公开(公告)号：US08983787B1

公开(公告)日：2015-03-17

申请号：US13506140

申请日：2012-03-30

Applicant: Martin M. Liphardt

Inventor： Martin M. Liphardt

IPC: G01B11/06 ,  G01J4/04 ,  G01N21/00

CPC classification number: G01B11/0641 ,  G01N21/211

Abstract: Methodology for determining uncertainty in a data set which characterizes a sample involving elimination of the influence of sample alteration drift caused by data set acquisition, and/or elimination of the influence of system drift during data acquisition.

Abstract translation: 用于确定数据集中的不确定性的方法，其特征在于涉及消除由数据集获取引起的样本改变漂移的影响的样本，和/或消除数据采集期间系统漂移的影响。

公开(公告)号：US08810795B2

公开(公告)日：2014-08-19

申请号：US13682174

申请日：2012-11-20

Applicant: National Yang-Ming University

Inventor： How-Foo Chen

IPC: G01N21/55 ,  G01J4/04

CPC classification number: G01J4/04 ,  G01N21/553 ,  G01N21/554 ,  G02B21/0004 ,  G02B21/0092

Abstract: The present invention provides an optical detection system in which a first mirror of the control unit is used to receive light beam and redirect it into a first one-dimensional off-axis parabolic mirror. The first one-dimensional off-axis parabolic mirror then directs the light beam to a cylindrical lens. Through the mechanism of reflection, the cylindrical lens further directs the light beam to a second one-dimensional off-axis parabolic mirror. The second one-dimensional off-axis parabolic mirror then directs the light beam into a second mirror. The detection unit of the system is used to detect the light beam coming from the control unit, so as to convert the light signals into electric signals for the analysis in the process unit afterwards.

Abstract translation: 本发明提供了一种光学检测系统，其中使用控制单元的第一反射镜来接收光束并将其重定向到第一个一维离轴抛物面镜。 然后，第一个一维离轴抛物面反射镜将光束引导到柱面透镜。 通过反射机制，柱面透镜进一步将光束引导到第二个一维离轴抛物面镜。 然后第二个一维离轴抛物面镜将光束引导到第二个反射镜中。 系统的检测单元用于检测来自控制单元的光束，以便将光信号转换成电信号，以便在处理单元中进行分析。

公开(公告)号：US08810791B2

公开(公告)日：2014-08-19

申请号：US13922711

申请日：2013-06-20

Applicant: Sick Stegmann GmbH

Inventor： Reinhold Mutschler ,  Ulrich Zwolfer

IPC: G01J4/00 ,  G01D5/34 ,  G02B5/30 ,  H01L31/0216 ,  G01B11/26 ,  G01J4/04 ,  H01L31/02

CPC classification number: G01B11/26 ,  G01D5/345 ,  G01J4/04 ,  G02B5/30 ,  G02B5/3058 ,  G02B2207/121 ,  H01L31/02024 ,  H01L31/02161

Abstract: The invention relates to an optoelectronic sensor element (20) having at least one reception element (22, 22a, 22b, 22c, 22d) in front of which a polarizing structure (24, 24a, 24b, 24c, 24d) is arranged which is manufactured from an electrically conductive material, with the polarizing structure (24, 24a, 24b, 24c, 24d) having a contact connection (26) for the application of a defined tension and with the polarizing structure (24, 24a, 24b, 24c, 24d) being configured as a screen of the sensor element (20).

Abstract translation: 本发明涉及一种具有至少一个接收元件（22,22a，22b，22c，22d）的光电传感器元件（20），其前面布置有偏振结构（24,24a，24b，24c，24d） 由具有用于施加限定张力的接触连接（26）和偏振结构（24,24a，24b，24c，24c）的偏振结构（24,24a，24b，24c，24d）由导电材料制成， 24d）被配置为传感器元件（20）的屏幕。

公开(公告)号：US20140152989A1

公开(公告)日：2014-06-05

申请号：US13690025

申请日：2012-11-30

Applicant: INFINEON TECHNOLOGIES AG

Inventor： Franz DARRER

IPC: G01J4/04

CPC classification number: G01J4/04 ,  G01S7/499 ,  G01S17/89 ,  G01S17/936

Abstract: Representative implementations of devices and techniques provide selectivity for imaging devices and systems. Polarization may be applied to emitted light radiation and/or received light radiation to select a desired imaging result. Using polarization, an imaging device or system can pass desired light radiation having desired information and reject unwanted or stray light radiation.

