Pressure-invariant trace gas detection
    42.
    发明授权
    Pressure-invariant trace gas detection 有权
    压力不变痕量气体检测

    公开(公告)号:US07508521B2

    公开(公告)日:2009-03-24

    申请号:US11724665

    申请日:2007-03-14

    Abstract: A system includes a light source, a detector, at least one pressure sensor, and a control unit. The light source emits light at a wavelength substantially corresponding to an absorption line of a target gas. The detector is positioned to detect the intensity of light emitted from the light source that has passed through the target gas. The pressure sensor detects the pressure of the target gas. The control circuit is coupled to the detector and the light source to adjust the modulation amplitude of the light source based on the pressure detected by the at least one pressure sensor. Related systems, apparatus, methods, and/or articles are also described.

    Abstract translation: 系统包括光源,检测器,至少一个压力传感器和控制单元。 光源以基本对应于目标气体的吸收线的波长发射光。 检测器被定位成检测从已经通过目标气体的光源发射的光的强度。 压力传感器检测目标气体的压力。 控制电路耦合到检测器和光源,以基于由至少一个压力传感器检测到的压力来调节光源的调制幅度。 还描述了相关系统,装置,方法和/或制品。

    Laser wavelength locker
    43.
    发明授权
    Laser wavelength locker 失效
    激光波长更衣柜

    公开(公告)号:US07460567B2

    公开(公告)日:2008-12-02

    申请号:US11402484

    申请日:2006-04-11

    Applicant: Randy Dean May

    Inventor: Randy Dean May

    Abstract: The method and system operate to maintain a widely tunable laser (WTL) at a selected transmission wavelength. To lock the WTL to an ITU grid line, a portion of the output beam from the WTL is routed through the etalon to split the beam into a transmission line for detection by an etalon fringe detector. Another portion of the beam is routed directly to a laser wavelength detector to determine the power of the beam. A wavelength-locking controller compares signals from the two detectors and adjusts the temperature of the etalon to align the wavelength of one of the transmission lines of the etalon with the wavelength of the output beam, then controls the WTL in a feedback loop to lock the laser to the etalon line. The wavelength-locking controller thereafter monitors the temperature of the etalon and keeps the temperature constant to prevent any wavelength drift attributable to the etalon.

    Abstract translation: 该方法和系统用于维持在选定的透射波长下的广泛可调激光(WTL)。 为了将WTL锁定到国际电联电网线路,来自WTL的输出波束的一部分被路由通过标准具将光束分成传输线,以便由标准具条纹检测器进行检测。 光束的另一部分被直接路由到激光波长检测器以确定光束的功率。 波长锁定控制器比较来自两个检测器的信号,并调节标准具的温度以使标准具的传输线之一的波长与输出光束的波长对准,然后在反馈回路中控制WTL以锁定 激光到标准具线。 此后,波长锁定控制器监测标准具的温度并保持温度恒定,以防止归因于标准具的任何波长漂移。

    System and method for detecting water vapor within natural gas
    44.
    发明授权
    System and method for detecting water vapor within natural gas 有权
    用于检测天然气中水蒸汽的系统和方法

    公开(公告)号:US07339168B2

    公开(公告)日:2008-03-04

    申请号:US11588049

    申请日:2006-10-25

    Applicant: Randy Dean May

    Inventor: Randy Dean May

    Abstract: A system and method are disclosed for the detection of water vapor in a natural gas background. The system includes a light source operating in a wavelength range such as, 1.877-1.901 μm, 2.711-2.786 μm, or 920-960 nm, passes through the natural gas to be detected by a detector. In one embodiment, the light source is a tunable diode laser and the moisture level is determined by harmonic spectroscopy. In other embodiments, a VCSEL laser is utilized.

