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公开(公告)号:US20220411918A1
公开(公告)日:2022-12-29
申请号:US17361231
申请日:2021-06-28
Applicant: Applied Materials, Inc.
Inventor: Chandan Das , Susmit Singha Roy , Bhaskar Jyoti Bhuyan , John Sudijono , Abhijit Basu Mallick , Mark Saly
IPC: C23C16/30 , C23C16/06 , C23C16/448 , C23C16/04
Abstract: Transition metal dichalcogenide films and methods for depositing transition metal dichalcogenide films on a substrate are described. Methods for converting transition metal oxide films to transition metal dichalcogenide films are also described. The substrate is exposed to a precursor and a chalcogenide reactant to form the transition metal dichalcogenide film. The exposures can be sequential or simultaneous.
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公开(公告)号:US11473198B2
公开(公告)日:2022-10-18
申请号:US16752618
申请日:2020-01-25
Applicant: Applied Materials, Inc.
Inventor: Thomas Knisley , Mark Saly
IPC: C07F5/00 , C23C16/455 , C09D1/00 , C23C16/18 , C23C16/32 , C23C16/44 , C23C16/38 , C23C16/30 , C23C16/40 , C23C16/34 , C23C16/42 , C23C16/36 , C08F4/54 , C08F136/02
Abstract: Described are lanthanide-containing metal coordination complexes which may be used as precursors in thin film depositions, e.g. atomic layer deposition processes. More specifically, described are homoleptic lanthanide-aminoalkoxide metal coordination complexes, lanthanide-carbohydrazide metal coordination complexes, and lanthanide-diazadiene metal coordination complexes. Additionally, methods for depositing lanthanide-containing films through an atomic layer deposition process are described.
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公开(公告)号:US20220259734A1
公开(公告)日:2022-08-18
申请号:US17176984
申请日:2021-02-16
Applicant: Applied Materials, Inc.
Inventor: Bhaskar Jyoti Bhuyan , Mark Saly , Lakmal C. Kalutarage , Thomas Knisley
Abstract: Methods of forming a metal film having a metal halide with a reducing agent are disclosed. The reducing agent, the reducing agent includes a group IV element containing heterocyclic compound, a radical initiator, an alkly alane, a diborene species and/or a Sn(II) compound.
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公开(公告)号:US11371136B2
公开(公告)日:2022-06-28
申请号:US16647794
申请日:2018-09-19
Applicant: Applied Materials, Inc.
Inventor: Bhaskar Jyoti Bhuyan , Mark Saly , David Thompson , Lakmal C. Kalutarage , Rana Howlader
IPC: H01L21/31 , C23C16/04 , C23C16/455 , H01L21/02
Abstract: Methods of depositing a film selectively onto a first substrate surface relative to a second substrate surface are described. The methods include exposing a substrate to a blocking molecule to selectively deposit a blocking layer on the first surface. The blocking layer is exposed to a polymer initiator to form a networked blocking layer. A layer is selectively formed on the second surface. The blocking layer inhibits deposition on the first surface. The networked layer may then optionally be removed.
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公开(公告)号:US20210217610A1
公开(公告)日:2021-07-15
申请号:US17196601
申请日:2021-03-09
Applicant: Applied Materials, Inc.
Inventor: Bhaskar Jyoti Bhuyan , Mark Saly , David Thompson , Li-Qun Xia
IPC: H01L21/02 , C23C16/455 , C23C16/02 , C23C16/40
Abstract: Methods for depositing metal oxide layers on metal surfaces are described. The methods include exposing a substrate to separate doses of a metal precursor, which does not contain metal-oxygen bonds, and an alcohol. These methods do not oxidize the underlying metal layer.
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公开(公告)号:US20200234943A1
公开(公告)日:2020-07-23
申请号:US16632164
申请日:2018-07-17
Applicant: Applied Materials, Inc.
Inventor: Bhaskar Jyoti Bhuyan , Mark Saly , Lakmal C. Kalutarage , Thomas Knisley
IPC: H01L21/02 , H01L21/311 , C23C16/30 , C23C16/455 , C23C16/02
Abstract: Methods of enhancing selective deposition are described. In some embodiments, a blocking layer is deposited on a metal surface before deposition of a dielectric. In some embodiments, a metal surface is functionalized to enhance or decrease its reactivity.
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公开(公告)号:US20200216949A1
公开(公告)日:2020-07-09
申请号:US16647794
申请日:2018-09-19
Applicant: Applied Materials, Inc.
Inventor: Bhaskar Jyoti Bhuyan , Mark Saly , David Thompson , Lakmal C. Kalutarage , Rana Howlader
IPC: C23C16/04 , C23C16/455 , H01L21/02
Abstract: Methods of depositing a film selectively onto a first substrate surface relative to a second substrate surface are described. The methods include exposing a substrate to a blocking molecule to selectively deposit a blocking layer on the first surface. The blocking layer is exposed to a polymer initiator to form a networked blocking layer. A layer is selectively formed on the second surface. The blocking layer inhibits deposition on the first surface. The networked layer may then optionally be removed.
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公开(公告)号:US20200071825A1
公开(公告)日:2020-03-05
申请号:US16550523
申请日:2019-08-26
Applicant: Applied Materials, Inc.
Inventor: Lakmal C. Kalutarage , Jeffrey W. Anthis , Mark Saly , David Thompson , Yongjing Lin , Shih Chung Chen
IPC: C23C16/455 , C23C16/32 , C23C28/00
Abstract: Methods of depositing a metal carbide film by exposing a substrate surface to a halide precursor and an aluminum reactant are described. The halide precursor comprises a compound of general formula (I) MXyRn, wherein M is a metal, X is a halogen selected from Cl, Br, F or I, y is from 1 to 6, R is selected from alkyl, CO, and cyclopentadienyl, and n is from 0 to 6. The aluminum reactant comprises a compound of general formula (II) Al(CH2AR1R2R3)3, wherein A is C, Si, or Ge, each of R1, R2, and R3 is independently alkyl or comprises substantially no β-hydrogen.
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公开(公告)号:US20200002814A1
公开(公告)日:2020-01-02
申请号:US16456964
申请日:2019-06-28
Applicant: Applied Materials, Inc.
Inventor: Thomas Knisley , Mark Saly , David Thompson
IPC: C23C16/455 , C09D1/00 , C01G19/02 , C01B21/06 , C01B32/914 , C01B35/04 , C01B33/06 , C23C16/30
Abstract: Tin containing precursors and methods of forming tin-containing thin films are described. The tin precursor has a tin-diazadiene bond and is homoleptic or heteroleptic. A suitable reactant is used to provide one of a metallic tin film or a film comprising one or more of an oxide, nitride, carbide, boride and/or silicide. Methods of forming ternary materials comprising tin with two or more of oxygen, nitrogen, carbon, boron, silicon, titanium, ruthenium and/or tungsten are also described.
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公开(公告)号:US10354861B2
公开(公告)日:2019-07-16
申请号:US15804503
申请日:2017-11-06
Applicant: Applied Materials, Inc.
Inventor: Mark Saly , David Thompson , Lakmal C. Kalutarage
IPC: C23C16/30 , H01L21/02 , C23C16/56 , C23C16/455
Abstract: Methods for the deposition of a SiCON film by molecular layer deposition using a multi-functional amine and a silicon containing precursor having a reactive moiety.
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