Abstract translation: 设备和技术的代表性实现为成像设备和系统提供了选择性。 极化可以应用于发射的光辐射和/或接收的光辐射以选择期望的成像结果。 使用偏振，成像装置或系统可以传递具有期望信息的期望的光辐射并且拒绝不需要的或杂散的光辐射。

公开(公告)号：US08642983B2

公开(公告)日：2014-02-04

申请号：US13609573

申请日：2012-09-11

Applicant: Kazunori Shiota

Inventor： Kazunori Shiota

IPC: G01J4/04 ,  G01J5/10

CPC classification number: G02F1/3544 ,  G02F2001/374 ,  G02F2203/13

Abstract: An electromagnetic wave emission device includes a nonlinear crystal, a prism, and a cylindrical lens. The nonlinear crystal has an optical waveguide, receives exciting light having at least two wavelength components, and outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] by means of the Cherenkov phase matching. The prism includes an electromagnetic wave input surface receiving the electromagnetic wave from the optical waveguide and an electromagnetic wave transmission surface through which the electromagnetic wave which has entered from the electromagnetic wave input surface passes. The cylindrical lens has two bottom surfaces opposed to each other, a flat surface intersecting with the two bottom surfaces, and a curved surface intersecting with the two bottom surfaces and the flat surface, wherein the flat surface is in contact with the electromagnetic wave transmission surface.

Abstract translation: 电磁波发射装置包括非线性晶体，棱镜和柱面透镜。 非线性晶体具有光波导，接收具有至少两个波长分量的激发光，并通过切伦科夫（Cherenkov）输出具有等于或大于0.01 [THz]且等于或小于100 [THz]的频率的电磁波 相位匹配。 棱镜包括接收来自光波导的电磁波的电磁波输入面和从电磁波输入面输入的电磁波经过的电磁波传播面。 柱面透镜具有彼此相对的两个底面，与两个底面相交的平坦面，以及与两个底面和平面交叉的曲面，其中，平坦表面与电磁波传播面接触 。

公开(公告)号：US20130308132A1

公开(公告)日：2013-11-21

申请号：US13986602

申请日：2013-05-17

Applicant: George C. Giakos

Inventor： George C. Giakos

IPC: G01J4/04

CPC classification number: G01J4/04 ,  G01N21/23

Abstract: A system and method for detection of a target object/material includes identifying a polarimetric signal for a plurality of aspect angles. One/two-dimensional Mueller matrix image or one/two-dimensional Stokes vector image can be processed using power spectral analysis, wavelet and fractal analysis for further image, having increased discrimination with reduced false-ratio. In addition, each of the angular polarization states due to their association with a particular aspect angle are then cross-correlated to generate a two-dimensional image that relates the level of correlation with the aspect angle. Finally, the output information, including statistical parameters are fed to the input of a neural-fuzzy network for further optimization and image enhancement.

Abstract translation: 用于检测目标物体/材料的系统和方法包括识别多个方位角的极化信号。 可以使用功率谱分析，小波和分形分析来处理一维/二维米勒矩阵图像或一维/二维斯托克斯矢量图像，具有增加的误比例误差增加的区别。 此外，由于它们与特定方位角的关联而导致的每个角偏振态然后是交叉相关的，以产生将相关度与方位角相关联的二维图像。 最后，包括统计参数在内的输出信息被馈送到神经模糊网络的输入端，用于进一步优化和图像增强。

公开(公告)号：US20130162980A1

公开(公告)日：2013-06-27

申请号：US13407509

申请日：2012-02-28

Applicant: Jin Hoon KIM ,  Suk Jin HAM

Inventor： Jin Hoon KIM ,  Suk Jin HAM

IPC: G01N21/956 ,  G01J4/04

CPC classification number: G01J4/04 ,  G01N21/9501

Abstract: Disclosed herein are an apparatus for non-invasively inspecting defects, including: a sample irradiation unit having a sample that is an inspection target seated thereon and irradiating polarization to the sample; a light receiving unit detecting polarization from the sample; and a control unit processing and storing each data detected from the light receiving unit, and a method for inspecting defects using the same.

