Abstract:
The output of optical computing devices containing an integrated computational element can be corrected when an interferent substance or condition is present. The devices may comprise an optional electromagnetic radiation source; a sample detection unit comprising an integrated computational element and a detector configured to receive electromagnetic radiation that has optically interacted with the integrated computational element and produce a sample signal associated therewith; an interferent monitor located proximal to the sample detection unit, the interferent monitor being configured to produce an interferent signal associated with an interferent substance; and a signal processing unit operable to convert the interferent signal into an interferent input form suitable for being computationally combined with the sample signal, the signal processing unit being further operable to computationally combine the sample signal and the interferent input form to determine a characteristic of a sample in real-time or near real-time.
Abstract:
The CO2 content in a liquid, in particular a beverage, is to be tested. Three absorption measurements of the liquid are carried out respectively at a wavelength within a first wavelength range between 4200 and 4300 nm to measure a first absorption value with attenuated total reflectance, at a second wavelength within a second wavelength range between 3950 and 4050 nm and a second absorption value with attenuated total reflectance, and at a third wavelength within a third wavelength range between 3300 and 3900 nm and a third absorption value with attenuated total reflectance. A pre-defined model function is used for determining the CO2 content based on the first, second and third absorption values. The model function is applied to the absorption values and the result of the evaluation is kept available as the CO2 content of the liquid to be tested.
Abstract:
An automatic analyzing apparatus which can make an adjustment to a target temperature so as to stabilize the light intensity of an LED and also can make the adjustment to that temperature in a short time is provided. The automatic analyzing apparatus in which an LED is used for a light source 114 includes a temperature adjusting mechanism 201 for the LED, and the temperature adjusting mechanism 201 includes a metal member 202 provided with the light source 114, a pair of metal pipes (water-flowing pipes) 203 buried in the metal member 202 and allowing constant-temperature bath water to flow therein, and pins (small metal piece members) 204 bringing only a heat-generating lead 252 of the light source 114 into direct contact with the metal member 202. Therefore, the temperature adjusting mechanism 201 can make an adjustment to a target temperature so as to stabilize the light intensity of the LED, and the adjustment to that temperature can be made in a short time.
Abstract:
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
Abstract:
A sensor unit is disclosed which includes a sensor and an information module. The sensor exhibits an optical behavior dependent on at least one variable of a sample. Sensor related information can be emitted by the information module as optical radiation. In embodiments the sensor related information includes calibration data for the sensor. The sensor related information may additionally include identification data for the sensor. In embodiments the information module measures at least one ambient parameter, and emits the measurement value in an optical signal. The measurement value is taken into account when determining at least one variable of a sample by means of the sensor unit. In embodiments the information module may also transmit status information of the sensor unit. Furthermore a method for determining a variable of a sample with a sensor unit and a measurement system is disclosed.
Abstract:
A sample sensor (200) for detecting a concentration of a sample in a sample mixture, the sample sensor (200) comprising a light source (101), a detector element, a processing section (106) and parameter measuring means. The light source (101) produces a light beam (113) for exciting molecules of the sample. The detector element detects an 5 amount of excited molecules of the sample and provides a detector current indicating the amount. The processing section (106) is coupled to the detector element (103) for processing the detector current to generate an output signal (109) representing the concentration. The processing section (106) comprises a temperature compensation module (112) being arranged for compensating for a temperature dependent wavelength shift of the light source (101) 10 based on at least one measured value of a temperature dependent parameter of the light source (101), other than an output wavelength. The parameter measuring means obtain the at least one measured value.
Abstract:
A system and method are described herein for self-referencing a sensor that is used to detect a biomolecular binding event and/or kinetics which occur in a sample solution flowing along side a reference solution in a micron-sized deep flow channel.
Abstract:
A system is provided that includes a light-emitting diode (LED); a temperature sensor in thermal contact with the LED and capable of measuring an operating temperature and generating an operating temperature signal; and a temperature regulating system capable of receiving the operating temperature signal and regulating the operating temperature based on the operating temperature signal. A method for stabilizing the temperature of an LED is provided. A method is provided that includes providing a system comprising an LED, a reaction region, and a sample in the reaction region; generating excitation beams with the LED; directing excitation beams to the sample; detecting an optical property of the sample to obtain detection data; measuring the- operating temperature of the light emitting diode; and adjusting the detection data of an excitation beam characteristic shift related to the operating temperature, when the LED is operated at the operating temperature to generate the excitation beams.
Abstract:
A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.
Abstract:
A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.