Devices Having an Integrated Computational Element and a Proximal Interferent Monitor and Methods for Determining a Characteristic of a Sample Therewith
    21.
    发明申请
    Devices Having an Integrated Computational Element and a Proximal Interferent Monitor and Methods for Determining a Characteristic of a Sample Therewith 有权
    具有集成计算元件和近端干涉仪的装置以及用于确定样品特性的方法

    公开(公告)号:US20130287061A1

    公开(公告)日:2013-10-31

    申请号:US13456259

    申请日:2012-04-26

    Abstract: The output of optical computing devices containing an integrated computational element can be corrected when an interferent substance or condition is present. The devices may comprise an optional electromagnetic radiation source; a sample detection unit comprising an integrated computational element and a detector configured to receive electromagnetic radiation that has optically interacted with the integrated computational element and produce a sample signal associated therewith; an interferent monitor located proximal to the sample detection unit, the interferent monitor being configured to produce an interferent signal associated with an interferent substance; and a signal processing unit operable to convert the interferent signal into an interferent input form suitable for being computationally combined with the sample signal, the signal processing unit being further operable to computationally combine the sample signal and the interferent input form to determine a characteristic of a sample in real-time or near real-time.

    Abstract translation: 当存在干扰物质或条件时,可以校正包含集成计算元件的光学计算装置的输出。 这些装置可以包括可选的电磁辐射源; 样本检测单元,包括集成的计算元件和被配置为接收与所述集成的计算元件光学相互作用并产生与其相关联的采样信号的电磁辐射的检测器; 位于样本检测单元附近的干扰物监测器,所述干扰物监测器被配置为产生与干扰物质相关的干扰信号; 信号处理单元,可操作以将干扰信号转换成适合于与采样信号进行计算组合的干扰输入形式,所述信号处理单元还可操作以计算地组合采样信号和干扰输入形式,以确定 实时或近实时采样。

    METHOD AND DEVICE OF DETERMINING A CO2 CONTENT IN A LIQUID
    22.
    发明申请
    METHOD AND DEVICE OF DETERMINING A CO2 CONTENT IN A LIQUID 审中-公开
    在液体中测定二氧化碳含量的方法和装置

    公开(公告)号:US20130275052A1

    公开(公告)日:2013-10-17

    申请号:US13771543

    申请日:2013-02-20

    Abstract: The CO2 content in a liquid, in particular a beverage, is to be tested. Three absorption measurements of the liquid are carried out respectively at a wavelength within a first wavelength range between 4200 and 4300 nm to measure a first absorption value with attenuated total reflectance, at a second wavelength within a second wavelength range between 3950 and 4050 nm and a second absorption value with attenuated total reflectance, and at a third wavelength within a third wavelength range between 3300 and 3900 nm and a third absorption value with attenuated total reflectance. A pre-defined model function is used for determining the CO2 content based on the first, second and third absorption values. The model function is applied to the absorption values and the result of the evaluation is kept available as the CO2 content of the liquid to be tested.

    Abstract translation: 要测试液体中的二氧化碳含量,特别是饮料中的二氧化碳含量。 分别在4200和4300nm之间的第一波长范围内的波长上进行液体的三次吸收测量,以在3950和4050nm之间的第二波长范围内的第二波长测量具有衰减的总反射率的第一吸收值, 具有衰减的全反射率的第二吸收值,以及在3300和3900nm之间的第三波长范围内的第三波长和具有衰减的总反射率的第三吸收值。 基于第一,第二和第三吸收值,使用预定义的模型函数来确定CO 2含量。 将模型函数应用于吸收值,并且评估结果作为待测液体的CO 2含量保持可用。

