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    MULTIPLE-PULSE PUMPING FOR ENHANCED FLUORESCENCE DETECTION AND MOLECULAR IMAGING IN CELLS AND TISSUE
    32.
    发明申请
    MULTIPLE-PULSE PUMPING FOR ENHANCED FLUORESCENCE DETECTION AND MOLECULAR IMAGING IN CELLS AND TISSUE 有权
    用于增强细胞和组织中增强荧光检测和分子成像的多脉冲泵浦

    公开(公告)号：US20150011406A1

    公开(公告)日：2015-01-08

    申请号：US14322998

    申请日：2014-07-03

    Applicant: University of North Texas Health Science Center ,  Texas Christian University

    Inventor： Ryan M. Rich ,  Ignacy Gryczynski ,  Julian Borejdo ,  Zygmunt Gryczynski

    IPC: G01N21/64 ,  G01N33/58

    CPC classification number: G01N33/582 ,  G01N21/6428 ,  G01N2201/0697

    Abstract: The present invention includes a method and system for enhancing the signal-to-noise ratio in emission detection comprising: selecting a probe capable of at least one of fluorescence, phosphorescence, or delayed fluorescence in or about a sample that comprises interfering background signal; and exposing the probe to one or more controllable bursts, each burst comprising two or more pulses, wherein the one or more controllable bursts of high repetition energy pulses enhance the signal from the probe above that of the background signal.

    Abstract translation: 本发明包括一种用于增强发射检测中的信噪比的方法和系统，包括：选择能够在样品中或周围包含干扰背景信号的荧光，磷光或延迟荧光中的至少一种的探针; 以及将所述探针暴露于一个或多个可控脉冲串，每个脉冲串包括两个或多个脉冲，其中所述高重复能量脉冲的所述一个或多个可控脉冲串将所述探头的信号增强到高于所述背景信号的信号。

    ELECTROMAGNETIC WAVE PULSE MEASURING DEVICE AND METHOD, AND APPLICATION DEVICE USING THE SAME
    33.
    发明申请
    ELECTROMAGNETIC WAVE PULSE MEASURING DEVICE AND METHOD, AND APPLICATION DEVICE USING THE SAME 有权
    电磁波脉冲测量装置及方法及其应用装置

    公开(公告)号：US20150008326A1

    公开(公告)日：2015-01-08

    申请号：US14375374

    申请日：2013-03-13

    Applicant: CANON KABUSHIKI KAISHA

    Inventor： Oichi Kubota

    IPC: G01N21/35 ,  G01N29/07

    CPC classification number: G01N21/3586 ,  G01H9/00 ,  G01N21/1717 ,  G01N21/4795 ,  G01N29/069 ,  G01N29/07 ,  G01N29/075 ,  G01N29/11 ,  G01N29/2418 ,  G01N29/343 ,  G01N2201/06113 ,  G01N2201/067 ,  G01N2201/0697 ,  G01N2291/011 ,  G01N2291/023 ,  G01N2291/10

    Abstract: An electromagnetic wave pulse measuring device, includes an elastic vibration wave generating section which irradiates a predetermined area of a sample with an elastic vibration wave, an electromagnetic wave pulse generating section which irradiates the predetermined area, which is irradiated with the elastic vibration wave, with an electromagnetic wave pulse, and an electromagnetic wave pulse detecting section which measures a waveform of the electromagnetic wave pulse modulated in the predetermined area by the elastic vibration wave. The timing at which the electromagnetic wave pulse detecting section measures the waveform of the electromagnetic wave pulse is a timing at which a phase angle of the elastic vibration wave has a predetermined value when the elastic vibration wave generating section generates the elastic vibration wave.

    Abstract translation: 一种电磁波脉冲测量装置，包括用弹性振动波照射样品的预定区域的弹性振动波产生部分，照射弹性振动波的预定区域的电磁波脉冲发生部分， 电磁波脉冲和电磁波脉冲检测部，其通过弹性振动波测量在规定区域中调制的电磁波脉冲的波形。 电磁波脉冲检测部测量电磁波脉冲的波形的定时是当弹性振动波产生部产生弹性振动波时弹性振动波的相位角具有预定值的定时。

    Multiphoton-excited measuring device
    34.
    发明授权
    Multiphoton-excited measuring device 有权
    多光子激发测量装置

