公开(公告)号：US10231623B2

公开(公告)日：2019-03-19

申请号：US15425360

申请日：2017-02-06

Applicant: NANOWEAR INC.

Inventor： Vijay K. Varadan ,  Pratyush Rai ,  Se Chang Oh

IPC: H05K3/30 ,  A61B5/00 ,  H05K1/03 ,  H01L51/05 ,  B41F17/00 ,  B41F17/38 ,  G06F19/00 ,  G16H40/67 ,  A61B5/024 ,  A61B5/04 ,  A61B5/0496 ,  A61B5/053 ,  A61B5/11 ,  H05K1/18

Abstract: A roll-to-roll printing process for large scale manufacturing of nanosensor systems for sensing pathophysiological signals is disclosed. The roll-to-roll manufacturing process may include three processes to improve the throughput and to reduce the cost in manufacturing: fabrication of textile based nanosensors, printing conductive tracks, and integration of electronics. The wireless nanosensor systems can be used in different monitoring applications. The fabric sheet printed and integrated with the customized components can be used in a variety of different applications. The electronics in the nanosensor systems connect to remote severs through adhoc networks or cloud networks with standard communication protocols or non-standard customized protocols for remote health monitoring.

公开(公告)号：US20180330918A1

公开(公告)日：2018-11-15

申请号：US15974176

申请日：2018-05-08

Applicant: NANOWEAR INC.

Inventor： Vijay Varadan ,  Pratyush Rai ,  Gyanesh Mathur

IPC: H01J37/28 ,  H01J37/20 ,  G01Q60/42

CPC classification number: H01J37/28 ,  B82Y35/00 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q60/30 ,  G01Q60/42 ,  H01J37/20 ,  H01J2237/2803 ,  H01J2237/2814

Abstract: A system and method is provided for of characterizing nanostructured surfaces. A nanostructure sample is placed in an SEM chamber and imaged. The system and method locates one of the nanostructures using images from the SEM imaging, excises a top portion of the nanostructure, places said top portion on a substrate such that the nanostructures are perpendicular to the substrate and a base of the top portion contacts the substrate, performs high energy ion beam assisted deposition of metal at the base to attach the top portion to the substrate, SEM imaging the top portions in the SEM chamber, determining coordinates of the top portions relative to the substrate from the SEM imaging of the top portions, placing the substrate in an AFM chamber, and performing AFM imaging of the top portions using the coordinates previously determined.