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公开(公告)号：US5317524A
公开(公告)日：1994-05-31
申请号：US762837
申请日：1991-09-19
Applicant: Promit Das , Terrance R. Kinney
Inventor： Promit Das , Terrance R. Kinney
Abstract: A process for analyzing a spectral signal generated by a birefringent element and transmitted to an array. An output spectral signal emanating from the array is converted from an analog to a digital signal to establish a reference wave form which has a dominant frequency after the birefringent element is exposed to a known temperature. Thereafter, a current wave form is generated from the output spectral signal emanating from the array. A phase and frequency relationship is obtained by cross correlating the current wave form and the reference wave form. The dominant frequency for the phase and frequency relationship is obtained by Fast Fourier Transformation. Thereafter, the dominant frequency for the phase and frequency relationship of the current wave form is compared with the dominant frequency for the reference wave form to determine a temperature range. The temperature range and phase and dominant frequency for the current wave form are matched with a reference schedule stored in the memory of a digital signal processor to predict the current temperature experienced by the birefringent element. This predicted temperature is displayed on a screen to inform an operator of the current operational conditions experienced by the birefringent element.
Abstract translation: 用于分析由双折射元件产生并传输到阵列的光谱信号的处理。 从阵列发出的输出光谱信号从模拟信号转换为数字信号，以建立在双折射元件暴露于已知温度之后具有主频的参考波形。 此后，从从阵列发出的输出光谱信号产生当前波形。 通过将当前波形与参考波形相互交叉获得相位和频率关系。 通过快速傅立叶变换获得相位和频率关系的主频率。 此后，将电流波形的相位和频率关系的主频与参考波形的主频进行比较，以确定温度范围。 当前波形的温度范围和相位和主频与存储在数字信号处理器的存储器中的参考调度相匹配，以预测双折射元件所经历的当前温度。 该预测温度显示在屏幕上以通知操作者双折射元件所经历的当前操作条件。
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公开(公告)号：US5263776A
公开(公告)日：1993-11-23
申请号：US951280
申请日：1992-09-25
Applicant: David W. Abraham , William M. Holber , Joseph S. Logan , Hemantha K. Wickramasinghe
Inventor： David W. Abraham , William M. Holber , Joseph S. Logan , Hemantha K. Wickramasinghe
CPC classification number: G01K11/00
Abstract: Multi-wavelength optical thermometry provides for non-contact measurement of the temperature of a sample where the front surface and the back surface of the sample are used in a interferometer to measure changes in optical path length. Laser beams at two different wavelengths are used and the beam phase of the two resultant interference signals is used to unambiguously measure the path length change over a broad temperature range.
Abstract translation: 多波长光学温度测量提供样品的温度的非接触式测量，其中样品的前表面和背面用于干涉仪中以测量光程长度的变化。 使用两个不同波长的激光束，并且使用两个合成的干涉信号的光束相位来明确地测量在宽的温度范围内的路径长度变化。
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公开(公告)号：US5157458A
公开(公告)日：1992-10-20
申请号：US598697
申请日：1990-11-02
Applicant: Heinz Wagner , Martin Labhart , Ulrich Glaus
Inventor： Heinz Wagner , Martin Labhart , Ulrich Glaus
CPC classification number: G01J3/447 , G01J3/4537 , G01B2290/70 , G01J2009/0261
Abstract: The polarization interferometer comprises a source of light (1), a collimator (2), a first polarizing means (3), a double-refractive means (4,5,6) and a second polarizing means (7) which polarizes the light emerging from the double-refractive means (4,5,6) and directs it to a photon detector (8). The double-refractive means (4,5,6) consists of two optical wedges (5,6) displaceable along those lateral surfaces which face each other, said wedges complementing each other to a right parallelepiped, and of a double-refractive, plane-parallel plate (4) serving as a compensator. The optical axis of the compensator (4) is twisted in a plane perpendicular to the light beam by a finite angle relative to that of the two wedges (5,6), the optical axes of the two wedges (5,6) coinciding with each other. The optical axes of the two polarizing means (3,7) are arranged perpendicularly or parallely to each other and are aligned non-parallely to the axes of the two wedges (5,6) of the double-refractive means (4,5,6).
