Abstract:
A reference harmonic absorption curve of a laser absorption spectrometer can have a reference curve shape derived from a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.
Abstract:
The present invention relates to a head (500) for a sensor comprising two sections of optical fibre enabling the propagation of infrared light having at least one infrared wavelength and generating evanescent waves toward the outside in order to detect infrared signatures of an external medium, said head (500) comprising: an optical fibre forming a curved portion (15) for connecting the two sections of fibre, and for coming into contact with the external medium so as to detect the infrared signatures interfering with the propagation of the evanescent waves propagating along the fibre, and means (504, 506) for protecting the curved portion (15) against external mechanical stress, while ensuring that a contact area (30) exists between the external medium and said curved portion (15).
Abstract:
Terahertz imaging devices may comprise a focal plane array including a substrate and a plurality of resonance elements. The plurality of resonance elements may comprise a conductive material coupled to the substrate. Each resonance element of the plurality of resonance elements may be configured to resonate and produce an output signal responsive to incident radiation having a frequency between about a 0.1 THz and 4 THz range. A method of detecting a hazardous material may comprise receiving incident radiation by a focal plane array having a plurality of discrete pixels including a resonance element configured to absorb the incident radiation at a resonant frequency in the THz, generating an output signal from each of the discrete pixels, and determining a presence of a hazardous material by interpreting spectral information from the output signal.
Abstract:
A method of generating radiation comprises: manufacturing a structure comprising a substrate supporting a layer of InGaAs, InGaAsP, or InGaAlAs material doped with a dopant, said manufacturing comprising growing said layer such that said dopant is incorporated in said layer during growth of the layer; illuminating a portion of a surface of the structure with radiation having photon energies greater than or equal to a band gap of the doped InGaAs, InGaAsP, or InGaAlAs material so as to create electron-hole pairs in the layer of doped material; and accelerating the electrons and holes of said pairs with an electric field so as to generate radiation. In certain embodiments the dopant is Fe. Corresponding radiation detecting apparatus, spectroscopy systems, and antennas are described.
Abstract:
A system and method for obtaining multispectral images of fresh meat at predetermined wavelength bands at a first time, subjecting the images to analysis in an image analysis system comprising a computer programmed to perform such analysis, and outputting a forecast of meat tenderness at a later point in time. Predetermined key wavelength bands are precorrelated with a high degree of prediction of meat tenderness and/or other properties of meat and are used in the multispectral system and method. A system and method for determining the key wavelengths is also disclosed. The multispectral imaging system and method is suitable for use in an industrial setting, such as a meat processing plant. The system and method is useful in a method for determining quality and yield grades at or near the time of imaging in lieu of visual inspection with the unaided human eye, increasing efficiency and objectivity.
Abstract:
A method in which the wavelength of the light of a tunable light source is varied periodically over an absorption line of interest for the gas component to measure the concentration of a gas component in a measurement gas based on one of two measurement methods of direct absorption spectroscopy and wavelength modulation spectroscopy and, where in the case of wavelength modulation spectroscopy, the wavelength of the light is additionally sinusoidally modulated at a high frequency and with a small amplitude, where the intensity of the light is detected after transradiation of the measurement gas and processed to yield a measurement result, and where in order to increase the accuracy and reliability of the measurement, the two measurement methods are applied simultaneously during each period, or alternately in consecutive periods, and their results are combined by averaging to form the measurement result.
Abstract:
A spectrophotometer 10 includes built-in detector 24 and external detector 32. When a mountable/removable optical path switcher 23a is installed in a specimen chamber 23, measurement based on detection signals from built-in detector 24 is replaced by measurement based on detection signals from external detector 32. The spectrophotometer further includes a measurement data threshold-value storage unit 51 that stores threshold value T for measurement data from built-in detector 24 or external detector 32, and a light-receiving detector recognition unit 52 that recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detector 24 or external detector 32 while the measuring light beam is being introduced into specimen chamber 23.
Abstract:
A terahertz-wave generating device including an optical waveguide containing an electrooptic crystal includes: first and second optical waveguides through which first and second light beams respectively propagate; a propagation portion through which a first terahertz wave propagates, the first terahertz wave being generated from the second optical waveguide in a direction different from a direction of the second light beam; and a delay portion arranged at incidence sides of the first and second light beams and configured to delay the first light beam relative to the second light beam. The first optical waveguide and the second optical waveguide are arranged with the propagation portion interposed therebetween. A first equiphase surface of the first terahertz wave is substantially aligned with a second equiphase surface of a second terahertz wave generated from the first optical waveguide in a direction different from a direction of the first light beam.
Abstract:
A sample cell for a spectrometer, and a spectrometer using such a sample cell. The sample cell may include a housing having a reflective inner surface which is at least a section of a spheroid bounding a cavity. A lens system receives electromagnetic radiation from a source and directs a converging beam through a port in the cavity to a focal point inside the cavity, such that the beam undergoes multiple reflections on the inner surface before exiting the cavity. Arrangements for adjusting beam cross-sectional area and angle are optionally provided. Methods which can be performed on such an apparatus and computer program products for performing such methods are further provided.