    AUTOMATIC ANALYZING APPARATUS
    23.
    发明申请
    AUTOMATIC ANALYZING APPARATUS 审中-公开
    自动分析仪

    公开(公告)号:US20130243657A1

    公开(公告)日:2013-09-19

    申请号:US13988083

    申请日:2011-10-19

    Abstract: An automatic analyzing apparatus which can make an adjustment to a target temperature so as to stabilize the light intensity of an LED and also can make the adjustment to that temperature in a short time is provided. The automatic analyzing apparatus in which an LED is used for a light source 114 includes a temperature adjusting mechanism 201 for the LED, and the temperature adjusting mechanism 201 includes a metal member 202 provided with the light source 114, a pair of metal pipes (water-flowing pipes) 203 buried in the metal member 202 and allowing constant-temperature bath water to flow therein, and pins (small metal piece members) 204 bringing only a heat-generating lead 252 of the light source 114 into direct contact with the metal member 202. Therefore, the temperature adjusting mechanism 201 can make an adjustment to a target temperature so as to stabilize the light intensity of the LED, and the adjustment to that temperature can be made in a short time.

    Abstract translation: 一种自动分析装置,其可以对目标温度进行调节,以稳定LED的光强度,并且还可以在短时间内对该温度进行调节。 其中LED用于光源114的自动分析装置包括用于LED的温度调节机构201,温度调节机构201包括设置有光源114的金属构件202,一对金属管(水 埋入金属构件202中并允许恒温槽水流入其中的引脚(小金属构件)204,仅使光源114的发热引线252与金属直接接触 因此,温度调节机构201可以调节目标温度以稳定LED的光强度,并且可以在短时间内对该温度进行调节。

    SENSOR UNIT AND MEASUREMENT METHOD
    25.
    发明申请
    SENSOR UNIT AND MEASUREMENT METHOD 有权
    传感器单元和测量方法

    公开(公告)号:US20120291515A1

    公开(公告)日:2012-11-22

    申请号:US13471917

    申请日:2012-05-15

    Abstract: A sensor unit is disclosed which includes a sensor and an information module. The sensor exhibits an optical behavior dependent on at least one variable of a sample. Sensor related information can be emitted by the information module as optical radiation. In embodiments the sensor related information includes calibration data for the sensor. The sensor related information may additionally include identification data for the sensor. In embodiments the information module measures at least one ambient parameter, and emits the measurement value in an optical signal. The measurement value is taken into account when determining at least one variable of a sample by means of the sensor unit. In embodiments the information module may also transmit status information of the sensor unit. Furthermore a method for determining a variable of a sample with a sensor unit and a measurement system is disclosed.

    Abstract translation: 公开了一种传感器单元,其包括传感器和信息模块。 传感器表现出取决于样品的至少一个变量的光学行为。 传感器相关信息可由信息模块作为光辐射发射。 在实施例中,传感器相关信息包括传感器的校准数据。 传感器相关信息可另外包括传感器的识别数据。 在实施例中,信息模块测量至少一个环境参数,并且在光信号中发射测量值。 当通过传感器单元确定样品的至少一个变量时,考虑测量值。 在实施例中,信息模块还可以发送传感器单元的状态信息。 此外,公开了一种用传感器单元和测量系统确定样品的变量的方法。

    Sample concentration detector with temperature compensation
    26.
    发明授权
    Sample concentration detector with temperature compensation 失效
    带温度补偿的样品浓度检测器

    公开(公告)号:US08233150B2

    公开(公告)日:2012-07-31

    申请号:US12518470

    申请日:2007-12-10

    CPC classification number: G01N21/1702 G01N21/274 G01N21/3504 G01N2201/1211

    Abstract: A sample sensor (200) for detecting a concentration of a sample in a sample mixture, the sample sensor (200) comprising a light source (101), a detector element, a processing section (106) and parameter measuring means. The light source (101) produces a light beam (113) for exciting molecules of the sample. The detector element detects an 5 amount of excited molecules of the sample and provides a detector current indicating the amount. The processing section (106) is coupled to the detector element (103) for processing the detector current to generate an output signal (109) representing the concentration. The processing section (106) comprises a temperature compensation module (112) being arranged for compensating for a temperature dependent wavelength shift of the light source (101) 10 based on at least one measured value of a temperature dependent parameter of the light source (101), other than an output wavelength. The parameter measuring means obtain the at least one measured value.