Abstract translation: PCT No.PCT / CH90 / 00008 Sec。 371日期1990年11月2日 102（e）1990年11月2日日期PCT 1990年1月15日提交PCT公布。 WO90 / 10191 PCT出版物 日期：1990年9月7日。偏振干涉仪包括光源（1），准直器（2），第一偏振装置（3），双折射装置（4,5,6）和第二偏振装置 （7），其使从双折射装置（4,5,6）出射的光偏振并将其引导到光子检测器（8）。 双折射装置（4,5,6）由两个光楔（5,6）组成，两个光楔（5,6）可沿着彼此面对的侧表面移位，所述楔彼此互补成直角的平行六面体，双折射平面 - 平行板（4）作为补偿器。 补偿器（4）的光轴在垂直于光束的平面中相对于两个楔形物（5,6）的角度被扭转有限的角度，两个楔形物（5,6）的光轴与 彼此。 两个偏振装置（3,7）的光轴彼此垂直或平行布置，并且与双折射装置（4,5，...）的两个楔形物（5,6）的轴线非平行地排列， 6）。
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254.发明授权Apparatus and method for producing fourier transform spectra for a test object in fourier transform spectrographs 失效用于在傅立叶变换光谱仪中测试物体的傅里叶变换光谱的装置和方法
公开(公告)号：US5039222A
公开(公告)日：1991-08-13
申请号：US380793
申请日：1989-07-17
Applicant: Akio Izumi
Inventor： Akio Izumi
CPC classification number: G01J3/453
Abstract: Apparatus and a method for producing Fourier spectra for a test object utilizing a plurality of laser interference signals each having a period corresponding to a wavelength of a laser beam and being out of phase by 1/n of the wavelength of the laser beam, n being a positive integer above 1. An infrared interference signal representing the test object after the test object is irradiated with an infrared light beam is sampled at a time interval corresponding to 1/n of the wavelength of the at least one laser interference signal and n sets of sampled data corresponding to the infrared interference signal are produced. Each set of sampled data is Fourier-transformed independently from the other to generate a Fourier spectrum corresponding to each set. All of the independently generated Fourier spectra are later combined to produce a Fourier spectrum corresponding to the infrared interference signal.
Abstract translation: 使用多个激光干涉信号产生用于测试对象的傅立叶频谱的装置和方法，每个激光干涉信号具有对应于激光束波长的周期并且与激光束的波长相差1 / n，n为 在1以上的正整数。在与红外光束照射测试对象之后表示测试对象的红外线干扰信号以对应于至少一个激光干涉信号的波长的1 / n的时间间隔被采样，并且n组 产生对应于红外线干扰信号的采样数据。 每组采样数据彼此独立地进行傅里叶变换，以产生对应于每组的傅里叶谱。 所有独立生成的傅里叶谱随后组合以产生对应于红外线干涉信号的傅里叶谱。
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255.发明授权
公开(公告)号：US5013153A
公开(公告)日：1991-05-07
申请号：US383461
申请日：1989-07-20
Applicant: Rolf Disch , Wolfgang Hartig
Inventor： Rolf Disch , Wolfgang Hartig
CPC classification number: G01J3/12 , G01N21/31 , G02B27/28 , G01J2003/1291 , G01J3/1838 , G01J3/2803 , G01N2021/3129 , G01N2021/3137 , G01N21/3504
Abstract: An interferometric gas component measurement apparatus has a light source (27), a measurement path (30) which contains the gas components to be measured, a polarizer (11), a double refracting plate arranged with its optical axis at 45.degree. to the polarization direction, two doubly refracting plates (14, 20) arranged with their optical axes at 45.degree. to one another and an analyzer (13). The light which passes through the measurement path is concentrated into an output gap (32) and reflected via a holographic concave grid (33) onto a diode row (22). The thickness of the individual plates is so selected that specific linear combinations of the thicknesses result in phase displacements between the beams polarized perpendicular to one another in the plates, with these phase displacements corresponding to the reciprocal of the quasi-periodic line splitting of selected vibration and/or rotation bands of the gas molecules of the gas components to be measured. The output signal of the diode row (22) and the output signal of a rotary position transducer (34) are applied to an electronic evaluation circuit which, at different rotational positions of the rotating plates (14, 20) determines the concentrations (C1, C2, C3) of gases present on the measurement path (30) from the signals received from the diode row (22) (FIG. 1).