    公开(公告)号：US08912508B2

    公开(公告)日：2014-12-16

    申请号：US12677952

    申请日：2009-03-24

    Applicant: Hiroyoshi Yajima ,  Kenji Taira

    Inventor： Hiroyoshi Yajima ,  Kenji Taira

    IPC: G01N21/64 ,  G02B21/08

    CPC classification number: G01N21/6458 ,  G01N2201/0697 ,  G02B21/082

    Abstract: A multiphoton-excited measuring device measuring a sample with the use of a multiphoton absorption phenomenon by optical pulses having high intensity, comprising a short pulse light source 2 emitting optical pulses; an irradiation optical system 17, 18, 19 irradiating a sample 20 with optical pulses emitted from the short pulse light source 2; a detector 24 detecting signal light generated, in association with multiphoton excitation, from the sample 20 by the irradiation with optical pulses; and an optical pulse compression means 4, 13 compressing a pulse width, with the use of intensity-dependent nonlinear effects of the optical fiber 4, so that a pulse width of optical pulses with which the sample 20 is to be irradiated is shorten to equal to or narrower than that of optical pulses emitted from the short pulse light source 2 and so that a spectral width of optical pulses with which the sample 20 is to be irradiated is wider than that of optical pulses emitted from the short pulse light source 2, which makes it possible to stably irradiate, with the use of easy-to-use short pulse light source, a sample with optical pulses having higher peak intensity and a shorter temporal width and measure the sample easily with high accuracy without requiring sophisticated laser techniques and skills.

    Abstract translation: 多光子激发测量装置，通过具有高强度的光脉冲使用多光子吸收现象来测量样品，包括发射光脉冲的短脉冲光源2; 照射光学系统17,18,19用从短脉冲光源2发射的光脉冲照射样品20; 检测器24，通过用光脉冲的照射检测与样品20相关的多光子激发产生的信号光; 以及使用光纤4的强度相关非线性效应来压缩脉冲宽度的光脉冲压缩装置4,13，使得要照射样品20的光脉冲的脉冲宽度缩短到相等 比从短脉冲光源2发射的光脉冲的宽度窄或窄，使得样品20被照射的光脉冲的光谱宽度比从短脉冲光源2发射的光脉冲的光谱宽度宽， 这使得可以使用易于使用的短脉冲光源来稳定地照射具有较高峰值强度和较短时间宽度的光脉冲的样品，并且以高精度容易地测量样品，而不需要复杂的激光技术， 技能

    Optical pulse sources
    36.
    发明授权
    Optical pulse sources 有权
    光脉冲源

    公开(公告)号：US08848750B2

    公开(公告)日：2014-09-30

    申请号：US12316006

    申请日：2008-12-09

    Applicant: John Clowes ,  Anatoly Grudinin ,  Ian Godfrey

    Inventor： John Clowes ,  Anatoly Grudinin ,  Ian Godfrey

    IPC: H01S3/108 ,  H01S3/23 ,  G02B21/16 ,  H01S3/10 ,  H01S3/11 ,  G02F1/35 ,  G01N21/64 ,  G02F1/365

    CPC classification number: H01S3/11 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6441 ,  G01N2201/0697 ,  G02B21/16 ,  G02F1/353 ,  G02F1/365 ,  G02F2001/3528 ,  H01S3/10 ,  H01S3/10046 ,  H01S3/1024 ,  H01S3/108 ,  H01S3/2308

    Abstract: An optical pulse source comprising a DPSS pump laser, a photonic crystal fiber (PCF), and acousto-optic modulator (AOM) gating device is disclosed. The pump pulses are coupled through lenses to the AOM gating device, which is synchronized to the pump laser and is operable to gate the pump pulses to a reduced repetition rate Rr=Rf/N, where Rf is the pump laser fundamental frequency. The pulses from the AOM are injected via optics into the PCF. Propagation through the PCF causes the pulses to broaden spectrally to produce optical supercontinuum pulses. An optical pulse source that further includes an acousto-optical tunable filter (AOTF) operable to convert the optical supercontinuum pulses into wavelength variable output pulses is also provided. A method of scaling the energy of the optical supercontinuum pulses is also disclosed.

