公开(公告)号：US20080205480A1

公开(公告)日：2008-08-28

申请号：US11916593

申请日：2006-06-07

Applicant: Jose Raposo Barbosa ,  Luiz Fernando Marzano ,  Fabiano Correa Martins ,  Marlon Odilon Xavier Silva ,  Aloisio da Silva Gomes

Inventor： Jose Raposo Barbosa ,  Luiz Fernando Marzano ,  Fabiano Correa Martins ,  Marlon Odilon Xavier Silva ,  Aloisio da Silva Gomes

IPC: G01J5/00

CPC classification number: G01J5/041 ,  G01J5/004 ,  G01J5/046 ,  G01J5/048 ,  G01J5/061 ,  G01J5/08 ,  G01J5/0821 ,  G01J5/0893 ,  G01J5/60 ,  G01J2005/068

Abstract: The system developed for the continuos temperature measurement of molten metal (1), like in the case of the continuous casting machine tundish (2), uses an optical process to control the continuous casting machine speed, and it consists of an optical infra-red sensor (8) protected by a cooled jacket (30). This two-color sensor (8), fitted with optical fiber (9) and an optical signal converter (10), is focused inside a high thermal and light conductivity ceramic tube (15), and it enables accurate temperature readings of molten steel (1) in the tundish (2).This practical device avoids the inconvenience of the method currently being used. It reduces the operator's high temperature exposure time, lowers maintenance downtime, minimizes the operating risks, improves safety and enables fast, simple replacement, resulting in improved slab quality and, as a consequence, lower costs.

Abstract translation: 开发用于连续铸造中间包（2）的熔融金属（1）的连续温度测量的系统使用光学工艺来控制连铸机的速度，并且由光学红外线 传感器（8）由冷却的夹套（30）保护。 装配有光纤（9）和光信号转换器（10）的双色传感器（8）聚焦在高导热陶瓷管（15）的内部，并且能够精确地测量钢水温度 1）在中间包（2）中。 这种实用的装置避免了当前使用的方法的不便。 它降低了操作员的高温暴露时间，降低了维护停机时间，最大限度地降低了操作风险，提高了安全性，实现了快速，简单的更换，从而提高了板坯质量，从而降低了成本。

公开(公告)号：US20080099683A1

公开(公告)日：2008-05-01

申请号：US11553373

申请日：2006-10-26

Applicant: Matthew F. Schmidt ,  Kirk Johnson ,  Shane M. Anderson

Inventor： Matthew F. Schmidt ,  Kirk Johnson ,  Shane M. Anderson

IPC: G01J5/02

CPC classification number: G01J5/08 ,  G01J5/026 ,  G01J5/0806 ,  G01J5/089 ,  G01J2005/0077 ,  G01J2005/068 ,  H04N5/2258 ,  H04N5/33

Abstract: An infrared imaging system used for providing images from a plurality of views. The multiple view infrared imaging system includes a plurality of lens and infrared focal plane array (FPA) pairings, wherein each pairing can be used to provide an image and/or sample scene data of a distinct view. A single set of processing circuitry and a single set of one or more output elements may be utilized to provide such images. A multi-input switch may be utilized in combination with the single set of processing circuitry and output elements to provide images from any of the lens and FPA pairings based on the positioning of the switch.

Abstract translation: 一种用于从多个视图提供图像的红外成像系统。 多视图红外成像系统包括多个透镜和红外焦平面阵列（FPA）配对，其中每个配对可用于提供不同视图的图像和/或样本场景数据。 可以使用单组处理电路和一组一个或多个输出元件来提供这样的图像。 可以将多输入开关与单组处理电路和输出元件结合使用，以根据开关的定位提供来自任何透镜和FPA配对的图像。

公开(公告)号：US20060153278A1

公开(公告)日：2006-07-13

申请号：US11032119

申请日：2005-01-11

Applicant: Kun-Sung Chen ,  Ying-Chao Lin ,  Hsing Ouyang ,  Yao Ouyang ,  Chun-Nan Chen ,  Ching-Chin Shiao ,  Hung-Chang Huang ,  Chen-Lin Chiu

Inventor： Kun-Sung Chen ,  Ying-Chao Lin ,  Hsing Ouyang ,  Yao Ouyang ,  Chun-Nan Chen ,  Ching-Chin Shiao ,  Hung-Chang Huang ,  Chen-Lin Chiu