Abstract translation: 干涉气体成分测量装置具有光源（27），含有要测量的气体成分的测量路径（30），偏振器（11），将其光轴布置成与偏振成45°的双折射板 方向，两个双折射板（14,20）以其光轴彼此成45°的方式布置，并且分析器（13）。 穿过测量路径的光被集中到输出间隙（32）中，并通过全息凹栅格（33）反射到二极管行（22）上。 各个板的厚度如此选择，使得厚度的特定线性组合导致在板中彼此垂直偏振的光束之间的相位偏移，这些相位位移对应于所选振动的准周期线分割的倒数 和/或要测量的气体组分的气体分子的旋转带。 二极管列（22）的输出信号和旋转位置传感器（34）的输出信号被施加到电子评估电路，其在旋转板（14,20）的不同旋转位置确定浓度（C1， C2，C3）从二极管排（22）（图1）接收的信号存在于测量路径（30）上的气体。
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Patent Agency Ranking
公开(公告)号：US4991961A
公开(公告)日：1991-02-12
申请号：US357526
申请日：1989-05-26
Applicant: David R. Strait
Inventor： David R. Strait
CPC classification number: G02B7/1825 , G01J3/4535
Abstract: An interferometer modulator (10) has a housing (12) that encloses a moving mirror (14) attached to a mirror arm (18) which is suspended by links (34, 36) from the housing (12). The links (34, 36) are attached to the mirror arm (18) at swinging pivots (42, 44) and are attached to the housing (12) at fixed pivots (46, 48). One of the fixed pivots (46) is mounted within an adjustable block (68) the position of which may be adjusted by the turning of adjust screws (82, 76). Turning of one of the adjust screws (82) adjusts the distance between the fixed pivots (46, 48) to match the distance of the swinging pivots (42, 44), thus correcting for vertical tilt. Turning of the second of the adjust screws (76) compensates for any angular differences that would prevent the links (34, 36) from moving in the same plane of motion, thus correcting for horizontal tilt.
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公开(公告)号：US4859064A
公开(公告)日：1989-08-22
申请号：US191980
申请日：1988-05-09
Applicant: Robert G. Messerschmidt , Donald W. Sting
Inventor： Robert G. Messerschmidt , Donald W. Sting
CPC classification number: G01N21/474 , G01N2021/3595 , G01N2021/4769
Abstract: A spectroscopy system separates the diffuse reflectance component of a reflectance spectrum from the specular reflectance component using a remote field stop filter. The surface of the sample is placed at a focal plane of an optical system. The optical system forms an image on the surface of the sample that includes an image of the remote field stop filter. The optical system images the surface of the sample onto either the same or another remote field stop. Energy reflected from the surface of the sample which is in focus at the remote field stop retains the image information about the image of the filter, whereas energy reflected from below the surface of the sample does not necessarily retain image information about the image of the filter. Since the energy from the surface of the sample is specularly reflected and the energy from below the surface is diffusely reflected, the specular component of the reflectance spectrum is spatially separate from some of the diffuse reflection component at the remote image stop and is filtered out. The now filtered reflection spectrum contains diffusely reflected energy, which is directed to the detector of a spectrometer.
Abstract translation: 光谱系统使用远程场停止滤光器将反射光谱的漫反射分量与镜面反射率分量分离。 将样品的表面放置在光学系统的焦平面处。 光学系统在样品的表面上形成包括远程场停止过滤器的图像的图像。 光学系统将样品的表面成像到相同或另一个远程现场停止点上。 从远程场停止对焦的样品表面反射的能量保留关于滤光片图像的图像信息，而从样品表面下方反射的能量不一定保留关于滤光片图像的图像信息 。 由于来自样品表面的能量被镜面反射，并且来自表面下方的能量被漫反射，所以反射光谱的镜面反射分量与远程图像停止处的一些漫反射分量在空间上分离并被滤出。 现在滤波的反射光谱包含漫反射能量，其被引导到光谱仪的检测器。
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公开(公告)号：US4834537A
公开(公告)日：1989-05-30
申请号：US136681
申请日：1987-12-22
Applicant: Gerard L. Rafanelli , Lacy G. Cook
Inventor： Gerard L. Rafanelli , Lacy G. Cook
Abstract: An interferometric spectrometer (20) for determining two-dimensional positional and spectral information of two-dimensional light sources (26) is disclosed. The spectrometer (20) includes a mechanism (28) for splitting a beam source (24) into two beam components (30) and (32). A mechanism (34) and (36) for focusing and centering the pair of beam components (30) and (32) is positioned in the line of projection of the beam components (30) and (32). A mechanism (38) and (40) for reflecting the pair of beam components (30) and (32) is positioned in the line of projection of the two beam components (30) and (32). A detector mechanism (42) for detecting the beam components (30) and (32) is positioned in the line of projection of the two beam components (30) and (32). A mechanism (44) for determining spatial and spectral information of the source (26) is associated with the detector mechanism (42 ). Also disclosed is a method of determining spatial and spectral information of a light source utilizing the spectrometer.
