Multi-layered high density connections
    11.
    发明授权
    Multi-layered high density connections 失效
    多层高密度连接

    公开(公告)号:US06721187B2

    公开(公告)日:2004-04-13

    申请号:US09811101

    申请日:2001-03-16

    Abstract: A multi-layer electronic structure includes an increased capacity for the attachment of active or passive devices thereto. This is achieved by creating a three-dimensional grid of connection points to electrically couple active or passive surface mounted devices to edge mounted devices. The grid pattern is useful with any laminate including circuit cards, ceramic modules and flexible circuits. The variety of electrical devices that may be connected to the cross-sectional substrate includes, but is not limited to, chips such as semiconductor chips, diodes, resistors, capacitors and printed wiring boards. The structure can be used to more rapidly pass data, such as optical data that is transmitted from a spectroscope through a VCSEL laser and the electronic structure to a computer for diagnostics and analysis. A stepped arrangement of circuitized laminates is described for this purpose.

    Abstract translation: 多层电子结构包括用于将主动或无源装置附接到其上的增加的容量。 这通过创建连接点的三维网格来将主动或被动表面安装的装置电耦合到边缘安装的装置来实现。 网格图案对于包括电路卡,陶瓷模块和柔性电路的任何层压板都是有用的。 可以连接到横截面基板的各种电气设备包括但不限于诸如半导体芯片,二极管,电阻器,电容器和印刷线路板的芯片。 该结构可用于更快速地传递数据,例如通过VCSEL激光器从分光镜传输的光学数据,以及用于诊断和分析的电子结构到计算机。 为此目的描述了电路化层压板的阶梯式布置。

    Optical detection and measurement system

    公开(公告)号:US06657219B2

    公开(公告)日:2003-12-02

    申请号:US09781812

    申请日:2001-02-12

    CPC classification number: G01B11/028 G01B11/0616

    Abstract: An optical detection and measurement system for selectively detecting the plane of the reflective surfaces of a workpiece. A laser source provides a low power, single wavelength collimated beam of light which is directed onto a workpiece. The beam is passed through a converging lens to a reflected focus on a quad detector. The light beams reflected from the workpiece pass through a diverging lens to the quad detector. The non-diverging optical axis center of the diverging lens is aligned with the center of the quad detector so that a reflected beam passing through the non-diverging optical axis center of the diverging lens creates equal photocurrent outputs from each of the four photosensitive elements of the quad detector to produce a null condition. Where the workpiece is made up of translucent or transparent layers which produce multiple reflected beams, reflected beams from surfaces other than the surface of interest are deflected away from the active surface of the quad detector by the diverging lens. The selectivity of beam detection of the system allows detection of the location individual reflective surface planes of the workpiece by positioning the workpiece so that each of the reflective surfaces individually pass their reflected beams through the non-diverging optical axis center of the diverging lens. Storing a numerical value indicative of the location of these planes permits calculation of layer and workpiece thickness.

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