METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
    13.
    发明申请
    METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS 有权
    光学检测部件的方法和系统

    公开(公告)号:US20160231253A1

    公开(公告)日:2016-08-11

    申请号:US15132450

    申请日:2016-04-19

    Abstract: A method and system for optically inspecting parts are provided wherein the system includes a part transfer subsystem including a transfer mechanism adapted to receive and support a part at a loading station and to transfer the supported part by a split belt conveyor so that the part travels along a first path which extends from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. An illumination assembly simultaneously illuminates a plurality of exterior side surfaces of the part with a plurality of separate beams of radiation. A telecentric lens and detector assembly forms an optical image of at least a portion of each of the illuminated side surfaces of the part and detects the optical images. A processor processes the detected optical images to obtain a plurality of views of the part which are angularly spaced about the part.

    Abstract translation: 提供了用于光学检查部件的方法和系统,其中系统包括部件传送子系统,该部件传送子系统包括适于在装载站处接收和支撑部件的传送机构,并且通过分离式带式传送器传送支撑部件,使得部件沿着 第一路径,其从装载站延伸到检查站,在该检查站处,该部件具有用于检查的预定位置和方向。 照明组件同时用多个单独的辐射束照射该部分的多个外侧表面。 远心透镜和检测器组件形成部件的每个照明侧表面的至少一部分的光学图像并检测光学图像。 处理器处理检测到的光学图像以获得在该部分上以角度间隔开的部分的多个视图。

    POLARIZATION PROPERTIES IMAGING SYSTEMS
    14.
    发明申请
    POLARIZATION PROPERTIES IMAGING SYSTEMS 有权
    偏振特性成像系统

    公开(公告)号:US20160116397A1

    公开(公告)日:2016-04-28

    申请号:US14893157

    申请日:2014-05-20

    Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

    Abstract translation: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个示例,提供了一种用于在宽范围的入射角下精确地同时成像样品材料的面内和平面外双折射性质的系统的系统。 除了作为优选实施例讨论的平面内和平面外双折射度量之外,本文描述的示例性空间分辨成像方法适于确定宽范围的偏振特性。

    METHOD AND SYSTEM FOR OPTICALLY INSPECTING THE ENDS OF A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS
    15.
    发明申请
    METHOD AND SYSTEM FOR OPTICALLY INSPECTING THE ENDS OF A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS 有权
    在具有测量轴的单个检查站中对制造部件的端部进行光学检查的方法和系统

    公开(公告)号:US20160109383A1

    公开(公告)日:2016-04-21

    申请号:US14876192

    申请日:2015-10-06

    Abstract: A method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis are provided. The system includes a fixture assembly having a rotatable first fixturing component and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component has a device for holding the part in a generally horizontal orientation and permit rotation of the horizontally held part between first and second angular positions about the measurement axis. The system also includes an actuator assembly, an illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly to determine at least one geometric dimension or any visual defects at the ends of the part.

    Abstract translation: 提供了一种用于在具有测量轴的单个检查站上光学地检查制造部件的端部的方法和系统。 该系统包括具有可旋转的第一夹紧部件和可旋转的第二夹紧部件的夹具组件,该可旋转的第二夹紧部件与第一夹持部件配合并可拆卸地连接,以将力矩从第一夹持部件传递到第二夹持部件。 第二固定部件具有用于将部件保持在大致水平取向并允许水平保持部分围绕测量轴线在第一和第二角度位置之间旋转的装置。 该系统还包括致动器组件,照明装置,透镜和检测器组件以及至少一个处理器,用于处理由透镜和检测器组件产生的电信号,以确定部件端部处的至少一个几何尺寸或任何视觉缺陷 。

    Multi-dimensional scanner for nano-second time scale signal detection
    16.
    发明授权
    Multi-dimensional scanner for nano-second time scale signal detection 有权
    用于纳秒级时间尺度信号检测的多维扫描仪

    公开(公告)号:US08981318B1

    公开(公告)日:2015-03-17

    申请号:US13731097

    申请日:2012-12-30

    Applicant: Marc L. Pusey

    Inventor: Marc L. Pusey

    Abstract: A device and system for measuring the multidimensional distribution of a sample tagged with a short life fluorescent label. The substance applied to a sample holder can be scanned with an optical point source excitation and read back optical stage. The sample can be excited at each of a plurality of points with a fast, e.g., nanosecond pulse of light. The resulting fluorescence can be detected after the excitation is extinguished. A detection gate window can be optimized to maximize the fluorescence signal detected for a predetermined amount of time.

