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    Laser-scatter measurement instrument having carousel-based fluid sample arrangement
    21.
    发明授权
    Laser-scatter measurement instrument having carousel-based fluid sample arrangement 有权

    公开(公告)号：US10006857B2

    公开(公告)日：2018-06-26

    申请号：US15005321

    申请日：2016-01-25

    Applicant: BacterioScan LTD

    Inventor： Dana A. Marshall ,  Dan Vadim Regelman

    IPC: G01N21/51 ,  G01N21/03

    CPC classification number: G01N21/51 ,  G01N21/0303 ,  G01N2021/513 ,  G01N2201/0231 ,  G01N2201/0415

    Abstract: An instrument determines a concentration of bacteria in a plurality of fluid samples, and comprises a housing, a rotatable platform, a plurality of fluid containers, a light source, a sensor, and a motor. The rotatable platform is within the housing. The fluid containers are located on the rotatable platform. Each fluid container holds a corresponding one of the plurality of fluid samples, and has an input window and an output window. The light source provides an input beam for transmission into the input windows of the fluid containers and through the corresponding fluid samples. The input beam creates a forward-scatter signal associated with the concentration of bacteria. The motor rotates the rotatable platform so that the input beam sequentially passes through each fluid sample. A sensor within the housing detects the forward-scatter signal exiting from the output window associated with the fluid sample receiving the input beam.

    HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
    24.
    发明申请
    HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS 审中-公开
    高速，3-D光学检测部件的方法和系统

    公开(公告)号：US20150253259A1

    公开(公告)日：2015-09-10

    申请号：US14722329

    申请日：2015-05-27

    Applicant: GII ACQUISITION, LLC dba GENERAL INSPECTION, LLC

    Inventor： Michael G. Nygaard ,  Gregory M. Nygaard

    IPC: G01N21/88 ,  G01N21/952 ,  G01N21/95

    CPC classification number: G01N21/8851 ,  G01N21/9515 ,  G01N21/952 ,  G01N2201/0415 ,  G01N2201/102

    Abstract: A high-speed, 3-D method and system for optically inspecting parts are provided. The system includes a part transfer subsystem including a transfer mechanism adapted to support a part at a loading station and transfer the supported part from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. The system also includes an illumination assembly to simultaneously illuminate an end surface of the part and a peripheral surface of the part. The system further includes a lens and detector assembly to form an optical image of the illuminated end surface and an optical image of the illuminated peripheral surface of the part and to detect the optical images. The system still further includes a processor to process the detected optical images to obtain an end view of the part and a 3-D panoramic view of the peripheral surface of the part.

    Abstract translation: 提供了一种用于光学检查零件的高速，3-D方法和系统。 该系统包括部件传送子系统，其包括适于在加载站处支撑部件的传送机构，并将被支撑部件从装载站传送到检查站，在该检查站，部件具有用于检查的预定位置和方向。 该系统还包括同时照亮部件的端面和部件的外周表面的照明组件。 该系统还包括透镜和检测器组件，以形成被照射的端面的光学图像和该部分的被照射的外围表面的光学图像并检测光学图像。 该系统还包括处理检测到的光学图像以获得该部分的端视图和该部分的外围表面的3-D全景图的处理器。

    Automatic analyzer
    25.
    发明授权
    Automatic analyzer 有权
    自动分析仪

    公开(公告)号：US09080972B2

    公开(公告)日：2015-07-14

    申请号：US13979668

    申请日：2012-01-10

    Applicant: Akihisa Makino ,  Sakuichiro Adachi

    Inventor： Akihisa Makino ,  Sakuichiro Adachi

    IPC: G01N21/53 ,  G01N21/49 ,  G01N21/51 ,  G01N35/00

    CPC classification number: G01N21/49 ,  G01N21/51 ,  G01N35/00693 ,  G01N2201/0415 ,  G01N2201/1211

    Abstract: The scattered light from the measurement target substance passes through a light receiving window, and is received by a detector for +θ scattered light and a detector for −θ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source is fixed by a light-source holder (that is a base member on which the light source is arranged), and the detectors are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged). In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors.

    Abstract translation: 来自测量对象物质的散射光通过光接收窗口，并被检测器接收+ 散射光和检测器 - ＆thetas; 散射光在垂直方向上以等角度或等间隔的光轴彼此对称地布置。 光源由光源保持器（即配置有光源的基底部件）固定，检测器被配置在检测器支架（作为检测器布置在其上的基底部件）上并固定 ）。 以这种方式，可以通过比较检测器的光量数据的值来校正由光学系统的热变形引起的光量数据的漂移。

    HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
    28.
    发明申请
    HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS 审中-公开

    公开(公告)号：US20130235371A1

    公开(公告)日：2013-09-12

    申请号：US13414081

    申请日：2012-03-07

    Applicant: Michael G. Nygaard ,  Gregory M. Nygaard

    Inventor： Michael G. Nygaard ,  Gregory M. Nygaard

    IPC: G01N21/88

    CPC classification number: G01N21/8851 ,  G01N21/9515 ,  G01N21/952 ,  G01N2201/0415 ,  G01N2201/102

    Abstract: A high-speed, 3-D method and system for optically inspecting parts are provided. The system includes a part transfer subsystem including a transfer mechanism adapted to support a part at a loading station and transfer the supported part from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. The system also includes an illumination assembly to simultaneously illuminate an end surface of the part and a peripheral surface of the part. The system further includes a lens and detector assembly to form an optical image of the illuminated end surface and an optical image of the illuminated peripheral surface of the part and to detect the optical images. The system still further includes a processor to process the detected optical images to obtain an end view of the part and a 3-D panoramic view of the peripheral surface of the part.

    Optical measurement arrangement
    29.
    发明授权
    Optical measurement arrangement 有权
    光学测量装置

    公开(公告)号：US08309897B2

    公开(公告)日：2012-11-13

    申请号：US12697618

    申请日：2010-02-01

    Applicant: Gal Ingber

    Inventor： Gal Ingber

    IPC: G01J1/32 ,  G01N35/02 ,  G01N21/03 ,  G01N33/539

    CPC classification number: G01J1/32 ,  G01J3/42 ,  G01J2003/2866 ,  G01N21/031 ,  G01N21/253 ,  G01N2201/0415 ,  G01N2201/0469 ,  G01N2201/0692

    Abstract: A method and device for enhancing the power correction of optical measurements in an optical measurement arrangement, the steps including: providing a light source for producing a light beam; splitting the light beam into two beams; directing a first split light beam through an interrogation area and into an optics separation device; directing the light beams from the optics separation device and a second split light beam representing the intensity of the illumination of the main light beam of the light source into cells of a detector array; measuring and assessing the information obtained in the cells; and using this information to calculate the corrected value for the cells receiving the light beams from the optics separation device in order to adjust the power for the intensity of the light beam of the light source and/or to correct the intensity of the light beams from the interrogation area.

    Abstract translation: 一种用于增强光学测量装置中的光学测量的功率校正的方法和装置，所述步骤包括：提供用于产生光束的光源; 将光束分成两束; 将第一分裂光束引导通过询问区并进入光学分离装置; 引导来自光学分离装置的光束和将光源的主光束的照明强度表示为检测器阵列的单元的第二分裂光束; 测量和评估细胞中获得的信息; 并且使用该信息来计算接收来自光学分离装置的光束的单元的校正值，以便调整光源的光束强度的功率和/或校正来自光源的光束的强度 询问区。

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