Abstract translation: 公开了一种用于确定二维光源（26）的二维位置和光谱信息的干涉光谱仪（20）。 光谱仪（20）包括用于将光束源（24）分成两个光束分量（30）和（32）的机构（28）。 用于聚焦和对中所述一对光束部件（30）和（32）的机构（34）和（36）位于所述光束部件（30）和（32）的投影线中。 用于反射一对光束分量（30）和（32）的机构（38）和（40）位于两个光束分量（30）和（32）的投影线中。 用于检测光束分量（30）和（32）的检测器机构（42）位于两个光束分量（30）和（32）的投影线中。 用于确定源（26）的空间和光谱信息的机构（44）与检测器机构（42）相关联。 还公开了一种利用光谱仪确定光源的空间和光谱信息的方法。
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259.发明授权Interferometric optical path difference scanners and FT spectrophotometers incorporating them 失效干涉光路差扫描仪和融合了它们的FT分光光度计
公开(公告)号：US4684255A
公开(公告)日：1987-08-04
申请号：US760013
申请日：1985-07-29
Applicant: Michael A. Ford
Inventor： Michael A. Ford
CPC classification number: G02B27/108 , G01J3/453 , G02B27/143 , G02B27/144
Abstract: In an interferometric apparatus the path of the output beam of a rotary Optical Path Difference scanning assembly leading to an electrically responsive detector is maintained substantially fixed in space for any scan angle within predetermined limits, thus obviating a serious drawback of a prior art proposal wherein the output beam translates significantly over the detector face with changes in scan angle, with the result that the detector output is vitiated by totally spurious variations of the energy reaching it.In one embodiment, the scanning assembly comprises a beam splitter having a semi-reflective layer the output face of which cooperates with the face of an output mirror normal thereto, the axis of rotation being substantially coincident with the line of intersection between the prolongation planes of the two faces. A Fourier Transform spectrophotometer embodying the assembly is also described.
Abstract translation: 在干涉测量装置中，导致电响应检测器的旋转光路差分扫描组件的输出光束的路径在空间内保持基本上固定在预定限度内的任何扫描角度，从而避免了现有技术方案的严重缺点，其中 输出光束随着扫描角度的变化而显着地在检测器面上平移，结果是检测器输出通过到达它的能量的完全杂散变化来破坏。 在一个实施例中，扫描组件包括具有半反射层的分束器，该半反射层的输出面与其正常的输出镜的表面配合，旋转轴线基本上与延伸平面之间的交叉线重合 两面。 还描述了体现组件的傅里叶变换分光光度计。
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公开(公告)号：US4666296A
公开(公告)日：1987-05-19
申请号：US691069
申请日：1985-01-14
Applicant: Rene Bailly-Salins
Inventor： Rene Bailly-Salins
CPC classification number: G01P3/36
Abstract: A velocity interferometer has a continuously variable sensitivity and is particularly applicable to the study of the movement of reflecting polished surfaces or back-scattered rough surfaces. The interferometer is a Michelson interferometer with a widened field comprising in a per se known manner a light splitter and two light reflectors, one of which is associated with a medium having parallel faces. The medium is constituted by a fluid in which the associated reflector is immersed and displaceable in translation parallel to the path of the light falling on it, the other reflector also being displaceable in translation parallel to the path of the light falling thereon.
Abstract translation: 速度干涉仪具有连续可变的灵敏度，特别适用于研究反射抛光表面或背散射粗糙表面的运动。 干涉仪是具有加宽场的迈克尔逊干涉仪，其以本身已知的方式包括光分离器和两个光反射器，其中一个与具有平行面的介质相关联。 介质由流体组成，其中相关联的反射器被浸入并平移于落在其上的光的路径平移移位，另一个反射器也可以平行于其上落在其上的光的路径平移地移位。
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