Refractive scanning interferometer
    11.
    发明授权

    公开(公告)号:US11668603B2

    公开(公告)日:2023-06-06

    申请号:US17339067

    申请日:2021-06-04

    Abstract: Embodiments are disclosed relating to a refractively-scanning interferometer comprising an aperture that receives an incident light beam at a receiving angle, a beam splitter configured to split the incident light beam into a first beam and a second beam, a first and a second reflector arranged to reflect the first beam and second beam, respectively, towards a combining optical element, and a refractive Optical Path Difference (rOPD) assembly interposed between the beam splitter and the first reflector, wherein the rOPD Assembly refracts the first light beam an even number of times with induced phase discrepancy being a vector sum of a first phase discrepancy induced by a first refraction and a second phase discrepancy induced by a second refraction, the rOPD Assembly being configured such that the first phase discrepancy is substantially opposite in direction to the second phase discrepancy, a portion of the first and second phase discrepancies cancelling one another out to decrease magnitude of the phase discrepancy.

    Mach-Zehnder interferometer having a doubly-corrugated spoofed surface plasmon polariton waveguide
    12.
    发明授权
    Mach-Zehnder interferometer having a doubly-corrugated spoofed surface plasmon polariton waveguide 有权
    马赫 - 曾德干涉仪具有双波纹欺骗表面等离子体激元波导

    公开(公告)号:US09557223B2

    公开(公告)日:2017-01-31

    申请号:US14315933

    申请日:2014-06-26

    Abstract: A Mach-Zehnder interferometer (MZI) structure based on a doubly-corrugated spoofed surface plasmon polariton (DC-SSPP) waveguide is presented. The dependence of phase change on the dielectric loading of the DC-SSPP structure causes the output from both arms to interfere and enhance features on the transmission spectrum of the MZI. The proposed MZI structure can be used for tag-free bio-molecular sensing. The highly localized electro-magnetic field at frequencies close to SSPP resonance is shown to reduce the sample amount needed to produce interference patterns without affecting the selectivity of the sensing structure.

    Abstract translation: 提出了基于双波纹欺骗表面等离子体激元(DC-SSPP)波导的马赫 - 曾德干涉仪(MZI)结构。 相变对DC-SSPP结构的介电负载的依赖性导致两臂的输出干扰和增强MZI透射光谱上的特征。 所提出的MZI结构可用于无标签生物分子检测。 显示出接近SSPP共振频率的高度局部化的电磁场,以减少产生干涉图案所需的样品量,而不影响感测结构的选择性。

    Apparatus for measuring the duration of single optical radiation pulses
    13.
    发明授权
    Apparatus for measuring the duration of single optical radiation pulses 失效
    用于测量单个光辐射脉冲的持续时间的装置

    公开(公告)号:US5068525A

    公开(公告)日:1991-11-26

    申请号:US566678

    申请日:1990-08-13

    CPC classification number: G04F13/026 G01J11/00 G01J2009/0288

    Abstract: An apparatus for measuring the duration of single short optical radiation lses, particularly laser radiation pulses, by means of autocorrelation and two-photon ionization, contains a Mach-Zehnder interferometer (BS1, BS2, M1, M2) as beam splitter means for generating from a single input radiation pulse (10) two coherent component pulses (14, 16) propagating along two component beam paths (18, 20) each of which contains a section (18a20a) passing through a meausring zone (22) where they overlap, further a two-photon ionization detector having a measuring zone (22) and collector electrode means (36) and counter-electrode means (38) at which an electric output signal is available depending on the number of charge carriers generated in the measuring zone when the component beam pulses overlap, and a measuring system connected to the electrode means (36, 38). The collector electrode means (36) contains a number of strip-type collector electrodes which are to each other and electrically separated from each other and are located in a plane essentially parallel to the two component beam paths ( 18a, 20a) in the measuring zone and are oriented in the longitudinal direction essentially in the direction of the component beam path sections (18a, 22a) passing through the measuring zone (22).

    Abstract translation: 用于通过自相关和双光子电离测量单个短光辐射脉冲,特别是激光辐射脉冲的持续时间的装置包含作为分束器装置的马赫 - 策德尔干涉仪(BS1,BS2,M1,M2),用于从 单个输入辐射脉冲(10)沿着两个分量光束路径(18,20)传播的两个相干分量脉冲(14,16),每个分量光束路径包含通过偏移区域(22)的部分(18a + B,20a),其中 它们与另一个具有测量区域(22)和集电极电极装置(36)和对电极装置(38)的双光子电离检测器相互重叠,在该区域可根据在其中产生的电荷载体的数量可用电输出信号 测量区域,以及连接到电极装置(36,38)的测量系统。 集电极电极装置(36)包含彼此相互并且彼此电分离并且位于基本上平行于测量区域中的两个分量光束路径(18a,20a)的平面中的多个条状集电极电极 并且在纵向方向上基本上在通过测量区域(22)的分量光束路径部分(18a,22a)的方向上定向。

