Abstract:
A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.
Abstract:
An optical inspection system for capturing images of backlit test objects on a detector at two or more aperture settings includes a telecentric imaging system having a first setting associated with a first size aperture stop and a second setting associated with a second larger size aperture stop. An illumination system includes a substage illuminator incorporating (a) a first set of one or more light sources surrounded by a first barrier that defines a first size aperture stop of the illumination system and (b) a second set of one or more light sources located beyond the first barrier and surrounded by a second barrier that defines a second larger size aperture stop of the illumination system. The first size aperture stop of the illumination system images to the first size aperture stop of the telecentric imaging system at the first setting and the second larger size aperture stop of the illumination system images to the second larger size aperture stop of the telecentric imaging system at the second setting.
Abstract:
Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract:
Systems and methods for increasing the accuracy of a turbidity sensor are disclosed. The systems include a turbidity sensor and a flow module with a specialized flow path, with the turbidity sensor engaging with the flow module such that a measurement zone of the turbidity sensor is disposed within a flow path of the flow module and a bypass path of the flow module does not pass through the measurement zone. The methods include flowing a fluid containing bubbles into a system that separates the fluid in the flow module into a first stream of fluid containing relatively more bubbles and a second stream of fluid containing relatively fewer bubbles, the first stream flowing through a bypass path that does not pass through the measurement zone, and the second stream flowing through the measurement zone of the turbidity sensor.
Abstract:
A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.
Abstract:
Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract:
An isothermal reaction and analysis system may include a receiver to receive sample holders, a thermal control subsystem to control a temperature of the receiver, an excitation subsystem, a detection subsystem and an analysis subsystem. Excitation sources and/or detectors are positioned to enhance data collection. Sample holders may include filters, selectively blocking and passing wavelengths or bands of electromagnetic radiation.
Abstract:
An automatic analyzer including a light source device. The light source device includes a plurality of light sources that emit respective lights of different peak wavelengths, in which a wavelength range of one of the light emitted contains the peak wavelength of the other light emitted from the other light source; and a mixing unit that mixes the respective lights emitted from the light sources. The light source device outputs a light having a desired mixed peak wavelength that is different from the peak wavelengths.
Abstract:
An isothermal reaction and analysis system may include a receiver to receive sample holders, a thermal control subsystem to control a temperature of the receiver, an excitation subsystem, a detection subsystem and an analysis subsystem. Excitation sources and/or detectors are positioned to enhance data collection. Sample holders may include filters, selectively blocking and passing wavelengths or bands of electromagnetic radiation.
Abstract:
A device (10) is provided for measuring at least one characteristic (12) related to presence of particles. The device (10) includes a light source unit (16) for emitting light into a region (18) containing particles (20), with the light source being configured to emit light from a plurality of locations in a manner so that the emitted light follows a desired intensity distribution (22), the desired intensity distribution (22) being desired for the measurement of the at least one characteristic (12). In preferred embodiments the intensity distribution is Lambertian.