Abstract:
According to various embodiments, a system, an apparatus and a method are presented that relate to determining and correcting signal imbalances between output samples of an analog-to-digital (A-D) converter array (that may be implemented as part of a wideband ADC). A statistic module and correction module are associated with the A-D converter array. The statistic module is configured to receive digital samples from the plurality of A-D converters, and generate a statistical sample value for each A-D converter using a set of digital samples received therefrom. The correction module is configured to, for at least one of the plurality of A-D converters, determine an offset value by comparing the statistical sample value for the at least one of the plurality of A-D converters with a reference value, and apply the offset value to a digital sample from that at least one A-D converter to generate a corrected digital sample.
Abstract:
In combining an analog terminal of an A/D converter with a digital terminal, the effect of the noise from the digital terminal is reduced. A semiconductor integrated circuit includes a high-speed external terminal, a low-speed external terminal, a high-speed analog switch, a low-speed analog switch, and an A/D converter. The high-speed external terminal is coupled to an input of the A/D converter via the high-speed analog switch, and the low-speed external terminal is coupled to the input of the A/D converter via the low-speed analog switch. A plurality of inputs of a plurality of low-speed digital input buffer circuits and a plurality of outputs of a plurality of low-speed digital output buffer circuits are coupled to a plurality of low-speed external terminals. The output of any digital output buffer circuit is not coupled to a plurality of high-speed external terminals, but a plurality of inputs of a plurality of high-speed digital input buffer circuits is coupled to a plurality of high-speed external terminals. Between a plurality of low-speed external terminals and the input of the A/D converter, a low-speed separating resistor with a high resistance value is coupled, respectively.
Abstract:
In an A/D converter, a first analog signal which is input to an input terminal in a state in which the input terminal and a reference voltage line are connected via a first capacitor is converted into digital data when a reference signal is supplied to the reference signal line in a state in which the reference signal line and a first input terminal of a comparator are connected via the first capacitor. A second analog signal which is input to the input terminal in a state in which the input terminal and the reference voltage line are connected via a second capacitor is converted into digital data when the reference signal is supplied to the reference signal line in a state in which the reference signal line and the first input terminal of the comparator are connected via the second capacitor.
Abstract:
An image sensor includes a pixel array, and a correlated double sample circuit coupled to one of the pixels in the pixel array. The correlated double sample circuit includes first and second inputs, and first and second sample capacitors respectively coupled to the first and second inputs. The first input is for receiving an analog signal from a pixel, and the second input is for receiving a time varying reference signal. The analog signal varies during a pixel readout period, and has a first level during a first reset period and a second-level during a second read period. A comparator circuit compares the time varying reference signal and the analog signal. The analog signal and the time varying reference signal are constantly read onto one of the first and second sample capacitors during both the first reset period and the second read period.
Abstract:
A high-precision A/D conversion is realized while the number of external terminals used for an A/D converter is reduced. At the time of sampling, first to fifth switches are turned on and a sixth switch is turned off. Since a first resistor is set to a resistance value optimum for sampling, an impedance in the direction from a node A to the left side and an impedance in the direction from a node B to the left side almost match, and a large noise-cancelling effect is obtained. At the time of successive approximation, the first, second, third, and fifth switches are turned off and the fourth and sixth switches are turned on. Since a second resistor is set to a resistance value optimum for the successive approximation, the impedance in the direction from the node A to the left side and the impedance in the direction from the node B to the left side almost match, and a large noise-cancelling effect is obtained also at the time of successive approximation.
Abstract:
A communication device and the method thereof are disclosed in embodiments of the present invention. The communication device includes a level determining module, an digital to analog converter and an analog to digital converter. The level determining module determines a plurality of voltage levels and voltage intensity thereof according to an estimating signal to generate a first digital signal. The digital to analog converter converts the first digital signal into a pulse shaped analog signal according to the plurality of voltage levels and voltage intensity thereof. The analog to digital converter converts a first difference signal into a second digital signal wherein the first difference signal equals the result of subtracting the pulse shaped analog signal from a receiving signal.
Abstract:
A system is described that may determine an intensity measure. In certain example embodiments, a system may include circuitry for receiving and circuitry for assessing. The circuitry for receiving may receive an input signal at an input of a first gain element of a cascade of N gain elements. The circuitry for assessing may assess an intensity in response to one or more times associated with one or more output signals of the cascade of N gain elements satisfying one or more threshold values.
Abstract:
An electronic device is provided for analog to digital conversion using successive approximation. The device comprises a first ADC stage. The first ADC stage includes a first plurality of capacitors adapted to sample an input voltage, and adapted to be coupled to either a first reference signal level or a second reference signal level. At least one capacitor of the first plurality of capacitors is adapted to be left floating. A control stage is adapted to switch the at least one floating capacitor to the first reference signal level or the second reference signal level in response to an analog to digital conversion decision made by a second ADC stage.
Abstract:
A technique for increasing the charge storage capacity of a charge storage device without changing its inherent charge transfer function. The technique may be used to implement a charge domain signal processing circuits such as Analog to Digital Converters (ADCs) used in digital radio frequency signal receivers.
Abstract:
An analog to digital converter comprising a reference signal generator, a comparator, and a counter wherein the reference signal generator is operable to generate a reference for converting an analog signal into a digital signal. The reference signal generator is also operable to generate a plurality of the reference signals based on the change in a voltage. The comparator is operable to compare the analog signal with the reference signal generated by the reference signal generator. The counter is operable to count, in parallel with a comparison performed by the comparator, a predetermined count clock and to hold a count value at the time of completion of the comparison.