    Optical fiber sensor for measuring physical properties of liquids
    14.
    发明授权
    Optical fiber sensor for measuring physical properties of liquids 失效
    用于测量液体物理性能的光纤传感器

    公开(公告)号:US5047626A

    公开(公告)日:1991-09-10

    申请号:US460435

    申请日:1990-01-03

    Abstract: A physical property of a liquid or of any optical fiber is measured using optical fiber interferometer. A conductive material is disposed upon the surface of a region of a light transmitting optical fiber and the region having the conductive material is disposed in the liquid. Light energy is applied to one end of the fiber and transmitted light is received at the other end of the fiber. Electrical energy is applied to the conductive material disposed upon the surface of the fiber to heat the region of the fiber and cause a change in the optical path length of the light transmitted through the fiber. The physical property of the liquid or optical fiber is determined in accordance with the change in the optical path length of the received light caused by applying the electrical energy to the conductive material. A series of short energy pulses is provided and the average phase change is determined. The conductive material is gold and it encircles the fiber. The gold may be disposed on the jacket of the fiber or the jacket may be removed before disposing the gold.

    Abstract translation: 使用光纤干涉仪测量液体或任何光纤的物理性质。 导电材料设置在透光光纤的区域的表面上,并且具有导电材料的区域设置在液体中。 光能被施加到光纤的一端,透射光被接收在光纤的另一端。 将电能施加到设置在光纤表面上的导电材料,以加热光纤的区域并引起透过光纤的光的光程长度的变化。 根据通过将电能施加到导电材料而引起的接收光的光路长度的变化来确定液体或光纤的物理性质。 提供一系列短能脉冲,并确定平均相变。 导电材料是金,它包围纤维。 金可以设置在纤维的护套上,或者在处理金之前可以去除护套。

    Wavelength-independent interferometer for optical signal processing
    15.
    发明授权
    Wavelength-independent interferometer for optical signal processing 失效
    用于光信号处理的波长无关干涉仪

    公开(公告)号:US4991963A

    公开(公告)日:1991-02-12

    申请号:US424094

    申请日:1989-09-21

    Applicant: Philip Sutton

    Inventor: Philip Sutton

    CPC classification number: G01J9/0215 G01J2009/0288 G01J2009/0296 G01J3/18

    Abstract: A wavelength-independent-interferometer comprises means to receive light (10) from a field of view, means (BS1) to separate the light into two beams (11, 12), means (BS2) to combine the two beams, and dispersive means (30) interposed in the path (12) of one of the two beams to produce a wavelength-dependent shear. The dispersive means may be a transmission diffraction grating or a reflection grating. In the arrangement shown the optical elements are combined in a modified Mach-Zehnder interferometer. When the conventional Mach-Zehnder interferometer is illuminated with coherent light the separation of interference fringes produced in the interference plane is inversely proportional to the wavelength. By introducing a dispersive element in the invention the detector is sensitized to a pre-determined fringe separation. A moveable reticle is placed in front of a detector to sensitize the detector to the fringe pattern.

    Abstract translation: 波长无关干涉仪包括从视野接收光(10)的装置,用于将光分离成两个光束(11,12)的装置(BS1),组合两个光束的装置(BS2)和分散装置 (30)插入在两个光束中的一个光束的路径(12)中以产生依赖于波长的剪切。 分散装置可以是透射衍射光栅或反射光栅。 在所示的布置中,光学元件组合在改进的马赫 - 曾德尔干涉仪中。 当传统的马赫 - 曾德干涉仪用相干光照射时,在干涉平面中产生的干涉条纹的分离与波长成反比。 通过在本发明中引入分散元件,检测器对预定的边缘分离敏化。 将可移动的掩模版放置在检测器的前面,以使检测器对条纹图案敏感。

    REFRACTIVE SCANNING INTERFEROMETER
    16.
    发明公开

    公开(公告)号:US20230375409A1

    公开(公告)日:2023-11-23

    申请号:US18136786

    申请日:2023-04-19

    Abstract: Embodiments are disclosed relating to a refractively-scanning interferometer comprising an aperture that receives an incident light beam at a receiving angle, a beam splitter configured to split the incident light beam into a first beam and a second beam, a first and a second reflector arranged to reflect the first beam and second beam, respectively, towards a combining optical element, and a refractive Optical Path Difference (rOPD) assembly interposed between the beam splitter and the first reflector, wherein the rOPD Assembly refracts the first light beam an even number of times with induced phase discrepancy being a vector sum of a first phase discrepancy induced by a first refraction and a second phase discrepancy induced by a second refraction, the rOPD Assembly being configured such that the first phase discrepancy is substantially opposite in direction to the second phase discrepancy, a portion of the first and second phase discrepancies cancelling one another out to decrease magnitude of the phase discrepancy.

