公开(公告)号：US20220018712A1

公开(公告)日：2022-01-20

申请号：US17296282

申请日：2019-11-22

Applicant: Leica Microsystems Inc.

Inventor： Robert H. Hart ,  Peter Strobel

IPC: G01J3/02 ,  G02B9/10 ,  G02B27/30 ,  G01B9/02 ,  G01J3/28 ,  G01J3/45

Abstract: Spectrometer systems are provided including a detector array; an imaging lens assembly coupled to the detector array, the imaging lens assembly including a first element of positive optical power followed by a second element of negative optical power and a positive optical power element split into two opposing identical singlets; a dispersive element coupled to the imaging lens assembly; and a fixed focus collimator assembly coupled to the dispersive element. Related imaging lens assemblies and collimator assemblies are also provided.

公开(公告)号：US20040036881A1

公开(公告)日：2004-02-26

申请号：US10225699

申请日：2002-08-22

Applicant: Leica Microsystems Inc.

Inventor： Keshav D. Sharma ,  Robert C. Atkinson ,  Richard W. Lesch

IPC: G01N021/55

CPC classification number: G01N21/553

Abstract: A method and apparatus for determining a characteristic of a substance is disclosed. The apparatus comprises a light source, a prism, a sensor chip located on the prism, focusing optics located between the light source and the prism, a detector, collimating optics located between the prism and the detector, and calculation means for determining the characteristic of the substance. The sensor chip comprises a metallic film and a transparent substance. The metallic film is operatively arranged to reflect light from the light source. The transparent substance comprises a material having an index of refraction matched to an index of refraction of the prism. The sensor chip is operatively arranged to receive a sample of the substance.

Abstract translation: 公开了一种用于确定物质特征的方法和装置。 该装置包括光源，棱镜，位于棱镜上的传感器芯片，位于光源和棱镜之间的聚焦光学元件，位于棱镜与检测器之间的检测器，准直光学元件，以及用于确定 物质。 传感器芯片包括金属膜和透明物质。 金属膜可操作地布置成反射来自光源的光。 透明物质包括具有与棱镜的折射率相匹配的折射率的材料。 传感器芯片可操作地布置成接收物质的样品。

公开(公告)号：US20030206291A1

公开(公告)日：2003-11-06

申请号：US10139268

申请日：2002-05-06

Applicant: Leica Microsystems Inc.

Inventor： Michael J. Byrne ,  Keshav D. Sharma ,  Robert C. Atkinson

IPC: G01N021/41

CPC classification number: G01N21/43 ,  G01N21/553

Abstract: An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. First and second linear scanned arrays are positioned on opposite sides of a meridional plane of the optical configuration for respectively detecting the first and second partial beams. Thus, differential measurements are possible based on signal information from the arrays. Embodiments for critical angle and surface plasmon resonance refractive index measurements are disclosed. The disclosure also relates to methods for measuring a difference in refractive index between a first sample and a second sample in accordance with the described optical configuration embodiments.

Abstract translation: 用于测量第一样品和第二样品之间的折射率差异的光学配置包括由照明光束对称地照射的划分的第一和第二光学界面，以提供由第一和第二样品的折射率限定的第一和第二部分光束， 分别。 第一和第二线性扫描阵列位于光学配置的子午平面的相对侧上，用于分别检测第一和第二部分光束。 因此，基于来自阵列的信号信息，差分测量是可能的。 公开了用于临界角和表面等离子共振折射率测量的实施例。 本公开还涉及根据所述光学配置实施例测量第一样品和第二样品之间的折射率差的方法。

公开(公告)号：US20030088169A1

公开(公告)日：2003-05-08

申请号：US09992875

申请日：2001-11-06

Applicant: Leica Microsystems Inc.

Inventor： Christopher J. Percival ,  Douglas H. Hoover ,  David A. Luce

IPC: A61B003/16

CPC classification number: A61B3/0058 ,  A61B3/0091 ,  A61B3/152 ,  A61B3/165 ,  A61B2560/0456

Abstract: A hand-held non-contact tonometer comprises a housing having a handle portion for enclosing a rechargeable D.C. power source and an upper head portion for enclosing alignment and tonometric measurement systems of the tonometer. An operator can directly view the patient's eye along an optical axis extending through the head portion of the housing, and an instructional display image is superimposed with the directly viewed image of the eye to guide the operator in X-Y-Z alignment based on data supplied by an afocal position detection system. A transceiver for wireless data exchange and a recharging support stand are also provided.

Abstract translation: 手持式非接触式眼压计包括具有用于封闭可再充电直流电源的手柄部分和用于封装眼压计的对准和测量计量系统的上部头部的壳体。 操作者可以沿着延伸穿过外壳头部的光轴直接观察患者的眼睛，并且将指导性显示图像与眼睛的直接观看图像叠加，以基于无焦点提供的数据引导操作者进行XYZ对准 位置检测系统 还提供了用于无线数据交换的收发器和充电支持支架。

公开(公告)号：US20020186364A1

公开(公告)日：2002-12-12

申请号：US09877591

申请日：2001-06-08

Applicant: Leica Microsystems Inc.

Inventor： Kyle R. Bleyle

IPC: G01N021/41

CPC classification number: G01N21/4133

Abstract: A hand-held automatic refractometer comprises a completely fluid-sealed housing enclosing a wireless transmitter for transmitting digital measurement data to a remote computer having a corresponding receiver connected thereto. The refractometer housing protects the internal components, including the transmitter, from damage caused by test fluids and cleaning fluids.