    Abstract translation: 用于检测样品混合物中样品浓度的样品传感器(200),所述样品传感器(200)包括光源(101),检测器元件,处理部分(106)和参数测量装置。 光源(101)产生用于激发样品分子的光束(113)。 检测器元件检测样品的5个激发分子量,并提供指示量的检测器电流。 处理部分(106)耦合到检测器元件(103),用于处理检测器电流以产生表示浓度的输出信号(109)。 处理部分(106)包括温度补偿模块(112),其被配置为基于光源(101)的温度依赖参数的至少一个测量值来补偿光源(101)10的温度相关波长偏移 ),而不是输出波长。 参数测量装置获得至少一个测量值。

    Temperature control for light-emitting diode stabilization
    28.
    发明申请
    Temperature control for light-emitting diode stabilization 审中-公开
    温度控制用于发光二极管稳定

    公开(公告)号:US20110159549A1

    公开(公告)日:2011-06-30

    申请号:US12895848

    申请日:2010-09-30

    Abstract: A system is provided that includes a light-emitting diode (LED); a temperature sensor in thermal contact with the LED and capable of measuring an operating temperature and generating an operating temperature signal; and a temperature regulating system capable of receiving the operating temperature signal and regulating the operating temperature based on the operating temperature signal. A method for stabilizing the temperature of an LED is provided. A method is provided that includes providing a system comprising an LED, a reaction region, and a sample in the reaction region; generating excitation beams with the LED; directing excitation beams to the sample; detecting an optical property of the sample to obtain detection data; measuring the- operating temperature of the light emitting diode; and adjusting the detection data of an excitation beam characteristic shift related to the operating temperature, when the LED is operated at the operating temperature to generate the excitation beams.

    Abstract translation: 提供一种包括发光二极管(LED)的系统; 与LED热接触的温度传感器,能够测量工作温度并产生工作温度信号; 以及能够基于工作温度信号接收工作温度信号和调节工作温度的温度调节系统。 提供了一种用于稳定LED的温度的方法。 提供了一种方法,其包括在反应区域中提供包括LED,反应区域和样品的系统; 用LED产生激励光束; 将激发光束引导到样品; 检测样品的光学特性以获得检测数据; 测量发光二极管的工作温度; 并且当LED在工作温度下操作以产生激发光束时,调整与工作温度相关的激发光束特性偏移的检测数据。

    Defect inspecting apparatus
    29.
    发明授权
    Defect inspecting apparatus 失效
    缺陷检查装置

    公开(公告)号:US07733475B2

    公开(公告)日:2010-06-08

    申请号:US12428065

    申请日:2009-04-22

    Abstract: A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.

    Abstract translation: 本发明的缺陷检查装置解决了在缺陷检查装置中,由于通过减小检测像素尺寸来提高微观缺陷的检测灵敏度,焦点深度变浅,成像高度由于环境变化而变化, 缺陷的检测灵敏度变得不稳定。 该装置包括XY台,其承载要检查的基板并沿预定方向扫描;以及机构,其具有以倾斜方式照射被检查基板上的缺陷的系统,并且通过设置在所述检测光学系统上的检测光学系统检测所述缺陷 上部,其实时校正成像的高度以改变温度和大气压力,以便将成像保持在最佳状态。

    Defect inspecting apparatus
    30.
    发明授权
    Defect inspecting apparatus 失效
    缺陷检查装置

    公开(公告)号:US07535561B2

    公开(公告)日:2009-05-19

    申请号:US11717651

    申请日:2007-03-14

    Abstract: A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.

    Abstract translation: 本发明的缺陷检查装置解决了在缺陷检查装置中,由于通过减小检测像素尺寸来提高微观缺陷的检测灵敏度,焦点深度变浅,成像高度由于环境变化而变化, 缺陷的检测灵敏度变得不稳定。 该装置包括XY台,其承载待检查的基板和沿预定方向扫描的机构,以及具有以倾斜方式照射被检查基板上的缺陷的系统的机构,并且通过设置在该检测光学系统上的检测光学系统检测该缺陷 上部,其实时校正成像的高度以改变温度和大气压力,以便将成像保持在最佳状态。

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