    MACH-ZEHNDER INTERFEROMETER HAVING A DOUBLY-CORRUGATED SPOOFED SURFACE PLASMON POLARITON WAVEGUIDE
    18.
    发明申请
    MACH-ZEHNDER INTERFEROMETER HAVING A DOUBLY-CORRUGATED SPOOFED SURFACE PLASMON POLARITON WAVEGUIDE 有权
    MACH-ZEHNDER干扰仪具有双重修正的表面等离子体POLARITON WAVEGUIDE

    公开(公告)号:US20150330838A1

    公开(公告)日:2015-11-19

    申请号:US14315933

    申请日:2014-06-26

    Abstract: A Mach-Zehnder interferometer (MZI) structure based on a doubly-corrugated spoofed surface plasmon polariton (DC-SSPP) waveguide is presented. The dependence of phase change on the dielectric loading of the DC-SSPP structure causes the output from both arms to interfere and enhance features on the transmission spectrum of the MZI. The proposed MZI structure can be used for tag-free bio-molecular sensing. The highly localized electro-magnetic field at frequencies close to SSPP resonance is shown to reduce the sample amount needed to produce interference patterns without affecting the selectivity of the sensing structure.

    Abstract translation: 提出了基于双波纹欺骗表面等离子体激元(DC-SSPP)波导的马赫 - 曾德干涉仪(MZI)结构。 相变对DC-SSPP结构的介电负载的依赖性导致两臂的输出干扰和增强MZI透射光谱上的特征。 所提出的MZI结构可用于无标签生物分子检测。 显示出接近SSPP共振频率的高度局部化的电磁场,以减少产生干涉图案所需的样品量,而不影响感测结构的选择性。

    APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT METHOD
    19.
    发明申请
    APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT METHOD 有权
    非对称干涉仪系统和非平衡干涉测量方法

    公开(公告)号:US20130222810A1

    公开(公告)日:2013-08-29

    申请号:US13882800

    申请日:2011-11-02

    Abstract: An interferometric system includes a polarization separation element (10), a first polarization conversion element (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arms connected to one another by a first (6) and second (7) ends in order for a first and second beams (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion element (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining element (10), and a detection element (8) suitable for detecting an output beam (25).

    Abstract translation: 干涉测量系统包括偏振分离元件(10),第一偏振转换元件(11),马赫曾德尔干涉仪(2),其包括通过第一(6)和第二(6)彼此连接的第一(4)和第二(5) )和第二(7)端部,以使具有相同偏振的第一和第二光束(20,21)分别以相反的传播方向以相互的方式穿过干涉仪,以便形成第一和第二干涉仪 光束(22,23),用于获得其偏振变换的干涉光束(24)的第二偏振转换元件(11),偏振组合元件(10)和适于检测的检测元件(8) 输出光束(25)。

    Electromagnetic radiation detector utilizing an electromagnetic
radiation absorbing element in a Mach-Zehnder interferometer arrangement
    20.
    发明授权
    Electromagnetic radiation detector utilizing an electromagnetic radiation absorbing element in a Mach-Zehnder interferometer arrangement 失效
    电磁辐射探测器利用马赫 - 策德尔干涉仪装置中的电磁辐射吸收元件

    公开(公告)号:US5349437A

    公开(公告)日:1994-09-20

    申请号:US954521

    申请日:1992-09-30

    Applicant: Lloyd C. Bobb

    Inventor: Lloyd C. Bobb

    CPC classification number: G01J5/58 G01J9/02 G01J2009/023 G01J2009/0288

    Abstract: Apparatus is provided to detect electromagnetic radiation, in which a radion-absorbing element is disposed on a short section of an optical waveguide to provide a thermal interface therebetween. Radiation is absorbed by the element, which thereby heats the waveguide, causing it to change its optical pathlength in proportion to the radiation absorbed. Interferometer apparatus is connected to measure this change in optical pathlength as a change in the interference condition. This device is highly sensitive and can be operated at room temperature.

    Abstract translation: 提供了用于检测电磁辐射的装置,其中辐射吸收元件设置在光波导的短部分上以在其间提供热界面。 辐射被元件吸收,从而加热波导,导致其与吸收的辐射成比例地改变其光程长度。 连接干涉仪装置以测量光路长度的变化作为干扰条件的变化。 该设备高度灵敏,可在室温下运行。

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