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    Processing apparatus and particle securing method
    32.
    发明授权
    Processing apparatus and particle securing method 有权

    公开(公告)号：US09874517B2

    公开(公告)日：2018-01-23

    申请号：US14644717

    申请日：2015-03-11

    Applicant: Konica Minolta, Inc.

    Inventor： Keita Saito ,  Midori Shimomura ,  Dai Suwama ,  Sayaka Morita

    IPC: G01N21/00 ,  G01N21/49 ,  G01N21/55

    CPC classification number: G01N21/49 ,  G01N21/55 ,  G01N2201/06146 ,  G01N2201/124

    Abstract: A processing apparatus includes: a light emission unit configured to emit light to a surface of a particle dispersed liquid applied to a base material, the particle dispersed liquid having particles dispersed in a solvent; a reflected light amount monitoring unit configured to detect an amount of the light reflected, and monitor a temporal variation of the detected value; and a condition adjustment unit configured to adjust a condition for a particle securing process, the particle securing process being performed to remove the solvent and secure the particles onto the base material, wherein, when the temporal variation falls within a predetermined range after the value has reached an extreme value, securing of the particles is determined to have been completed.

    Enhanced Surface Plasmon Resonance method
    34.
    发明授权
    Enhanced Surface Plasmon Resonance method 有权

    公开(公告)号：US09632022B2

    公开(公告)日：2017-04-25

    申请号：US14382334

    申请日：2013-03-05

    Applicant: BIOSURFIT S.A.

    Inventor： Joao Manuel De Oliveira Garcia Da Fonseca

    IPC: G01N21/41 ,  G01N21/552

    CPC classification number: G01N33/54373 ,  G01N21/41 ,  G01N21/553 ,  G01N33/54346 ,  G01N33/553 ,  G01N2201/0612 ,  G01N2201/06146 ,  G01N2201/0621 ,  G01N2201/0635 ,  G01N2201/12723

    Abstract: The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

    OPTICAL-CHARACTERISTICS MEASUREMENT DEVICE AND OPTICAL-CHARACTERISTICS MEASUREMENT METHOD
    35.
    发明申请
    OPTICAL-CHARACTERISTICS MEASUREMENT DEVICE AND OPTICAL-CHARACTERISTICS MEASUREMENT METHOD 审中-公开
    光学特性测量装置和光学特性测量方法

    公开(公告)号：US20160153903A1

    公开(公告)日：2016-06-02

    申请号：US15015682

    申请日：2016-02-04

    Applicant: FUJIFILM Corporation

    Inventor： Shuji ONO

    IPC: G01N21/47 ,  G01N21/41 ,  G01N21/59

    CPC classification number: G01N21/4738 ,  G01N21/41 ,  G01N21/474 ,  G01N21/55 ,  G01N21/59 ,  G01N2021/4783 ,  G01N2201/06146 ,  G01N2201/08

    Abstract: Disclosed are an optical-characteristics measurement device and an optical-characteristics measurement method capable of reducing a measurement load for optical characteristics of a material and performing a simple and high-accuracy measurement in a short period of time. An optical-characteristics measurement device (for example, a BRDF measurement device) includes a light irradiation unit (for example, a light source unit and a point light source) which irradiates a sample with light, and a light reception unit which receives light from the sample. The light reception unit has a light reception sensor (for example, a sensor array) including a plurality of photoreceptors, and light guide unit (for example, an imaging lens) which guides light from the sample to the light reception sensor. The light guide unit guides light from the sample to different photoreceptors among a plurality of photoreceptors according to the position and traveling direction of light on and from the sample.

    Abstract translation: 公开了一种光学特性测量装置和光学特性测量方法，其能够减少材料的光学特性的测量负荷并且在短时间内执行简单且高精度的测量。 光学特性测量装置（例如，BRDF测量装置）包括用光照射样品的光照射单元（例如，光源单元和点光源），以及从光接收单元接收来自 例子。 光接收单元具有包括多个感光体的光接收传感器（例如，传感器阵列）和将光从样品引导到光接收传感器的导光单元（例如成像透镜）。 光导单元根据来自样品的光的位置和行进方向，将光从样品引导到多个感光体中的不同感光体。

    ENHANCED SURFACE PLASMON RESONANCE METHOD
    36.
    发明申请
    ENHANCED SURFACE PLASMON RESONANCE METHOD 有权
    增强表面等离子体共振方法

    公开(公告)号：US20150109614A1

    公开(公告)日：2015-04-23

    申请号：US14382334

    申请日：2013-03-05

    Applicant: BIOSURFIT S.A.

    Inventor： Joao Manuel De Oliveira Garcia Da Fonseca

    IPC: G01N21/41 ,  G01N21/552

    CPC classification number: G01N33/54373 ,  G01N21/41 ,  G01N21/553 ,  G01N33/54346 ,  G01N33/553 ,  G01N2201/0612 ,  G01N2201/06146 ,  G01N2201/0621 ,  G01N2201/0635 ,  G01N2201/12723

    Abstract: The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

    Abstract translation: 本公开涉及处理SPR信号，特别是通过用两个波长的光照射导电表面而获得的信号。 处理SPR信号可以涉及处理表示从已经发生SPR的导电层接收的光的强度的第一和第二信号作为该层处的入射角，反射或衍射的函数。 第一和第二信号各自具有对应于在相应波长的相应波长处的两个倾斜，在该角度处，针对相应波长发生表面等离子体共振并且在两个下降之间产生峰值。 该处理包括导出指示峰值区域中的信号幅度的量的第一值和第二值。 可以比较第一和第二值以检测第一信号之后的层和第二信号被捕获之前的折射率的变化。

    Laser Multi-Sensor System for the Selective Trace Analysis of Organic Materials
    38.
    发明申请
    Laser Multi-Sensor System for the Selective Trace Analysis of Organic Materials 有权
    用于有机材料选择性跟踪分析的激光多传感器系统

    公开(公告)号：US20110031393A1

    公开(公告)日：2011-02-10

    申请号：US12744815

    申请日：2008-11-20

    Applicant: Johann Goebel ,  Peter Peuser

    Inventor： Johann Goebel ,  Peter Peuser

    IPC: H01J49/40

    CPC classification number: G01N21/64 ,  G01N21/031 ,  G01N21/35 ,  G01N21/3563 ,  G01N2201/06146 ,  G01N2201/0697

    Abstract: The invention relates to a multi-sensor laser system for the selective trace analysis of organic material, the multi-sensor system having at least one laser ion mobility spectrometer, an absorption spectrometer and a fluorescent measuring device. The system is characterized in that it is equipped with a device for the simultaneous generation of a common laser beam with different wavelengths and pulses for the simultaneous operation of the laser ion mobility spectrometer, the absorption spectrometer and the fluorescent measuring device. This avoids the disadvantages of the known solutions in prior art and provides an improved solution for the highly sensitive and highly selective trace analysis of organic material, in particular hazardous substances such as explosives and warfare agents in the air.

    Abstract translation: 本发明涉及一种用于有机材料的选择性痕量分析的多传感器激光系统，具有至少一个激光离子迁移谱仪的多传感器系统，吸收光谱仪和荧光测量装置。 该系统的特征在于其配备有用于同时生成具有不同波长和脉冲的公共激光束的装置，用于激光离子迁移谱仪，吸收光谱仪和荧光测量装置的同时操作。 这避免了现有技术中已知解决方案的缺点，并为有机材料，特别是有害物质如炸药和空气中的作战剂提供了高灵敏度和高选择性的痕量分析方法。

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