公开(公告)号：US20160116397A1

公开(公告)日：2016-04-28

申请号：US14893157

申请日：2014-05-20

Applicant: HINDS INSTRUMENTS, INC.

Inventor： John Freudenthal ,  Andy Leadbetter ,  Baoliang Wang

IPC: G01N21/23

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract translation: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个示例，提供了一种用于在宽范围的入射角下精确地同时成像样品材料的面内和平面外双折射性质的系统的系统。 除了作为优选实施例讨论的平面内和平面外双折射度量之外，本文描述的示例性空间分辨成像方法适于确定宽范围的偏振特性。

公开(公告)号：US09683930B2

公开(公告)日：2017-06-20

申请号：US14893157

申请日：2014-05-20

Applicant: Hinds Instruments, Inc.

Inventor： John Freudenthal ,  Andy Leadbetter ,  Baoliang Wang

IPC: G01J4/00 ,  G01N21/23 ,  G01N21/21

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

公开(公告)号：US10168274B2

公开(公告)日：2019-01-01

申请号：US15612564

申请日：2017-06-02

Applicant: Hinds Instruments, Inc.

Inventor： John Freudenthal ,  Andy Leadbetter ,  Baoliang Wang

IPC: G01N21/23 ,  G01J4/00 ,  G01N21/21

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

公开(公告)号：US20170307517A1

公开(公告)日：2017-10-26

申请号：US15612564

申请日：2017-06-02

Applicant: Hinds Instruments, Inc.

Inventor： John Freudenthal ,  Andy Leadbetter ,  Baoliang Wang

IPC: G01N21/23 ,  G01N21/21 ,  G01J4/00

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.