公开(公告)号：US20170307517A1

公开(公告)日：2017-10-26

申请号：US15612564

申请日：2017-06-02

Applicant: Hinds Instruments, Inc.

Inventor： John Freudenthal ,  Andy Leadbetter ,  Baoliang Wang

IPC: G01N21/23 ,  G01N21/21 ,  G01J4/00

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.