    Abstract translation: 公开了一种包括DPSS泵浦激光器，光子晶体光纤（PCF）和声光调制器（AOM）门控装置的光脉冲源。 泵浦脉冲通过透镜耦合到AOM选通装置，其与泵浦激光器同步，并且可操作以将泵浦脉冲栅极降低到重复率Rr = Rf / N，其中Rf是泵浦激光器基频。 来自AOM的脉冲通过光学器件注入到PCF中。 通过PCF的传播使得脉冲在光谱上扩大以产生光学超连续谱脉冲。 还提供了一种光脉冲源，其还包括可操作以将光超连续谱脉冲转换为波长可变输出脉冲的声光可调滤波器（AOTF）。 还公开了缩放光超连续谱脉冲能量的方法。

    Defect Inspection Apparatus And Defect Inspection Method
    39.
    发明申请
    Defect Inspection Apparatus And Defect Inspection Method 有权
    缺陷检查装置及缺陷检查方法

    公开(公告)号：US20140042332A1

    公开(公告)日：2014-02-13

    申请号：US13789156

    申请日：2013-03-07

    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

    Inventor： Kei SHIMURA

    IPC: G01N21/95

    CPC classification number: G01N21/33 ,  G01N21/47 ,  G01N21/94 ,  G01N21/95 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95684 ,  G01N2201/06113 ,  G01N2201/0697

    Abstract: Method for realizing an inspection with short wavelength, high power light source and large numerical aperture, high performance optics to improve defect inspection sensitivity is disclosed. Short wavelength high power laser is realized by using a pulse oscillation type laser suitable for generation of high output power in a short-wavelength region, In addition, a spectral bandwidth of the laser is narrowed down so that amount of chromatic aberration of detection optics with single glass material (i.e. without compensation of chromatic aberration) is lowered to permissible level. Using highly workable glass material to construct the detection optics enables necessary surface accuracy or profile irregularity conditions to be met, even if the number of lenses is increased for large NA or the lens doesn't have a rotationally symmetrical aperture.

    Abstract translation: 公开了实现短波长，高功率光源和大数值孔径检测的方法，提高了高性能光学元件的缺陷检测灵敏度。 短波长大功率激光器通过使用适合于在短波长区域中产生高输出功率的脉冲振荡型激光器实现，此外，激光器的光谱带宽变窄，使得检测光学器件的色差量 单玻璃材料（即不补偿色差）降低到允许的水平。 使用高度可加工的玻璃材料来构造检测光学元件，即使对于大NA而言镜片的数量增加或透镜不具有旋转对称的孔径，也能够实现所需的表面精度或轮廓不规则条件。

    METHOD AND SYSTEM FOR GAS MEASUREMENTS IN A COMBUSTION CHAMBER
    40.
    发明申请
    METHOD AND SYSTEM FOR GAS MEASUREMENTS IN A COMBUSTION CHAMBER 有权
    燃烧室气体测量方法与系统

    公开(公告)号：US20140016130A1

    公开(公告)日：2014-01-16

    申请号：US14003477

    申请日：2012-03-07

    Applicant: Shahriar Badiei ,  Magnus Berg

    Inventor： Shahriar Badiei ,  Magnus Berg

    IPC: G01N21/51

    CPC classification number: G01N21/51 ,  F23N5/02 ,  F23N5/082 ,  G01K11/125 ,  G01K2011/322 ,  G01N21/53 ,  G01N21/65 ,  G01N2021/4709 ,  G01N2201/0697

    Abstract: The present invention relates to a method for determining at least one gas condition at a location in a combustion chamber of a power plant or a combined heat and power plant by means of a laser pulse. The method comprises emitting (S1) the laser pulse into the chamber, determining (S2) a first point of time at which the laser pulse is emitted into the chamber, detecting (S3) laser light backscattered by gas molecules at the location in the chamber, determining (S4) a second point of time at which the laser light backscattered by the gas molecules is detected, determining (S5) the location based on the first point of time, the second point of time, and a pulse length of the laser pulse, and determining (S5) the at least one gas condition at the location based on at least one characteristic of the backscattered laser light detected at the second point of time. A gas measurement system and a combustion system are also presented herein.

    Abstract translation: 本发明涉及一种用于通过激光脉冲在发电厂的燃烧室或组合的发电厂中确定至少一种气体状况的方法。 该方法包括：将激光脉冲发射（S1）到室中，确定（S2）激光脉冲发射到室中的第一时间点，检测（S3）在腔室中的位置处由气体分子反向散射的激光 确定（S4）检测由气体分子反向散射的激光的第二时间点，基于第一时间点，第二时间点和激光器的脉冲长度确定（S5）位置 并且基于在第二时间点检测到的反向散射激光的至少一个特性来确定（S5）该位置处的至少一个气体状况。 本文还介绍了气体测量系统和燃烧系统。

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