Abstract translation: 手持式自动折射计包括完全流体密封的壳体，其包围无线发射器，用于将数字测量数据传输到具有与其相连接的相应接收器的远程计算机。 折射仪外壳保护内部部件，包括变送器，免受测试液和清洗液造成的损坏。

公开(公告)号：US20020154105A1

公开(公告)日：2002-10-24

申请号：US10109376

申请日：2002-03-28

Applicant: Leica Microsystems Inc.

Inventor： Vincent Vaccarelli

IPC: G09G005/00

CPC classification number: G02B21/367 ,  G09B5/08 ,  G09B5/10 ,  G09B5/12 ,  G09B5/14 ,  G09B19/00 ,  G09B23/22 ,  G09B23/24 ,  G09B23/28 ,  H04N5/38 ,  H04N5/74 ,  H04N9/12

Abstract: A microscopy laboratory system for efficient instruction is disclosed. The system comprises a plurality of student microscopes each equipped with a camera for generating an image signal representing a student view image of at least a portion of the field of view of the student microscope, multiplexed control means connected by video cables or wireless technology to the cameras to provide a composite instruction image signal based on student view images from one or more selected microscopes, and a projection unit or other public display for presenting the instruction image to the students in the laboratory. An instructor microscope can also be coupled into the system, and a display image marker is preferably linked to the multiplexed control means for inserting instructor annotations into the displayed instruction image.

公开(公告)号：US20230148858A1

公开(公告)日：2023-05-18

申请号：US17904832

申请日：2021-03-09

Applicant: Hansford HENDARGO ,  Leica Microsystems Inc.

Inventor： Hansford Hendargo

IPC: A61B3/00 ,  A61B3/10 ,  A61B3/13 ,  G06T7/00

CPC classification number: A61B3/0025 ,  A61B3/13 ,  A61B3/102 ,  G06T7/0012 ,  G06T2207/10056 ,  G06T2207/10101 ,  G06T2207/30041

Abstract: A system for identifying presence of a conjugate in an image comprising one or more processors and one or more storage devices is provided. The system is configured to acquire spectral data associated with a sample to be imaged. Dispersion coefficients are optimized for acquired spectral data. A corrective phase function is calculated using the optimized dispersion coefficients. A negative corrective phase function is applied to a signal to provide a resulting image. It is determined if the resulting image has degraded signal strength or an enhanced signal strength relative to an original image. A reference arm shift is calculated if it is determined that the resulting image has enhanced signal strength. A position of a reference arm of the system is adjusted based on the calculated reference arm shift to move a conjugate image out of view.

公开(公告)号：US11067786B2

公开(公告)日：2021-07-20

申请号：US16435430

申请日：2019-06-07

Applicant: Leica Microsystems Inc.

Inventor： Shih-Jong James Lee ,  Hideki Sasaki

IPC: G06N3/02 ,  G02B21/36 ,  G06T5/00 ,  G06N3/08 ,  G06N20/00

Abstract: A computerized method of artifact regulation in deep model training for image transformation first performs one cycle of deep model training by computing means using a training data, a validation data, a similarity loss function, an artifact regulation loss function and a weight of loss functions to generate similarity loss and artifact regulation loss and a deep model. The method then performs a training evaluation using the similarity loss and the artifact regulation loss thus obtained to generate a training readiness output. Then, depending upon the training readiness output, the method may be terminated if certain termination criteria are met, or may perform another cycle of deep model training and training evaluation, with or without updating the weight, until the termination criteria are met. Alternatively, the deep model training in the method may be a deep adversarial model training or a bi-directional deep adversarial training.

公开(公告)号：US20040120030A1

公开(公告)日：2004-06-24

申请号：US10328322

申请日：2002-12-23

Applicant: Leica Microsystems Inc., EAI

Inventor： Scott W. Parks

IPC: G02B021/00

CPC classification number: G02B21/14

Abstract: The present invention broadly comprises a device, such as a slider, for performing phase contrast microscopy, the device containing a plurality of at least three phase contrast annuli. The slider is received into a microscope condenser mounted under a microscope stage and that is adapted to receive the device and align the device such that a phase contrast annulus is aligned with an appropriate microscope objective phase ring. The invention also comprises printed or engraved indicators or other markings indicating whether the bright field aperture or a particular phase contrast annulus is in position in the illumination path of the microscope. The invention further comprises a device for preventing the removal of the device from the condenser.

公开(公告)号：US20040075827A1

公开(公告)日：2004-04-22

申请号：US10274588

申请日：2002-10-21

Applicant: Leica Microsystems Inc.

Inventor： Michael Byrne

IPC: G01N021/41

CPC classification number: G01N21/03 ,  G01N21/43

Abstract: An apparatus for performing optical measurements comprising a first prism having a first sample surface, the first sample surface operatively arranged to receive a first sample, the first sample surface operatively arranged to reflect incident light, a first detector operatively arranged to measure intensity of light reflected from the first sample surface of said first prism, a second prism having a second sample surface, the second sample surface operatively arranged to receive a second sample, the second sample surface operatively arranged to reflect incident light, a second detector operatively arranged to measure intensity of light reflected from the second sample surface of the second prism, and, means to determine an optical characteristic based on the intensities of light measured by said first and the second detectors. The invention also includes a method for performing optical measurements.

Abstract translation: 一种用于执行光学测量的装置，包括具有第一样品表面的第一棱镜，第一样品表面可操作地布置成接收第一样品，第一样品表面可操作地布置成反射入射光;第一检测器，可操作地布置成测量反射的光强度 从所述第一棱镜的第一样品表面，具有第二样品表面的第二棱镜，所述第二样品表面可操作地布置成接收第二样品，所述第二样品表面可操作地布置成反射入射光;第二检测器，可操作地布置成测量强度 从第二棱镜的第二样品表面反射的光，以及基于由所述第一和第二检测器测量的光的强度来确定光学特性的装置。 本发明还包括用于执行光学测量的方法。