IPC: G01K1/08 ,  G01J5/00 ,  G01K1/00

CPC classification number: G01J5/02 ,  G01J5/0235 ,  G01J5/04 ,  G01J5/049 ,  G01J2005/068

Abstract: An ear thermometer has a main body, and a probe projected from the main body. The ear thermometer has a casing, a sensor module and a plastic tube. The casing has an opening formed in a front side thereof. The sensor module is installed inside the casing. The plastic tube is installed between the casing and the sensor module for positioning the sensor module inside the casing. The probe has an opening formed in a front side thereof for receiving the infrared radiation in a predetermined range. Hence, the sensor module is used to measure true radiation heat from a subject, and prevents the sensor module from measuring an object other than the subject.

Abstract translation: 耳温度计具有主体和从主体突出的探针。 耳温度计具有外壳，传感器模块和塑料管。 壳体具有形成在其前侧的开口。 传感器模块安装在外壳内。 塑料管安装在外壳和传感器模块之间，用于将传感器模块定位在外壳内。 探针具有形成在其前侧的开口，用于接收预定范围内的红外辐射。 因此，传感器模块用于测量来自被摄体的真实辐射热，并且防止传感器模块测量除被摄体以外的物体。

公开(公告)号：US07030378B2

公开(公告)日：2006-04-18

申请号：US10634215

申请日：2003-08-05

Applicant: Thomas P. Allen ,  Neal R. Butler

Inventor： Thomas P. Allen ,  Neal R. Butler

IPC: G01J5/00 ,  H01L25/00

CPC classification number: H04N5/3655 ,  G01J5/06 ,  G01J2005/068 ,  H01L27/146 ,  H04N5/33 ,  H04N5/3651

Abstract: One embodiment of the invention is directed to methods and apparatus for determining a variation of a calibration parameter of a pixel of the thermal sensor during operation of the imaging apparatus, after an initial calibration procedure. Another embodiment of the invention is directed to methods and apparatus for calculating a gain calibration parameter using first and second ambient temperature values and respective first and second resistance values for a pixel of a sensor. A further embodiment of the invention is directed to calculating an offset calibration parameter for at least one pixel using a gain of the at least one pixel between first and second times and an ambient temperature at a third time, wherein the pixel is exposed to both scene and ambient radiation at the third time.

Abstract translation: 本发明的一个实施例涉及用于在初始校准程序之后确定成像装置操作期间热传感器的像素的校准参数的变化的方法和装置。 本发明的另一个实施例涉及使用第一和第二环境温度值以及传感器的像素的相应的第一和第二电阻值来计算增益校准参数的方法和装置。 本发明的另一实施例涉及使用第一次和第二次之间的至少一个像素的增益和第三次的环境温度来计算至少一个像素的偏移校准参数，其中该像素暴露于两个场景 和环境辐射。

公开(公告)号：US06991368B2

公开(公告)日：2006-01-31

申请号：US10246246

申请日：2002-09-17

Applicant: Jonathan Gerlitz

Inventor： Jonathan Gerlitz

IPC: G01J5/04 ,  G01J5/32 ,  G01K1/16 ,  G01K3/08

CPC classification number: G01J5/04 ,  G01J5/02 ,  G01J5/0275 ,  G01J5/028 ,  G01J5/049 ,  G01J5/06 ,  G01J5/061 ,  G01J5/16 ,  G01J2005/068

Abstract: An infrared ear thermometer includes a detector head housing, a heat sink, a recess formed in the heat sink, a thermopile sensor mounted within the recess, a thermistor, and temperature determination circuitry. The recess defines an aperture that limits the field of view of the thermopile sensor. The thermal capacities and conductivities of the heat sink and the thermopile sensor are selected so that the output signal of the thermopile sensor stabilizes during a temperature measurement. A method of determining temperature using the ear thermometer takes successive measurements, stores the measurements in a moving time window, averages the measurements in the moving window, determines whether the average has stabilized, and outputs an average temperature. A method of calculating a subject's temperature determines the temperature of a cold junction of the thermopile, looks up a bias and slope of the thermopile based upon the temperature of the cold junction, measures the output of the thermopile, and calculates the subject's temperature based upon a linear relationship between the output and the subject's temperature. The linear relationship is defined by the bias and the slope.