    Abstract translation: 用于测量标记有短寿命荧光标签的样品的多维分布的装置和系统。 应用于样品架的物质可以用光点源激发和回读光学级进行扫描。 样品可以在具有快速,例如纳秒的脉冲光的多个点中的每个点处被激发。 在激发熄灭后可以检测到所产生的荧光。 可以优化检测门窗口以使检测到的荧光信号最大化达预定时间量。

    IMAGING SYSTEM AND IMAGING METHOD
    17.
    发明申请
    IMAGING SYSTEM AND IMAGING METHOD 有权
    成像系统和成像方法

    公开(公告)号:US20150070531A1

    公开(公告)日:2015-03-12

    申请号:US14459737

    申请日:2014-08-14

    Abstract: An imaging system 100 for imaging a sample in a medium carried in a container WP as an imaging object comprises: an imager 21 which obtains an original image by imaging the imaging object; and a data processor 33 which generates multi-gradation image data by performing a gradation correction on the original image, wherein the data processor 33 associates a luminance value corresponding to a luminance of the medium in the original image with a maximum gradation value in the gradation correction.

    Abstract translation: 用于将携带在容器WP中的介质中的样品成像为成像对象的成像系统100包括:成像器21,其通过对成像对象进行成像而获得原始图像; 以及数据处理器33,通过对原始图像执行灰度校正来生成多灰度级图像数据,其中数据处理器33将与原始图像中的介质的亮度相对应的亮度值与灰度级中的最大灰度值相关联 更正。

    PARTICLE DETECTORS
    18.
    发明申请
    PARTICLE DETECTORS 有权
    颗粒检测器

    公开(公告)号:US20140340892A1

    公开(公告)日:2014-11-20

    申请号:US14451330

    申请日:2014-08-04

    Abstract: A beam detector including a light source, a receiver, and a target, acting in cooperation to detect particles in a monitored area. The target reflects incident light, resulting in reflected light being returned to receiver. The receiver is capable of recording and reporting light intensity at a plurality of points across its field of view. In the preferred form the detector emits a first light beam in a first wavelength band; a second light beam in a second wavelength band; and a third light beam in a third wavelength band, wherein the first and second wavelengths bands are substantially equal and are different to the third wavelength band.

    Abstract translation: 一种包括光源,接收器和目标的光束检测器,其协同作用以检测被监视区域中的微粒。 目标反射入射光,导致反射光返回到接收器。 接收机能够在整个视场的多个点上记录和报告光强度。 在优选形式中,检测器发射第一波长带中的第一光束; 在第二波长带中的第二光束; 以及第三波长带中的第三光束,其中所述第一和第二波长带基本相等并且与所述第三波长带不同。

    Particle detection
    19.
    发明授权
    Particle detection 有权
    粒子检测

    公开(公告)号:US08804119B2

    公开(公告)日:2014-08-12

    申请号:US12997155

    申请日:2009-06-10

    Abstract: A particle detection system including; at least one light source adapted to illuminate a volume being monitored at at least two wavelengths; a receiver having a field of view and being adapted to receive light from at least one light source after said light has traversed the volume being monitored and being adapted to generate signals indicative of the intensity of light received at regions within the field of view of the receiver; a processor associated with the receiver adapted to process the signals generated by the receiver to correlate light received at at least two wavelengths in corresponding regions within the field of view of the receiver and generate an output indicative of the relative level of light received at the two wavelengths.

    Abstract translation: 一种粒子检测系统,包括: 至少一个光源,其适于照亮在至少两个波长处被监测的体积; 具有视场的接收器,并且适于在所述光已经穿过被监视的体积之后接收来自至少一个光源的光,并且适于产生指示在所述视场内的区域中接收的光的强度的信号 接收器 与所述接收器相关联的处理器,其适于处理由所述接收器产生的信号,以将在所述接收机的视场内的相应区域中的至少两个波长处接收的光相关联,并且生成指示在所述两个接收器处接收的光的相对电平的输出 波长。

    Particle detectors
    20.
    发明授权
    Particle detectors 有权
    粒子探测器

    公开(公告)号:US08797531B2

    公开(公告)日:2014-08-05

    申请号:US13318309

    申请日:2010-05-03

    Abstract: A beam detector (10) including a light source (32), a receiver (34), and a target (36), acting in co-operation to detect particles in a monitored area (38). The target (36), reflects incident light (40), resulting in reflected light (32) being returned to receiver (34). The receiver (34) is a receiver is capable of recording and reporting light intensity at a plurality of points across its field of view. In the preferred form the detector (10) emits a first light beam (3614) in a first wavelength band; a second light beam (3618) in a second wavelength band; and a third light beam (3616) in a third wavelength band, wherein the first and second wavelengths bands are substantially equal and are different to the third wavelength band.

    Abstract translation: 一种包括光源(32),接收器(34)和目标(36)的光束检测器(10),用于协调以检测被监视区域(38)中的颗粒。 目标(36)反射入射光(40),导致反射光(32)返回到接收器(34)。 接收器(34)是能够在其视场上的多个点处记录和报告光强度的接收器。 在优选形式中,检测器(10)发射第一波长带中的第一光束(3614) 在第二波长带中的第二光束(3618); 以及第三波长带中的第三光束(3616),其中所述第一和第二波长带基本相等并且与所述第三波长带不同。

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