-reflective properties; a translucent body (20); and a second reflector (30) having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector (10) and/or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L1) are changed by the optical properties including the absorption properties, the output light (L2) is outputted from the first reflector (10) and/or second reflector (30), and the physical properties of the output light (L2) that vary according to the optical properties are detected.

Abstract translation: 一种新型和新颖的传感器，具有检测灵敏度高的简单结构。 传感器（S1）包括以下顺序的测量光（L1）输入侧：具有半透射和半反射特性的第一反射器（10） 半透明体（20）; 以及具有完美的反射特性或半透射和半反射特性的第二反射器（30）。 第一反射器（10）和/或第二反射器与样品接触，并且平均复合折射率随样品而变化。 通过这些组分产生用于吸收具有特定波长的光的吸收性质，通过包括吸收特性的光学特性改变测量光（L1）的性质，从第一反射器（10）输出输出光（L2） 和/或第二反射器（30），并且检测根据光学特性而变化的输出光（L2）的物理性质。

公开(公告)号：US07630081B2

公开(公告)日：2009-12-08

申请号：US11622815

申请日：2007-01-12

Applicant: Gregg Ressler ,  Donald W. Sting

Inventor： Gregg Ressler ,  Donald W. Sting

IPC: G01J3/45 ,  G01N21/00 ,  G01B9/02

CPC classification number: G01J3/4535 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0286

Abstract: An interferometer for Fourier transform infrared spectroscopy includes a fixed assembly including a housing, a beam splitter, and a mirror fixedly positioned relative to each other. A movable assembly includes a housing, a mirror, and a motor coil, fixedly positioned relative to each other. A first flat spring has an opening for providing an unobstructed optical path of radiation therethrough. A first end of the first flat spring is secured to the fixed assembly and a second end of the first flat spring is secured to the movable assembly for providing movement of the movable assembly relative to the fixed assembly via the first flat spring. An optical relationship between the beam splitter, the mirror of the fixed assembly, and the mirror of the movable assembly is maintained independent of a distance between the movable assembly and the fixed assembly.

Abstract translation: 用于傅里叶变换红外光谱的干涉仪包括固定组件，其包括壳体，分束器和相对于彼此固定定位的反射镜。 可移动组件包括相对于彼此固定地定位的壳体，反射镜和电动机线圈。 第一扁平弹簧具有用于提供通过其的无障碍的光路径的开口。 第一扁平弹簧的第一端被固定到固定组件上，并且第一平板弹簧的第二端固定到可移动组件，以通过第一平板弹簧提供可移动组件相对于固定组件的运动。 分束器，固定组件的反射镜和可移动组件的反射镜之间的光学关系保持独立于可移动组件和固定组件之间的距离。

公开(公告)号：US20090262359A1

公开(公告)日：2009-10-22

申请号：US12441686

申请日：2007-06-22

Applicant: Tomasz Bajraszewski ,  Maciej Wojtkowski ,  Anna Szkulmowska ,  Piotr Targowski ,  Andrzej Kowalczyk ,  Pawel Wojdas ,  Grzegorz Slusarczyk

Inventor： Tomasz Bajraszewski ,  Maciej Wojtkowski ,  Anna Szkulmowska ,  Piotr Targowski ,  Andrzej Kowalczyk ,  Pawel Wojdas ,  Grzegorz Slusarczyk

IPC: G01J3/45 ,  G01B9/02

CPC classification number: G01B9/02044 ,  A61B3/102 ,  A61B5/0066 ,  A61B5/0073 ,  G01B9/02008 ,  G01B9/02072 ,  G01B9/02083 ,  G01B9/02091 ,  G01B2290/20 ,  G01B2290/25 ,  G01N21/4795

Abstract: In an apparatus for imaging of objects by applying optical frequency domain tomography and provided with an adjusting system for setting a relative position of photosensitive elements (174) and a spectrum image (273), the adjusting system is an automatically controlled device causing a relative displacement of at least one photosensitive element (174) of the detection device (173) of the spectrum and the spectrum image (273) between each other. The adjusting system comprises at least one actuator (14, 16) acting on the dispersion device (171) and/or the set of optical elements (172) and/or the detection device (173) and movement of which causes the relative displacement between each other of at least one photosensitive element (174) of the detection device (173) of the spectrum and the spectrum image (273) of the resultant light beam (270).

Abstract translation: 在通过应用光学频域层析成像并设置有用于设置光敏元件（174）和光谱图像（273）的相对位置的调节系统的用于物体成像的装置中，调节系统是引起相对位移的自动控制装置 的光谱的检测装置（173）的至少一个感光元件（174）和彼此之间的光谱图像（273）。 调节系统包括作用在分散装置（171）和/或一组光学元件（172）和/或检测装置（173）上的至少一个致动器（14,16），并且其运动导致两者之间的相对位移 光谱的检测装置（173）的至少一个感光元件（174）和所得到的光束（270）的光谱图像（273）彼此相对。