公开(公告)号：US20050018749A1

公开(公告)日：2005-01-27

申请号：US10873461

申请日：2004-06-23

Applicant: Taiga Sato ,  Hiroyuki Ota ,  Tetsuya Sato ,  Yoshihide Onishi

Inventor： Taiga Sato ,  Hiroyuki Ota ,  Tetsuya Sato ,  Yoshihide Onishi

IPC: G01K7/00 ,  A61B5/01 ,  G01J5/00 ,  G01J5/02 ,  G01J5/04 ,  G01K13/00

CPC classification number: G01J5/04 ,  G01J5/02 ,  G01J5/025 ,  G01J5/026 ,  G01J5/049 ,  G01J2005/068

Abstract: Temperature states of a clinical thermometer body and an environment are estimated by temperatures measured by a first temperature sensor integrally formed together with an infrared sensor arranged to the distal end of a probe and a second temperature sensor arranged on the bottom side of a probe holder, and processes suitable for the respective temperature states are performed. An estimation error or the reliability of an estimation value is calculated by the temperatures to notify a user of the estimation error or the reliability by an LCD or the like.

Abstract translation: 通过与设置在探头的远端的红外线传感器一体形成的第一温度传感器和布置在探针保持器的底侧的第二温度传感器测量的温度估计临床体温计体和环境的温度状态， 并且执行适合于各自的温度状态的处理。 通过温度来计算估计误差或估计值的可靠性，以通过LCD等通知用户估计误差或可靠性。

公开(公告)号：US06799137B2

公开(公告)日：2004-09-28

申请号：US10197230

申请日：2002-07-16

Applicant: Charles W. Schietinger ,  Ronald A. Palfenier

Inventor： Charles W. Schietinger ,  Ronald A. Palfenier

IPC: G01K1130

CPC classification number: A61B17/34 ,  A61B17/3423 ,  A61B34/72 ,  G01J1/4204 ,  G01J5/0003 ,  G01J5/0007 ,  G01J5/02 ,  G01J5/026 ,  G01J5/0265 ,  G01J5/027 ,  G01J5/08 ,  G01J5/0806 ,  G01J5/0818 ,  G01J5/0821 ,  G01J5/0862 ,  G01J5/0893 ,  G01J5/522 ,  G01J2005/0048 ,  G01J2005/068 ,  G01K11/006

Abstract: The temperature of a semiconductor wafer (160) is measured while undergoing processing in a plasma (168) environment. At least two pyrometers (162, 164) receive radiation from, respectively, the semiconductor wafer and the plasma in a plasma process chamber. The first pyrometer receives radiation from either the front or rear surface of the wafer, and the second pyrometer receives radiation from the plasma. Both pyrometers may be sensitive to the same radiation wavelength. A controller (170) receives signals from the first and second pyrometers and calculates a corrected wafer emission, which is employed in the Planck Equation to calculate the wafer temperature. Alternatively, both pyrometers are positioned beneath the wafer with the first pyrometer sensitive to a first wavelength where the wafer is substantially opaque to plasma radiation, and the second pyrometer is sensitive to a wavelength where the wafer is substantially transparent to plasma radiation.

Abstract translation: 在等离子体（168）环境中进行处理时测量半导体晶片（160）的温度。 至少两个高温计（162,164）分别从等离子体处理室中的半导体晶片和等离子体接收辐射。 第一高温计从晶片的前表面或后表面接收辐射，而第二高温计接收来自等离子体的辐射。 两个高温计可能对相同的辐射波长敏感。 控制器（170）从第一和第二高温计接收信号，并计算校正的晶圆发射，其在普朗克方程中用于计算晶片温度。 或者，两个高温计位于晶片下方，其中第一高温计对第一波长敏感，其中晶片对于等离子体辐射基本上是不透明的，并且第二高温计对于等离子体辐射基本上透明的波长敏感。