    Abstract translation: 公开了一种在天然气背景下检测水蒸气的系统和方法。 该系统包括在诸如1.877-1.901mum,2.711-2.786mum或920-960nm的波长范围内工作的光源,通过检测器检测的天然气。 在一个实施例中,光源是可调二极管激光器,并且通过谐波光谱确定湿度水平。 在其他实施例中,使用VCSEL激光器。

    Measuring trace components of complex gases using gas chromatography/absorption spectrometry
    45.
    发明申请
    Measuring trace components of complex gases using gas chromatography/absorption spectrometry 有权
    使用气相色谱/吸收光谱法测定复杂气体的痕量成分

    公开(公告)号:US20070273882A1

    公开(公告)日:2007-11-29

    申请号:US11726001

    申请日:2007-03-19

    Abstract: Low concentrations of complex gas mixture components may be detected and quantified using a gas-chromatograph to separate a gas mixture prior to analysis of one or more eluting components using an absorption spectrometer. Substantial reductions in analytical system complexity and improvements in reliability are achieved compared with other commonly used methods for analyzing such complex mixtures.

    Abstract translation: 可以使用气相色谱仪来检测和定量低浓度的复杂气体混合物组分,以在使用吸收光谱仪分析一种或多种洗脱组分之前分离气体混合物。 与分析这种复杂混合物的其他常用方法相比,实现了分析系统复杂性的大幅度降低和可靠性的提高。

    Technique for detecting ethylene oxide in air
    46.
    发明申请
    Technique for detecting ethylene oxide in air 有权
    检测空气中环氧乙烷的技术

    公开(公告)号:US20040245471A1

    公开(公告)日:2004-12-09

    申请号:US10766327

    申请日:2004-01-29

    Inventor: Randy Dean May

    CPC classification number: G01N21/39 G01N21/3504

    Abstract: A system and method are disclosed for the detection of ethylene oxide in a sample of gas, such as air. The system includes a light source operating at a wavelength where molecules typically found within air absorb light at a substantially lower level than ethylene oxide molecules. Exemplary wavelengths are in the range of approximately 1.6-2.2 nullm, and in particular at 1.6 nullm, 1.645 nullm, 1.692 nullm, 2.195 nullm, 2.2 nullm, 2.216 nullm, passes through the sample of gas to be detected by a detector. In one embodiment, the light source is a tunable diode laser or a VCSEL and the ethylene oxide level is determined using harmonic spectroscopy.

    Abstract translation: 公开了用于检测诸如空气的气体样品中的环氧乙烷的系统和方法。 该系统包括以通常在空气中发现的分子以比环氧乙烷分子基本上更低的水平吸收光的波长操作的光源。 示例性的波长在1.6-2.2μm的范围内,特别是1.6μm,1.645μm,1.692μm,2.195μm,2.2μm,2.216μm,通过检测器检测的气体样品。 在一个实施例中,光源是可调谐二极管激光器或VCSEL,并且使用谐波光谱确定环氧乙烷水平。

    Light source module
    47.
    发明授权

    公开(公告)号:US11169357B2

    公开(公告)日:2021-11-09

    申请号:US16281841

    申请日:2019-02-21

    Abstract: A light source module may include a base with a support feature protruding from a surface of the base and securing a light source to direct radiation away from the surface. A lens cells may be attached proximate to the surface, optionally by being secured within a sleeve that is attached at one end to the surface. A multi-conductor part may include electrical conductors and a base temperature sensor that contacts the base. The base temperature sensor may be electrically connected to at least one of the plurality of conductive elements and further connected to an optical ignition safety protection system configured to interrupt current to the light source if the base temperature sensor indicates that a temperature of the light source is outside of a safe range.

    Semiconductor laser mounting with intact diffusion barrier layer

    公开(公告)号:US10224693B2

    公开(公告)日:2019-03-05

    申请号:US15652177

    申请日:2017-07-17

    Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.

    Spectrometer with variable beam power and shape

    公开(公告)号:US10072980B2

    公开(公告)日:2018-09-11

    申请号:US15376541

    申请日:2016-12-12

    CPC classification number: G01J3/0291 G01J3/027 G01J3/42

    Abstract: At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.

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