POLISHING PAD CONFIGURATION AND CHEMICAL MECHANICAL POLISHING SYSTEM
    43.
    发明申请
    POLISHING PAD CONFIGURATION AND CHEMICAL MECHANICAL POLISHING SYSTEM 审中-公开
    抛光垫配置和化学机械抛光系统

    公开(公告)号:US20160016282A1

    公开(公告)日:2016-01-21

    申请号:US14464633

    申请日:2014-08-20

    Inventor: Hung Chih Chen

    Abstract: A polishing pad includes and upper portion and one or more lower portions. The upper portion has an upper surface for attachment to a pad carrier and a first lateral dimension. The one or more lower portions project downward from the upper portion. A bottom surface of the one or more lower portions provide a contact surface to contact a substrate during chemical mechanical polishing. Each lower portion has a second lateral dimension that is less than the first lateral dimension. A total surface area of the contact surface from the one or more lower portions is no more than 10% of a surface area of the upper surface.

    Abstract translation: 抛光垫包括上部和一个或多个下部。 上部具有用于附接到衬垫托架的上表面和第一横向尺寸。 一个或多个下部从上部向下突出。 所述一个或多个下部的底表面在化学机械抛光期间提供与衬底接触的接触表面。 每个下部具有小于第一横向尺寸的第二横向尺寸。 来自一个或多个下部的接触表面的总表面积不超过上表面的表面积的10%。

    Polishing head zone boundary smoothing
    44.
    发明授权
    Polishing head zone boundary smoothing 有权
    抛光头区边界平滑

    公开(公告)号:US09050699B2

    公开(公告)日:2015-06-09

    申请号:US13893030

    申请日:2013-05-13

    CPC classification number: B24B37/30 B24B41/06

    Abstract: A method and apparatus for chemical mechanical polishing of substrates, and more particularly a method and apparatus related to a carrier had for use in chemical mechanical polishing is provided. In one embodiment the carrier head assembly comprises a base assembly for providing support to the substrate, a flexible membrane mounted on the base assembly having a generally circular central portion with a lower surface that provides a substrate mounting surface, and a plurality of independently pressurizable chambers formed between the base assembly and the flexible membrane, comprising an annular outer chamber and a non-circular inner chamber, is provided.

    Abstract translation: 提供了一种用于化学机械抛光的方法和装置,更具体地涉及一种用于化学机械抛光的载体的方法和装置。 在一个实施例中,承载头组件包括用于向衬底提供支撑的基座组件,安装在基座组件上的柔性膜,该柔性膜具有大致圆形中心部分,下表面提供衬底安装表面,以及多个可独立加压的腔室 形成在基部组件和柔性膜之间,包括环形外室和非圆形内腔。

    Monitoring Retaining Ring Thickness And Pressure Control
    47.
    发明申请
    Monitoring Retaining Ring Thickness And Pressure Control 有权
    监控挡圈厚度和压力控制

    公开(公告)号:US20140027407A1

    公开(公告)日:2014-01-30

    申请号:US13791761

    申请日:2013-03-08

    CPC classification number: B24B37/005 B24B37/30 B24B49/105

    Abstract: A chemical mechanical polishing apparatus includes a carrier head including a retaining ring having a plastic portion with a bottom surface to contact a polishing pad, an in-situ monitoring system including a sensor that generates a signal that depends on a thickness of the plastic portion, and a controller configured to receive the signal from the in-situ monitoring system and to adjust at least one polishing parameter in response to the signal to compensate for non-uniformity caused by changes in the thickness of the plastic portion of the retaining ring.

    Abstract translation: 一种化学机械抛光装置,包括:承载头,包括具有接触抛光垫的底表面的塑料部分的保持环,包括产生取决于塑料部分的厚度的信号的传感器的原位监测系统, 以及控制器,被配置为从原位监测系统接收信号并且响应于信号调整至少一个抛光参数以补偿由保持环的塑料部分的厚度变化引起的不均匀性。

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