Abstract translation: 本文公开了一种用于非侵入性检查缺陷的装置，包括：样品照射单元，其具有作为其上的检查对象的样品，并对样品照射极化; 检测来自样品的偏振的光接收单元; 以及控制单元，其处理和存储从光接收单元检测的每个数据，以及使用其检测缺陷的方法。

公开(公告)号：US20100271475A1

公开(公告)日：2010-10-28

申请号：US12595079

申请日：2008-04-11

Applicant: James T. Schwiegerling ,  Eustace Dereniak ,  Michael W. Kudenov ,  Haitao Luo ,  Kazuhiko Oka ,  Edward A. Dehoog

Inventor： James T. Schwiegerling ,  Eustace Dereniak ,  Michael W. Kudenov ,  Haitao Luo ,  Kazuhiko Oka ,  Edward A. Dehoog

IPC: G01J4/04 ,  H04N7/18

CPC classification number: G01J4/04 ,  G03B11/00 ,  G03B15/00

Abstract: An imaging polarimeter optics unit comprising: a first polarization-sensitive beam-splitter optic, a retarder, a second polarization-sensitive beam-splitter optic, and an analyzer, through which input light passes in sequence, wherein the retarder and polarization-sensitive beam-splitters cause the input light to have optical components that provide different information about the state of polarization of the input beam is provided.

Abstract translation: 一种成像偏光计光学单元，包括：第一偏振敏感分束器光学器件，延迟器，第二偏振敏感分束器光学器件和分析器，输入光依次通过该器件，其中延迟器和偏振敏感光束 分离器使得输入光具有提供关于输入光束的偏振状态的不同信息的光学部件。

公开(公告)号：US20100149533A1

公开(公告)日：2010-06-17

申请号：US12332653

申请日：2008-12-11

Applicant: Eric C. Fest

Inventor： Eric C. Fest

IPC: G01J4/04

CPC classification number: G02B27/286 ,  G01J4/00 ,  G01J4/04

Abstract: A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder that rotates the polarization content of incoming light, a polarization beam splitter that receives light from the adjustable circular retarder and polarizing the light into a first portion of light having a first polarization and a second portion of light having a second polarization. The first portion of light is directed to a focal plane and the second portion of light is directed to the optical assembly. The optical assembly is switchable between a polarizing mode of operation in which the first portion of light is viewable at the focal plane in absence of the second portion of light and an imaging mode of operation in which the first portion of light and the second portion of light are viewable at the focal plane.

Abstract translation: 偏振入射光的偏振计和方法包括光学组件，旋转入射光的偏振内容的第一可调节圆形延迟器，接收来自可调节圆形延迟器的光的偏振分束器，并将光偏振成第一部分光， 具有第二偏振的第一偏振光和第二部分光。 光的第一部分被引导到焦平面，并且第二部分的光被引导到光学组件。 光学组件可在偏光操作模式之间切换，其中在不存在第二部分光的情况下第一部分光在焦平面处可见，以及成像操作模式，其中光的第一部分和第二部分的光 光在焦平面可见。

公开(公告)号：US20100118293A1

公开(公告)日：2010-05-13

申请号：US12367157

申请日：2009-02-06

Applicant: Chun-I WU ,  Kai-Ping CHUANG ,  Wan-Yi LIN ,  Yi-Chen HSIEH ,  Fu-Shiang YANG

Inventor： Chun-I WU ,  Kai-Ping CHUANG ,  Wan-Yi LIN ,  Yi-Chen HSIEH ,  Fu-Shiang YANG

IPC: G01J4/04 ,  G01B11/16

CPC classification number: G01N21/21 ,  G01N2021/216

Abstract: A phase retardance inspection instrument, comprising: a light source module for generating a single-wavelength light beam; a circularly polarized light generating module, comprising a polarizer and a first phase retarder, for receiving the single-wavelength light beam as it is guided to passe through the polarizer and the first phase retarder in order; and a detecting module, comprising a second phase retarder, a polarizing beam splitter, a first image sensor and a second image sensor, for receiving and guiding a circularly polarized light beam to travel through the second phase retarder and the polarizing beam splitter in order after it passes through a substrate under inspection, wherein the polarizing beam splitter splits an elliptically polarized light beam into intensity vector components of a left-hand circularly polarized light beam and a right-hand circularly polarized light beam, which are to be emitted into the first image sensor and the second image sensor, respectively.

Abstract translation: 一种相位延迟检查仪器，包括：用于产生单波长光束的光源模块; 圆偏振光产生模块，包括偏振器和第一相位延迟器，用于在依次被引导到偏振器和第一相位延迟器时被接收单波长光束; 以及检测模块，包括第二相位延迟器，偏振分束器，第一图像传感器和第二图像传感器，用于接收和引导圆偏振光束以在第二相位延迟器和偏振分束器之后依次行进穿过第二相位延迟器和偏振分束器 它通过检查下的基板，其中偏振分束器将椭圆偏振光束分成左发圆偏振光束和右旋圆偏振光束的强度矢量分量，这些光束矢量将被发射到第一 图像传感器和第二图像传感器。