中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

772 records (took 0.017 seconds)

    Systems and Methods for Analyzing Unknown Sample Compositions Using a Prediction Model Based On Optical Emission Spectra
    32.
    发明申请
    Systems and Methods for Analyzing Unknown Sample Compositions Using a Prediction Model Based On Optical Emission Spectra 有权

    公开(公告)号：US20210172800A1

    公开(公告)日：2021-06-10

    申请号：US16709199

    申请日：2019-12-10

    Applicant: PerkinElmer Health Sciences Canada, Inc.

    Inventor： Abdul Al-Haimi ,  James McQuay ,  Hamid Badiei

    IPC: G01J3/443

    Abstract: Aspects of the disclosure relate to techniques for analyzing unknown sample compositions using a prediction model based on optical emission spectra. One method comprises: receiving first emission spectra corresponding to a training sample comprising a plurality of pure elements of known concentrations; determining, based on the first emission spectra, a plurality of spectral regions corresponding to the plurality of pure elements of known concentrations; determining, for each spectral region corresponding to each pure element of a known concentration, features associated with a signature peak of the spectral region; training a prediction model to predict unknown concentrations of a plurality of constituents of an unknown sample based on an emission spectra of the unknown sample; receiving second emission spectra corresponding to the unknown sample comprising a plurality of constituents of unknown concentrations; and generating, based on the application of the trained prediction model, a concentration for each of the constituents of the unknown sample.

    JIG, PROCESSING SYSTEM AND PROCESSING METHOD
    33.
    发明申请
    JIG, PROCESSING SYSTEM AND PROCESSING METHOD 有权

    公开(公告)号：US20210166960A1

    公开(公告)日：2021-06-03

    申请号：US17105753

    申请日：2020-11-27

    Applicant: Tokyo Electron Limited

    Inventor： Kippei SUGITA ,  Masaaki MIYAGAWA ,  Masashi YAMAGUCHI

    IPC: H01L21/67 ,  H01J37/32 ,  C23C16/52 ,  C23C16/455 ,  G01J3/443

    Abstract: A jig includes a base, light sources disposed on the base, the sources configured to emit light of different wavelengths, a controller disposed on the base, the controller being configured to cause the light sources to be turned on or off based on a given program, and a power source disposed on the base, the power source being configured to supply power to the light sources and the controller. The jig has a shape enabling a transfer device to transfer the jig, the transfer device being provided in a vacuum transfer module and configured to transfer a substrate.

    METHOD FOR DETERMINING A MATERIAL COMPOSITION
    34.
    发明申请
    METHOD FOR DETERMINING A MATERIAL COMPOSITION 有权

    公开(公告)号：US20210148842A1

    公开(公告)日：2021-05-20

    申请号：US17095336

    申请日：2020-11-11

    Applicant: BRUKER NANO GMBH

    Inventor： Ralf TERBORG

    IPC: G01N23/2252 ,  G01J3/443

    Abstract: A method comprises the steps of: (a) Obtaining a measured X-ray spectrum for the coated sample, for determining characteristics for the sample and for a coating material; (b) Determining a simulated X-ray spectrum for the sample based on an initial sample composition; (c) Determining an adapted sample composition that improves a match between the characteristics of the sample and an adapted simulated X ray spectrum; (d) Determining an adapted coating thickness for the coating material based on the adapted sample composition and characteristics of the coating; and (e) Repeating the steps (b) to (d) using the adapted sample composition and the adapted coating thickness of the coating material instead of the initial values, wherein the coating thickness is used for determining an absorption of X-rays.

    LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
    37.
    发明申请
    LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD 审中-公开

    公开(公告)号：US20200348178A1

    公开(公告)日：2020-11-05

    申请号：US16963064

    申请日：2018-10-10

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Kengo SUZUKI ,  Shigeru EURA ,  Kazuya IGUCHI

    IPC: G01J3/443 ,  G01N21/63

    Abstract: A spectrometry device includes a light source, an integrator configured to have an internal space in which a long afterglow emission material is disposed and output detection light from the internal space, a spectroscopic detector, an analysis unit configured to analyze a photoluminescence quantum yield of the long afterglow emission material, and a control unit configured to control switching between presence and absence of input of excitation light to the internal space and an exposure time in the spectroscopic detector. The control unit controls the light source so that the input of the excitation light to the internal space is maintained in a first period and the input of the excitation light to the internal space is stopped in a second period, and controls the spectroscopic detector so that an exposure time in the second period becomes longer than an exposure time in the first period.

    Spectrometry device and spectrometry method
    38.
    发明授权
    Spectrometry device and spectrometry method 有权

    公开(公告)号：US10816402B2

    公开(公告)日：2020-10-27

    申请号：US16612469

    申请日：2018-04-02

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Kenichiro Ikemura ,  Kazuya Iguchi ,  Shigeru Eura ,  Akihiro Nakamura

    IPC: G01J3/30 ,  G01J3/443 ,  G01J3/02

    Abstract: A spectrometry device includes: an integrating sphere which includes an inner wall surface and an attachment hole; an adapter which includes a guide hole guiding the measurement target light and is disposed in the integrating sphere; a plate which includes a first surface covering the guide hole from the outside of the integrating sphere and allowing a sample to be mounted thereon and a second surface and through which the measurement target light is transmitted; a holder which includes a concave portion mounting the plate thereon and is attached to the attachment hole; and a spectral detector configured to detect the measurement target light. The concave portion includes a bottom surface facing the second surface and a side surface surrounding the periphery of the plate. The bottom surface and the side surface are coated with a reflective material reflecting the measurement target light.

    Method for quantifying a material or material mixture
    39.
    发明申请
    Method for quantifying a material or material mixture 审中-公开

    公开(公告)号：US20200271517A1

    公开(公告)日：2020-08-27

    申请号：US16488165

    申请日：2018-02-23

    Applicant: Tailorlux GmbH

    Inventor： Alex Deitermann

    IPC: G01J3/28 ,  G01N21/64 ,  G01J3/44 ,  G01J3/443

    Abstract: A method is claimed for identifying and quantifying a material or mixture of materials, where the material or the mixture of materials comprises one or more components X identifiable by means of spectroscopic methods and/or with a hyperspectral camera. The method comprises the steps ofA. generating one or more signals by excitation with a radiation source in the range of 280-1100 nm and recording thereof by a suitable spectrometer system, a hyperspectral camera or a photodiode, B. evaluating the signal(s) and/or hyperspectral image(s) obtained and assigning the signal(s) and/or hyperspectral image(s) to a component X, and subsequently assigning the identified component X to a material or a mixture of materials, C. quantitatively determining the material or mixture of materials.

Patent Agency Ranking