公开(公告)号：US20040066832A1

公开(公告)日：2004-04-08

申请号：US10436256

申请日：2003-05-13

Inventor： Hung-Te Lin ,  Chung-Nan Chen ,  Chih-Hsiung Shen

IPC: G01K001/16

CPC classification number: G01J5/16 ,  G01J5/04 ,  G01J5/045 ,  G01J2005/068

Abstract: The present invention relates to a temperature measurement device, particularly to a temperature measurement device for the cold junction of a non-contact temperature measurement element, characterized in that a plurality of electrical-conductive pins is provided on the bottom surface of a base. A sensor element for detecting object temperature and a heat-conductive elongated block are provided on the top surface of the base, the heat-conductive elongated block having a sensor element for detecting ambient temperature secured on the top surface thereof, wherein the heat capacity of the sensor element for detecting ambient temperature together with that of the heat-conductive elongated block will approximately be equal to that of the sensor element for detecting object temperature, such that the heat-balance constants of the sensor element for detecting ambient temperature and the cold junction of the sensor element for detecting object temperature will virtually coincide with each other at an abrupt temperature change. Consequently, the dynamic temperature difference between the sensor element for detecting ambient temperature and the cold junction of the sensor element for detecting object temperature may be diminished. In this manner, not only the accuracy of the temperature measurement from the detected object may be raised significantly, but also the sensitivity of the measurement may be maintained effectively.

Abstract translation: 温度测量装置技术领域本发明涉及一种温度测量装置，特别涉及一种用于非接触式温度测量元件的冷接点的温度测量装置，其特征在于，在底座的底面上设有多个导电销。 用于检测物体温度的传感器元件和导热细长块设置在基座的顶表面上，导热细长块具有用于检测固定在其顶表面上的环境温度的传感器元件，其中热传导元件 用于检测环境温度的传感器元件与导热细长块的传感器元件将大致等于用于检测物体温度的传感器元件的传感器元件，使得用于检测环境温度和感冒的传感器元件的热平衡常数 用于检测物体温度的传感器元件的接点在突然的温度变化时将彼此实际重合。 因此，用于检测环境温度的传感器元件与用于检测物体温度的传感器元件的冷接点之间的动态温度差可能减小。 以这种方式，不仅可以显着提高来自检测对象的温度测量的精度，而且可以有效地保持测量的灵敏度。

公开(公告)号：US06703592B2

公开(公告)日：2004-03-09

申请号：US10309383

申请日：2002-12-02

Applicant: Frank B. M. Van Bilsen

Inventor： Frank B. M. Van Bilsen

IPC: H05B102

CPC classification number: H01L21/67248 ,  G01J5/00 ,  G01J5/0003 ,  G01J5/0007 ,  G01J2005/0048 ,  G01J2005/068 ,  H01L21/67115

Abstract: A CVD processing reactor employs a pyrometer to control temperature ramping. The pyrometer is calibrated between wafer processing by using a thermocouple that senses temperature during a steady state portion of a processing operation.

Abstract translation: CVD处理反应器采用高温计来控制温度斜坡。 通过使用在处理操作的稳态部分期间感测温度的热电偶在晶片处理之间校准高温计。

公开(公告)号：US20030180062A1

公开(公告)日：2003-09-25

申请号：US10390707

申请日：2003-03-19

Applicant: BROTHER KOGYO KABUSHIKI KAISHA

Inventor： Masashi Suzuki

IPC: G03G015/20

CPC classification number: G01J5/02 ,  G01J5/0022 ,  G01J5/025 ,  G01J5/026 ,  G01J5/08 ,  G01J5/0893 ,  G01J2005/068 ,  G03G15/2039

Abstract: A fixing device is provided with a heat roller, which is brought into contact with a fixing medium to heat the same, and is further provided with a thermopile which is set in non-contact with the heat roller and detects a temperature of the heat roller based upon infrared rays irradiated from the heat roller. Moreover, the fixing device is provided with a direct measurement thermistor that is provided separately from the thermopile and set in direct contact with the heat roller. The temperature detected by the thermopile is corrected based upon a temperature detected by the direct measurement thermistor.

Abstract translation: 定影装置设有加热辊，其与固定介质接触以对其加热，并且还设置有热电堆，该热电堆被设置为与加热辊不接触并检测加热辊的温度 基于从加热辊照射的红外线。 此外，定影装置设置有与热电堆分开设置并直接与加热辊直接接触的直接测量热敏电阻。 基于由直接测量热敏电阻检测的温度来校正由热电堆检测的温度。